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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- telecommunications 35 Treffer
- complementary mos technology 33 Treffer
- technologie mos complementaire 33 Treffer
- tecnologia mos complementario 33 Treffer
- capteurs (chimiques, optiques, electriques, de mouvement, de gaz, etc.); teledetection 24 Treffer
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45 weitere Werte:
- general equipment and techniques 24 Treffer
- sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing 24 Treffer
- techniques et equipements generaux 24 Treffer
- captador medida 20 Treffer
- capteur mesure 20 Treffer
- measurement sensor 20 Treffer
- metrologie et instrumentation 18 Treffer
- metrology and instrumentation 18 Treffer
- circuit integre 12 Treffer
- 0707d 10 Treffer
- dispositifs a images 10 Treffer
- dispositifs optoelectroniques 10 Treffer
- imaging devices 10 Treffer
- optoelectronic devices 10 Treffer
- circuito integrado 9 Treffer
- dispositif optoelectronique 9 Treffer
- dispositivo optoelectronico 9 Treffer
- integrated circuit 9 Treffer
- optoelectronic device 9 Treffer
- fabricacion microelectrica 8 Treffer
- fabrication microelectronique 8 Treffer
- genie mecanique 8 Treffer
- mechanical engineering 8 Treffer
- microelectronic fabrication 8 Treffer
- capteur image cmos 6 Treffer
- circuit properties 6 Treffer
- circuits electriques, optiques et optoelectroniques 6 Treffer
- cmos image sensors 6 Treffer
- electric, optical and optoelectronic circuits 6 Treffer
- evaluacion prestacion 6 Treffer
- evaluation performance 6 Treffer
- instrumentation, equipement et techniques optiques 6 Treffer
- miniaturisation 6 Treffer
- miniaturization 6 Treffer
- optical instruments, equipment and techniques 6 Treffer
- pastilla electronica 6 Treffer
- pastille electronique 6 Treffer
- performance evaluation 6 Treffer
- proprietes des circuits 6 Treffer
- prototipo 6 Treffer
- prototype 6 Treffer
- wafer 6 Treffer
- echantillonnage 5 Treffer
- electronique faible puissance 5 Treffer
- fotodiodo 5 Treffer
Publikation
- spie proceedings series 34 Treffer
- sensors and camera systems for scientific, industrial, and digital photography applications v (san jose ca, 19-21 january 2004) 8 Treffer
- proceedings of spie, the international society for optical engineering 6 Treffer
- smart electronics and mems (san diego ca, 2-4 march 1998) 5 Treffer
- metrology, inspection, and process control for microlithography xix (san jose ca, 7-10 march 2005) 4 Treffer
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18 weitere Werte:
- high-speed photography and photonics (alexandria va, 20-24 september 2004) 3 Treffer
- semiconductor photodetectors ii (san jose ca, 25-26 january 2005) 3 Treffer
- design, test, integration, and packaging of mems/moems (paris, 9-11 mai 2000) 2 Treffer
- integrated optics (theory and applications) 2 Treffer
- optoelectronic integration on silicon ii (san jose ca, 25-26 january 2005) 2 Treffer
- 0smart electronics, mems, biomems, and nanotechnology 1 Treffer
- advanced signal processing algorithms, architectures, and implementations ix (denver co, 19-21 july 1999) 1 Treffer
- integrated optics and photonic integrated circuits (strasbourg, 27-29 april 2004) 1 Treffer
- mems/moems components and their applications iv (22-23 january 2007, san jose, california, usa) 1 Treffer
- micromachining and microfabrication process technology v (santa clara ca, 20-22 september 1999) 1 Treffer
- optoelectronic integrated circuits viii (23-25 january 2006, san jose, california, usa) 1 Treffer
- optoelectronic materials and devices for optical communications (7-10 november 2005, shanghai, china) 1 Treffer
- quantum sensing and nanophotonic devices ii (san jose ca, 23-27 january 2005) 1 Treffer
- sioel '99 : sixth symposium on optoelectronics (bucharest, 22-24 september 1999) 1 Treffer
- smart structures and materials 2006 (smart electronics, mems, biomems, and nanotechnology) 1 Treffer
- smart structures, devices, and systems ii (sydney, 13-15 december 2004) 1 Treffer
- terahertz for military and security applications iii (28-29 march 2005, orlando, florida, usa) 1 Treffer
- visual communications an dimage processing 2000 (perth, 20-23 june 2000) 1 Treffer
Sprache
41 Treffer
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In: Optoelectronic integration on silicon II (San Jose CA, 25-26 January 2005), 2005, S. 59-72KonferenzZugriff:
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In: Sensors and camera systems for scientific, industrial, 2004, S. 193-204KonferenzZugriff:
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In: Sensors and camera systems for scientific, industrial, 2004, S. 175-185KonferenzZugriff:
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In: Integrated optics and photonic integrated circuits (Strasbourg, 27-29 April 2004), 2004, S. 434-440KonferenzZugriff:
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In: Sensors and camera systems for scientific, industrial, 2004, S. 186-192KonferenzZugriff:
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In: Sensors and camera systems for scientific, industrial, 2004, S. 393-401KonferenzZugriff:
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In: Visual communications an dimage processing 2000 (Perth, 20-23 June 2000), 2000, S. 1471-1478KonferenzZugriff:
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In: Semiconductor photodetectors II (San Jose CA, 25-26 January 2005), 2005, S. 122-131KonferenzZugriff:
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In: Sensors and camera systems for scientific, industrial, 2004, S. 67-75KonferenzZugriff:
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In: Semiconductor photodetectors II (San Jose CA, 25-26 January 2005), 2005, S. 77-84KonferenzZugriff:
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In: Sensors and camera systems for scientific, industrial, 2004, S. 438-449KonferenzZugriff:
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In: Sensors and camera systems for scientific, industrial, 2004, S. 222-231KonferenzZugriff:
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In: Sensors and camera systems for scientific, industrial, 2004, S. 213-221KonferenzZugriff:
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In: Optoelectronic materials and devices for optical communications (7-10 November 2005, Shanghai, China), 2005, S. 602032.1KonferenzZugriff:
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In: Micromachining and microfabrication process technology V (Santa Clara CA, 20-22 September 1999), 1999, S. 120-128KonferenzZugriff:
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In: High-speed photography and photonics (Alexandria VA, 20-24 September 2004), 2005, S. 873-880KonferenzZugriff:
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In: Smart electronics and MEMS (San Diego CA, 2-4 March 1998), 1998, S. 233-243KonferenzZugriff:
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In: Smart electronics and MEMS (San Diego CA, 2-4 March 1998), 1998, S. 223-232KonferenzZugriff:
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In: Design, test, integration, and packaging of MEMS/MOEMS (Paris, 9-11 mai 2000), 2000, S. 171-180KonferenzZugriff:
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In: Metrology, inspection, and process control for microlithography XIX (San Jose CA, 7-10 March 2005), 2005KonferenzZugriff: