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45 weitere Werte:
- protons 15 Treffer
- total ionizing dose (tid) 13 Treffer
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- pixels 9 Treffer
- active pixel sensor (aps) 7 Treffer
- annealing 7 Treffer
- dark currents (electric) 7 Treffer
- displacement damage dose (ddd) 7 Treffer
- irradiation 7 Treffer
- logic gates 7 Treffer
- radiation damage 7 Treffer
- random telegraph signal (rts) 7 Treffer
- silicon 7 Treffer
- cis 6 Treffer
- ionizing radiation dosage 6 Treffer
- pinned photodiode (ppd) 6 Treffer
- radiation 6 Treffer
- single event effects 6 Treffer
- transistors 6 Treffer
- degradation 5 Treffer
- gamma rays 5 Treffer
- ionizing radiation 5 Treffer
- noise 5 Treffer
- radiation hardening (electronics) 5 Treffer
- cameras 4 Treffer
- charge transfer 4 Treffer
- epitaxial layers 4 Treffer
- heavy ions 4 Treffer
- neutron irradiation 4 Treffer
- proton radiation effects 4 Treffer
- quantum efficiency 4 Treffer
- radiation hard 4 Treffer
- radiation hardening 4 Treffer
- shallow trench isolation (sti) 4 Treffer
- single event transients 4 Treffer
- trapped charge 4 Treffer
- aps 3 Treffer
- burst noise 3 Treffer
- charge coupled devices 3 Treffer
- cmos integrated circuits 3 Treffer
- electrons 3 Treffer
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54 Treffer
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-08-01), Heft 8, S. 1861-1868Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-08-01), Heft 8, S. 1835-1845Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-07-01), Heft 7, S. 1256-1262Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-02-01), Heft 2, S. 268-277Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-07-01), Heft 7, S. 1241-1250Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-07-01), Heft 7, S. 1671-1681Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 66 (2019), Heft 1, S. 104-110Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 38-44Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 45-53Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 60 (2013-12-01), Heft 6, S. 4349-4355Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-03-01), Heft 3, S. 616-624Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 65 (2018-06-01), Heft 6, S. 1264-1270Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 63 (2016-08-01), Heft a4, S. 2183-2192Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 65 (2018), Heft 1, S. 101-110Online academicJournalZugriff:
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In: Journal of Microbiological Methods, Jg. 133 (2017-02-01), S. 1-7academicJournalZugriff:
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In: Journal of Microbiological Methods, Jg. 107 (2014-12-01), S. 150-156academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 59 (2012-04-15), Heft 4, S. 918-926Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 60 (2013-07-01), Heft 4, S. 2623-2629Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 61 (2014-08-01), Heft 4, S. 1909-1917Online academicJournalZugriff: