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Weniger Treffer
Gefunden in
Schlagwort
- business 103 Treffer
- business.industry 103 Treffer
- triple modular redundancy 76 Treffer
- computer science 71 Treffer
- engineering 62 Treffer
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45 weitere Werte:
- hardware_arithmeticandlogicstructures 54 Treffer
- electronic engineering 53 Treffer
- field-programmable gate array 49 Treffer
- redundancy (engineering) 49 Treffer
- nuclear and high energy physics 47 Treffer
- nuclear energy and engineering 47 Treffer
- embedded system 45 Treffer
- fault tolerance 43 Treffer
- hardware_logicdesign 42 Treffer
- 02 engineering and technology 40 Treffer
- 01 natural sciences 37 Treffer
- 0103 physical sciences 36 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 34 Treffer
- electronic circuit 31 Treffer
- fault injection 29 Treffer
- static random-access memory 28 Treffer
- electronic, optical and magnetic materials 26 Treffer
- 010308 nuclear & particles physics 25 Treffer
- law 25 Treffer
- law.invention 25 Treffer
- hardware and architecture 24 Treffer
- hardware_integratedcircuits 24 Treffer
- single event upset 23 Treffer
- computer hardware 22 Treffer
- condensed matter physics 22 Treffer
- safety, risk, reliability and quality 22 Treffer
- 020208 electrical & electronic engineering 21 Treffer
- atomic and molecular physics, and optics 21 Treffer
- reliability engineering 19 Treffer
- 020202 computer hardware & architecture 18 Treffer
- surfaces, coatings and films 17 Treffer
- cmos 16 Treffer
- error detection and correction 16 Treffer
- soft error 16 Treffer
- 010302 applied physics 15 Treffer
- software 14 Treffer
- integrated circuit 13 Treffer
- logic gate 13 Treffer
- combinational logic 12 Treffer
- control and systems engineering 12 Treffer
- modular design 12 Treffer
- computer engineering 11 Treffer
- computer networks and communications 11 Treffer
- electrical engineering 11 Treffer
- signal processing 11 Treffer
Verlag
- institute of electrical and electronics engineers (ieee) 60 Treffer
- elsevier bv 18 Treffer
- institution of engineering and technology (iet) 7 Treffer
- mdpi ag 7 Treffer
- springer science and business media llc 7 Treffer
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18 weitere Werte:
- ieee 5 Treffer
- multidisciplinary digital publishing institute 5 Treffer
- iop publishing 4 Treffer
- hal ccsd 2 Treffer
- informa uk limited 2 Treffer
- institute of electronics, information and communications engineers (ieice) 2 Treffer
- world scientific pub co pte lt 2 Treffer
- american institute of aeronautics and astronautics (aiaa) 1 Treffer
- arxiv 1 Treffer
- association for computing machinery (acm) 1 Treffer
- ejournal publishing 1 Treffer
- hindawi limited 1 Treffer
- ieee / institute of electrical and electronics engineers incorporated 1 Treffer
- inderscience publishers 1 Treffer
- institute of advanced engineering and science 1 Treffer
- mdpi 1 Treffer
- springer 1 Treffer
- zenodo 1 Treffer
Publikation
- ieee transactions on nuclear science 43 Treffer
- microelectronics reliability 15 Treffer
- electronics 9 Treffer
- journal of electronic testing 6 Treffer
- iet computers & digital techniques 5 Treffer
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32 weitere Werte:
- ieee transactions on aerospace and electronic systems 4 Treffer
- ieee transactions on reliability 3 Treffer
- journal of semiconductors 3 Treffer
- sensors 3 Treffer
- electronics letters 2 Treffer
- ieee transactions on instrumentation and measurement 2 Treffer
- ieee transactions on very large scale integration (vlsi) systems 2 Treffer
- integration 2 Treffer
- journal of circuits, systems and computers 2 Treffer
- proceedings of the ieee 2 Treffer
- 2006 21st ieee international symposium on defect and fault tolerance in vlsi systems 1 Treffer
- 2011 ieee 17th international on-line testing symposium 1 Treffer
- 2015 15th european conference on radiation and its effects on components and systems (radecs) 1 Treffer
- acm journal on emerging technologies in computing systems 1 Treffer
- ieee design & test 1 Treffer
- ieee sensors journal 1 Treffer
- ieee transactions on circuits and systems i: regular papers 1 Treffer
- ieee transactions on computer-aided design of integrated circuits and systems 1 Treffer
- ieee transactions on electron devices 1 Treffer
- ieee transactions on power electronics 1 Treffer
- ieice transactions on electronics 1 Treffer
- ieice transactions on fundamentals of electronics, communications and computer sciences 1 Treffer
- international journal of electrical and computer engineering (ijece) 1 Treffer
- international journal of electrical and electronic engineering & telecommunications 1 Treffer
- international journal of electronics 1 Treffer
- international journal of signal and imaging systems engineering 1 Treffer
- journal of electronics (china) 1 Treffer
- journal of guidance, control, and dynamics 1 Treffer
- journal of information display 1 Treffer
- semiconductor science and technology 1 Treffer
- solid-state electronics 1 Treffer
- vlsi design 1 Treffer
Sprache
137 Treffer
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In: Electronics, 2021-06-14Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-05-01), S. 1054-1060Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-05-01), S. 1023-1031Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020), S. 312-320Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-07-01), S. 1433-1440Online unknownZugriff:
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In: IEEE Transactions on Aerospace and Electronic Systems, Jg. 56 (2020-08-01), S. 2666-2676Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 66 (2019), S. 207-215Online unknownZugriff:
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In: Microelectronics Reliability, 2018-09-01, S. 898-902Online unknownZugriff:
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In: Electronics, 2020-11-17Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 65 (2018-05-01), S. 1133-1139Online unknownZugriff:
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In: Electronics Letters, Jg. 55 (2019-02-01), S. 124-126Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 120 (2021-05-01), S. 114113-114113Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017-10-01), S. 2626-2632Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 63 (2016-08-01), S. 314-318Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 62 (2015-12-01), S. 3040-3048Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 55 (2015-08-01), S. 2072-2076Online unknownZugriff:
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In: Sensors, Jg. 20 (2020-02-14), S. 1041-1041Online unknownSiehe Detailanzeige für VolltextZugriff:
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In: IEEE Sensors Journal, 2020, S. 1-1Online unknownZugriff: