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Weniger Treffer
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Schlagwort
- conception. technologies. analyse fonctionnement. essais 69 Treffer
- design. technologies. operation analysis. testing 69 Treffer
- complementary mos technology 68 Treffer
- technologie mos complementaire 68 Treffer
- tecnologia mos complementario 68 Treffer
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45 weitere Werte:
- circuits electriques, optiques et optoelectroniques 58 Treffer
- electric, optical and optoelectronic circuits 58 Treffer
- circuit properties 55 Treffer
- proprietes des circuits 55 Treffer
- circuits electroniques 54 Treffer
- electronic circuits 54 Treffer
- circuit integre 32 Treffer
- circuito integrado 32 Treffer
- evaluation performance 32 Treffer
- integrated circuit 32 Treffer
- performance evaluation 32 Treffer
- evaluacion prestacion 31 Treffer
- electronique faible puissance 26 Treffer
- low-power electronics 26 Treffer
- transistors 26 Treffer
- circuits numeriques 22 Treffer
- digital circuits 22 Treffer
- consommation electricite 19 Treffer
- consumo electricidad 19 Treffer
- electric power consumption 19 Treffer
- appareillage electronique et fabrication. composants passifs, circuits imprimes, connectique 16 Treffer
- circuits integres par fonction (dont memoires et processeurs) 16 Treffer
- electronic equipment and fabrication. passive components, printed wiring boards, connectics 16 Treffer
- integrated circuits by function (including memories and processors) 16 Treffer
- amplificateurs 15 Treffer
- amplifiers 15 Treffer
- electronica potencia 14 Treffer
- electronique puissance 14 Treffer
- power electronics 14 Treffer
- transistor 14 Treffer
- convertisseurs de signal 13 Treffer
- signal convertors 13 Treffer
- baja tension 12 Treffer
- basse tension 12 Treffer
- circuit integre cmos 12 Treffer
- cmos integrated circuits 12 Treffer
- low voltage 12 Treffer
- circuit design 11 Treffer
- conception circuit 11 Treffer
- diseno circuito 11 Treffer
- delay time 10 Treffer
- temps retard 10 Treffer
- tiempo retardo 10 Treffer
- alto rendimiento 9 Treffer
- arithmetic circuit 9 Treffer
Publikation
- microelectronics journal 23 Treffer
- integration (amsterdam) 21 Treffer
- microelectronics and reliability 15 Treffer
- solid-state electronics 10 Treffer
- fuzzy sets and systems 4 Treffer
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11 weitere Werte:
- microelectronic engineering 3 Treffer
- selected extended papers from ulis 2012 conference 2 Treffer
- amf/rf[ams/rf] cmos circuit design for wireless transceivers 1 Treffer
- hardware architectures for algebra, cryptology and number theory 1 Treffer
- image and vision computing 1 Treffer
- modern fuzzy control 1 Treffer
- organic electronics (print) 1 Treffer
- real-time imaging (print) 1 Treffer
- selected papers from the essderc 2011 conference 1 Treffer
- signal processing. image communication 1 Treffer
- special issue on breakthrough hardware architectures 1 Treffer
Sprache
80 Treffer
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A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuitsIn: Solid-state electronics, Jg. 91 (2014), S. 81-86academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 46 (2006), Heft 5-6, S. 702-712KonferenzZugriff:
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In: Solid-state electronics, Jg. 82 (2013), S. 41-45academicJournalZugriff:
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In: Microelectronics journal, Jg. 42 (2011), Heft 11, S. 1269-1275academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 43 (2010), Heft 3, S. 251-257academicJournalZugriff:
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In: Microelectronics journal, Jg. 41 (2010), Heft 4, S. 231-239academicJournalZugriff:
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In: Microelectronics journal, Jg. 40 (2009), Heft 1, S. 156-176academicJournalZugriff:
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In: Solid-state electronics, Jg. 63 (2011), Heft 1, S. 14-18academicJournalZugriff:
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In: Microelectronics journal, Jg. 40 (2009), Heft 10, S. 1441-1448academicJournalZugriff:
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In: Microelectronics journal, Jg. 42 (2011), Heft 11, S. 1216-1224academicJournalZugriff:
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In: Fuzzy sets and systems, Jg. 185 (2011), Heft 1, S. 125-137Online academicJournal
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In: Microelectronics and reliability, Jg. 45 (2005), Heft 2, S. 255-268academicJournalZugriff:
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In: Solid-state electronics, Jg. 76 (2012), S. 116-118academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 46 (2013), Heft 4, S. 333-344academicJournalZugriff:
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Implementation of diode and bipolar triggered SCRs for CDM robust ESD protection in 90 nm CMOS ASICsIn: Microelectronics and reliability, Jg. 47 (2007), Heft 7, S. 1030-1035KonferenzZugriff:
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In: Selected extended papers from ULIS 2012 conference, Jg. 88 (2013), S. 2-8academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 46 (2013), Heft 2, S. 165-171academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 3, S. 379-385academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 50 (2010), Heft 2, S. 282-291academicJournalZugriff:
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In: Selected Papers from the ESSDERC 2011 Conference, Jg. 74 (2012), S. 49-57academicJournalZugriff: