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- benchmark testing 1 Treffer
- capacitance 1 Treffer
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- dielectrics 1 Treffer
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Publikation
- proceedings of the ieee 1998 international interconnect technology conference (cat. no.98ex102), interconnect technology conference, 1998. proceedings of the ieee 1998 international, interconnect technology 1 Treffer
- proceedings of the ieee 2000 international interconnect technology conference (cat. no.00ex407), interconnect technology conference, 2000. proceedings of the ieee 2000 international, interconnect technology 1 Treffer
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In: Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407), 2000, S. 167-169KonferenzZugriff:
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In: Proceedings of the IEEE 1998 International Interconnect Technology Conference (Cat. No.98EX102), 1998, S. 178-180KonferenzZugriff: