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In: Microelectronics Reliability, Jg. 81 (2018-02-01), S. 31-40Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 81 (2018-02-01), S. 101-111Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 55 (2015-05-01), S. 863-872Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 54 (2014-02-01), S. 397-403Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 54 (2014), S. 90-99Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 53 (2013-04-01), S. 592-599Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 52 (2012-06-01), S. 1209-1214Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 126 (2021-11-01), S. 114275-114275Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 51 (2011-12-01), S. 2357-2365Online unknownZugriff:
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Challenges and opportunity in performance, variability and reliability in sub-45nm CMOS technologiesIn: Microelectronics Reliability, Jg. 51 (2011-09-01), S. 1508-1514Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 51 (2011-09-01), S. 1498-1502Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 52 (2012-11-01), S. 2627-2631Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 52 (2012-09-01), S. 1822-1826Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 50 (2010-09-01), S. 1223-1229Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 51 (2011-08-01), S. 1315-1324Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 50 (2010-09-01), S. 1367-1372Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 47 (2007-09-01), S. 1313-1321Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 47 (2007), S. 27-35Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 45 (2005-02-01), S. 255-268Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 50 (2010-06-01), S. 821-830Online unknownZugriff: