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Weniger Treffer
Gefunden in
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Schlagwort
- 0779l 1 Treffer
- 8170c 1 Treffer
- 8170e 1 Treffer
- amorphous semiconductors 1 Treffer
- atomic force microscopes 1 Treffer
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45 weitere Werte:
- atomic force microscopy 1 Treffer
- condensed state physics 1 Treffer
- cross-disciplinary physics: materials science; rheology 1 Treffer
- domaines interdisciplinaires: science des materiaux; rheologie 1 Treffer
- electronics 1 Treffer
- electronique 1 Treffer
- essai non destructif 1 Treffer
- essais sur les materiaux 1 Treffer
- etude experimentale 1 Treffer
- experimental study 1 Treffer
- huile 1 Treffer
- infrared thermography 1 Treffer
- largeur raie 1 Treffer
- line widths 1 Treffer
- materials science 1 Treffer
- materials testing 1 Treffer
- mesure vitesse 1 Treffer
- methode ultrasonore 1 Treffer
- metodo ultrasonoro 1 Treffer
- metrologie et instrumentation 1 Treffer
- metrology and instrumentation 1 Treffer
- microscopes a champ proche, composants et techniques 1 Treffer
- microscopes a force atomique 1 Treffer
- microscopie force atomique 1 Treffer
- microscopie optique 1 Treffer
- nondestructive testing 1 Treffer
- non-destructive testing 1 Treffer
- oils 1 Treffer
- optical microscopy 1 Treffer
- paints 1 Treffer
- peinture 1 Treffer
- physique de l'etat condense 1 Treffer
- propagation velocity 1 Treffer
- quartz 1 Treffer
- scanning probe microscopes, components and techniques 1 Treffer
- science des materiaux 1 Treffer
- semiconducteur amorphe 1 Treffer
- techniques, appareillages et instruments thermiques 1 Treffer
- thermal instruments, apparatus and techniques 1 Treffer
- thermographie ir 1 Treffer
- ultrasonic method 1 Treffer
- ultrasonic velocity measurement 1 Treffer
- velocidad propagacion 1 Treffer
- velocity measurement 1 Treffer
- vitesse propagation 1 Treffer
Verlag
Publikation
- 8th aita conference 2005. workshop on advanced infrared technology and applications 1 Treffer
- infrared physics & technology 1 Treffer
- optical fabrication, testing and metrology ii (13-15 september 2005, jena, germany) 1 Treffer
- proceedings of spie, the international society for optical engineering 1 Treffer
Sprache
2 Treffer
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In: 8th AITA conference 2005. Workshop on advanced infrared technology and applications, Jg. 49 (2007), Heft 3, S. 243-248KonferenzZugriff:
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In: Optical fabrication, testing and metrology II (13-15 September 2005, Jena, Germany), 2005, S. 59651W.1KonferenzZugriff: