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Weniger Treffer
Gefunden in
Schlagwort
- business 158 Treffer
- business.industry 158 Treffer
- engineering 144 Treffer
- electronic engineering 137 Treffer
- cmos 115 Treffer
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45 weitere Werte:
- hardware_integratedcircuits 100 Treffer
- hardware_logicdesign 72 Treffer
- law 61 Treffer
- law.invention 61 Treffer
- electrical and electronic engineering 50 Treffer
- electronic circuit 49 Treffer
- electrical engineering 47 Treffer
- iddq testing 42 Treffer
- fault (power engineering) 36 Treffer
- computer science 35 Treffer
- fault coverage 35 Treffer
- bridging (networking) 32 Treffer
- transistor 32 Treffer
- automatic test pattern generation 31 Treffer
- fault detection and isolation 31 Treffer
- leakage (electronics) 31 Treffer
- voltage 29 Treffer
- integrated circuit 28 Treffer
- reliability engineering 27 Treffer
- logic gate 26 Treffer
- logic testing 26 Treffer
- algorithm 25 Treffer
- stuck-at fault 25 Treffer
- software 24 Treffer
- very-large-scale integration 23 Treffer
- testability 22 Treffer
- hardware and architecture 19 Treffer
- built-in self-test 15 Treffer
- integrated injection logic 15 Treffer
- combinational logic 14 Treffer
- computer engineering 14 Treffer
- current sensor 14 Treffer
- design for testing 14 Treffer
- mixed-signal integrated circuit 14 Treffer
- embedded system 13 Treffer
- sequential logic 13 Treffer
- biasing 12 Treffer
- cmos logic circuits 12 Treffer
- fault model 12 Treffer
- materials science 12 Treffer
- semiconductor device modeling 12 Treffer
- test set 12 Treffer
- chip 11 Treffer
- application-specific integrated circuit 10 Treffer
- bicmos 10 Treffer
Verlag
- ieee 39 Treffer
- ieee comput. soc. press 39 Treffer
- ieee comput. soc 30 Treffer
- institute of electrical and electronics engineers (ieee) 28 Treffer
- int. test conference 16 Treffer
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18 weitere Werte:
- springer science and business media llc 13 Treffer
- hal ccsd 6 Treffer
- institution of engineering and technology (iet) 4 Treffer
- elsevier bv 3 Treffer
- springer us 3 Treffer
- informa uk limited 2 Treffer
- int. test. conference 2 Treffer
- acm 1 Treffer
- acm press 1 Treffer
- ieee computer society press 1 Treffer
- institution of electrical engineers:michael faraday house, 6 hills way, stevenage hertfordshire sg1 1ay united kingdom:011 44 1438 313311, email: postmaster@iee.org, internet: http://www.iee.org, fax: 011 44 1438 313465 1 Treffer
- spie 1 Treffer
- springer new york 1 Treffer
- springer singapore 1 Treffer
- ultra clean soc 1 Treffer
- university of windsor 1 Treffer
- wiley 1 Treffer
- 日本素材物性学会 1 Treffer
Publikation
- journal of electronic testing 12 Treffer
- ieee design & test of computers 8 Treffer
- ieee transactions on computer-aided design of integrated circuits and systems 6 Treffer
- proceedings 13th ieee vlsi test symposium 5 Treffer
- proceedings of 1995 ieee international test conference (itc) 5 Treffer
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45 weitere Werte:
- digest of papers ieee international workshop on iddq testing 3 Treffer
- electronics letters 3 Treffer
- ieee transactions on instrumentation and measurement 3 Treffer
- ieee transactions on very large scale integration (vlsi) systems 3 Treffer
- proceedings international test conference 1997 3 Treffer
- proceedings. 15th ieee vlsi test symposium (cat. no.97tb100125) 3 Treffer
- 16th international conference on vlsi design, 2003. proceedings. 2 Treffer
- 48th midwest symposium on circuits and systems, 2005. 2 Treffer
- digest of papers eleventh annual 1993 ieee vlsi test symposium 2 Treffer
- ieee journal of solid-state circuits 2 Treffer
- integration 2 Treffer
- international journal of electronics 2 Treffer
- international test conference 1999. proceedings (ieee cat. no.99ch37034) 2 Treffer
- proceedings international test conference 1996. test and design validity 2 Treffer
- proceedings international test conference 1998 (ieee cat. no.98ch36270) 2 Treffer
- proceedings international test conference 2000 (ieee cat. no.00ch37159) 2 Treffer
- proceedings of 7th international conference on vlsi design 2 Treffer
- proceedings of european design and test conference edac-etc-euroasic 2 Treffer
- proceedings of ieee custom integrated circuits conference - cicc '93 2 Treffer
- proceedings of ieee international test conference - (itc) 2 Treffer
- proceedings of the fourth asian test symposium 2 Treffer
- proceedings of the ieee 1991 custom integrated circuits conference 2 Treffer
- proceedings twelfth international conference on vlsi design. (cat. no.pr00013) 2 Treffer
- proceedings. 16th ieee vlsi test symposium (cat. no.98tb100231) 2 Treffer
- proceedings. international test conference 1990 2 Treffer
- proceedings., international test conference 2 Treffer
- [1989] proceedings of the 1st european test conference 1 Treffer
- [1992] proceedings the european conference on design automation 1 Treffer
- [1992] proceedings. fifth annual ieee international asic conference and exhibit 1 Treffer
- 17th ieee international symposium on defect and fault tolerance in vlsi systems, 2002. dft 2002. proceedings. 1 Treffer
- 1993 ieee international symposium on circuits and systems 1 Treffer
- 1997 proceedings second annual ieee international conference on innovative systems in silicon 1 Treffer
- 19th ieee international symposium on defect and fault tolerance in vlsi systems, 2004. dft 2004. proceedings. 1 Treffer
- 2004 international conferce on test 1 Treffer
- 2009 ieee symposium on industrial electronics & applications 1 Treffer
- 2010 ieee international conference on semiconductor electronics (icse2010) 1 Treffer
- 2010 international conference on communication control and computing technologies 1 Treffer
- 2011 12th international symposium on quality electronic design 1 Treffer
- 2019 ieee international electron devices meeting (iedm) 1 Treffer
- 38th midwest symposium on circuits and systems. proceedings 1 Treffer
- analog integrated circuits and signal processing 1 Treffer
- design, automation and test in europe conference and exhibition, 1999. proceedings (cat. no. pr00078) 1 Treffer
- digest of papers 1996 ieee international workshop on iddq testing 1 Treffer
- iee proceedings - computers and digital techniques 1 Treffer
- ieee transactions on components, packaging, and manufacturing technology: part b 1 Treffer
Sprache
203 Treffer
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In: International Journal of Electronics, Jg. 97 (2009-10-31), S. 1-15Online unknownZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 58 (2009-07-01), S. 2196-2208Online unknownZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 11 (2003-10-01), S. 863-870Online unknownZugriff:
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In: IEEE Design & Test of Computers, Jg. 18 (2001), S. 50-61Online unknownZugriff:
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In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Jg. 19 (2000-05-01), S. 568-576Online unknownZugriff:
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In: IEEE Design & Test of Computers, Jg. 19 (2002-03-01), S. 24-33Online unknownZugriff:
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In: IEEE Design & Test of Computers, Jg. 12 (1995), S. 60-67Online unknownZugriff:
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In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Jg. 13 (1994), S. 1413-1418Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 3 (1992-12-01), S. 305-316Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 3 (1992-12-01), S. 349-357Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 3 (1992-12-01), S. 291-303Online unknownZugriff:
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In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Jg. 13 (1994-03-01), S. 359-369Online unknownZugriff:
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In: IEEE Design & Test of Computers, Jg. 10 (1993-06-01), S. 13-23Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 8 (1996-06-01), S. 275-285Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 8 (1996-06-01), S. 287-298Online unknownZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 31 (1996-05-01), S. 732-739Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 3 (1992-12-01), S. 367-375Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 3 (1992-12-01), S. 377-385Online unknownZugriff: