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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- electronics 24 Treffer
- electronique 24 Treffer
- applied sciences 21 Treffer
- sciences appliquees 21 Treffer
- general equipment and techniques 16 Treffer
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45 weitere Werte:
- techniques et equipements generaux 16 Treffer
- genie mecanique 13 Treffer
- mechanical engineering 13 Treffer
- computer science; control theory; systems 10 Treffer
- informatique; automatique theorique; systemes 10 Treffer
- mechanical instruments, equipment and techniques 10 Treffer
- techniques, equipements et instruments mecaniques 10 Treffer
- automatique theorique. systemes 9 Treffer
- control theory. systems 9 Treffer
- optics 9 Treffer
- optique 9 Treffer
- capteurs (chimiques, optiques, electriques, de mouvement, de gaz, etc.); teledetection 8 Treffer
- etude experimentale 8 Treffer
- experimental study 8 Treffer
- micromechanical devices and systems 8 Treffer
- sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing 8 Treffer
- systemes et dispositifs micromecaniques 8 Treffer
- cross-disciplinary physics: materials science; rheology 7 Treffer
- domaines interdisciplinaires: science des materiaux; rheologie 7 Treffer
- electronique des semiconducteurs. microelectronique. optoelectronique. dispositifs a l'etat solide 7 Treffer
- genie mecanique. construction mecanique 7 Treffer
- materials science 7 Treffer
- mecanique et acoustique 7 Treffer
- mechanical engineering. machine design 7 Treffer
- mechanics acoustics 7 Treffer
- microscopes a champ proche, composants et techniques 7 Treffer
- scanning probe microscopes, components and techniques 7 Treffer
- science des materiaux 7 Treffer
- semiconductor electronics. microelectronics. optoelectronics. solid state devices 7 Treffer
- 0707d 6 Treffer
- commande predictive 6 Treffer
- condensed state physics 6 Treffer
- diffraction rx 6 Treffer
- dispositif microelectromecanique 6 Treffer
- dispositivo microelectromecanico 6 Treffer
- domaines classiques de la physique (y compris les applications) 6 Treffer
- fundamental areas of phenomenology (including applications) 6 Treffer
- mecanique de precision. horlogerie 6 Treffer
- microelectromechanical device 6 Treffer
- microscopie electronique balayage 6 Treffer
- modelisation 6 Treffer
- nanostructure 6 Treffer
- physique de l'etat condense 6 Treffer
- precision engineering, watch making 6 Treffer
- predictive control 6 Treffer
Verlag
Publikation
- isa transactions 6 Treffer
- ieee transactions on control systems technology 3 Treffer
- journal of microelectromechanical systems 3 Treffer
- materials science in semiconductor processing 3 Treffer
- experimental thermal and fluid science 2 Treffer
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26 weitere Werte:
- ieee transactions on nanotechnology 2 Treffer
- journal of micromechanics and microengineering (print) 2 Treffer
- microelectronics international 2 Treffer
- optics and laser technology 2 Treffer
- proceedings of spie, the international society for optical engineering 2 Treffer
- 40e anniversaire du laboratoire de mecanique appliquee r. chaleat : 1er colloque interaction modele experien ce 1 Treffer
- european micro and nano systems 2004 (emn 04) (first issue) 1 Treffer
- journal de physique. iv 1 Treffer
- journal of alloys and compounds 1 Treffer
- journal of electronic materials 1 Treffer
- journal of mass spectrometry 1 Treffer
- journal of network and computer applications 1 Treffer
- journal of physics. e. scientific instruments 1 Treffer
- materials evaluation 1 Treffer
- microsystem technologies 1 Treffer
- nanotechnology (bristol. print) 1 Treffer
- ndt & e international 1 Treffer
- optik (stuttgart) 1 Treffer
- remote sensing for environmental monitoring, gis applications, and geology ii (agia pelagia, 23-26 september 2002) 1 Treffer
- review of scientific instruments 1 Treffer
- sensors and actuators. a, physical 1 Treffer
- smart materials and structures 1 Treffer
- smart structures, devices, and systems iii (11-13 december 2006, adelaire, australia) 1 Treffer
- spie proceedings series 1 Treffer
- ultramicroscopy 1 Treffer
- visualization and data analysis 2006 (16-17 january 2006, san jose, california, usa) 1 Treffer
Sprache
44 Treffer
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In: Materials science in semiconductor processing, Jg. 26 (2014), S. 379-387academicJournalZugriff:
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In: Materials science in semiconductor processing, Jg. 19 (2014), S. 50-56academicJournalZugriff:
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In: European micro and nano systems 2004 (EMN 04) (First issue), 2004, S. 93-96KonferenzZugriff:
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In: Remote sensing for environmental monitoring, GIS applications, and geology II (Agia Pelagia, 23-26 September 2002), 2003, S. 182-192KonferenzZugriff:
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In: Materials science in semiconductor processing, Jg. 16 (2013), Heft 3, S. 612-618academicJournalZugriff:
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In: Journal of alloys and compounds, Jg. 546 (2013), S. 107-111academicJournalZugriff:
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In: IEEE transactions on control systems technology, Jg. 20 (2012), Heft 2, S. 453-464Online academicJournalZugriff:
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In: Journal of mass spectrometry, Jg. 47 (2012), Heft 4, S. 484-489Online academicJournalZugriff:
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In: Microelectronics international, Jg. 29 (2012), Heft 2, S. 96-100Online academicJournalZugriff:
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In: Microsystem technologies, Jg. 17 (2011), Heft 1, S. 19-25Online academicJournalZugriff:
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In: Experimental thermal and fluid science, Jg. 34 (2010), Heft 8, S. 1089-1121academicJournalZugriff:
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In: Microelectronics international, Jg. 27 (2010), Heft 3, S. 148-153Online academicJournalZugriff:
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In: Journal of microelectromechanical systems, Jg. 19 (2010), Heft 1, S. 83-98Online academicJournalZugriff:
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In: Optik (Stuttgart), Jg. 120 (2009), Heft 9, S. 442-446academicJournalZugriff:
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In: IEEE transactions on nanotechnology, Jg. 8 (2009), Heft 1, S. 128-131Online academicJournalZugriff:
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In: Experimental thermal and fluid science, Jg. 33 (2009), Heft 4, S. 561-578academicJournalZugriff:
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In: NDT & E international, Jg. 42 (2009), Heft 8, S. 729-740academicJournalZugriff:
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In: ISA transactions, Jg. 48 (2009), Heft 2, S. 180-189academicJournalZugriff:
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In: Journal of microelectromechanical systems, Jg. 17 (2008), Heft 4, S. 911-920Online academicJournalZugriff:
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In: IEEE transactions on nanotechnology, Jg. 7 (2008), Heft 5, S. 586-595Online academicJournalZugriff: