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Verlag
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12 Treffer
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In: Microsystem Technologies, Jg. 23 (2016-05-27), S. 4245-4253Online unknownZugriff:
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A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuitsIn: Solid-State Electronics, Jg. 91 (2014), S. 81-86Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 126 (2021-11-01), S. 114275-114275Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 33 (1993-10-01), S. 2047-2052Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 38 (1998-06-01), S. 901-905Online unknownZugriff:
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In: Solid-State Electronics, Jg. 49 (2005-05-01), S. 708-715Online unknownZugriff:
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In: Solid-State Electronics, Jg. 185 (2021-11-01), S. 108037-108037Online unknownZugriff:
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In: Microelectronic Engineering, Jg. 148 (2015-12-01), S. 85-90Online unknownZugriff:
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In: ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures, 2002-12-30Online unknownZugriff:
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In: Proceedings of International Conference on Microelectronic Test Structures, 2002-12-24Online unknownZugriff:
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In: IEEE Transactions on Microwave Theory and Techniques, Jg. 62 (2014-11-01), S. 2768-2783Online unknownZugriff:
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In: Organic Electronics, Jg. 13 (2012-12-01), S. 3296-3301Online unknownZugriff: