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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- complementary mos technology 529 Treffer
- technologie mos complementaire 529 Treffer
- tecnologia mos complementario 527 Treffer
- circuits electriques, optiques et optoelectroniques 262 Treffer
- electric, optical and optoelectronic circuits 262 Treffer
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45 weitere Werte:
- circuit properties 246 Treffer
- proprietes des circuits 246 Treffer
- circuits electroniques 235 Treffer
- electronic circuits 235 Treffer
- transistors 201 Treffer
- evaluation performance 176 Treffer
- performance evaluation 176 Treffer
- evaluacion prestacion 175 Treffer
- circuit integre 172 Treffer
- integrated circuit 171 Treffer
- circuito integrado 169 Treffer
- appareillage electronique et fabrication. composants passifs, circuits imprimes, connectique 113 Treffer
- electronic equipment and fabrication. passive components, printed wiring boards, connectics 113 Treffer
- electronique faible puissance 98 Treffer
- low-power electronics 98 Treffer
- mosfet 90 Treffer
- transistor mosfet 90 Treffer
- circuit integre cmos 89 Treffer
- cmos integrated circuits 89 Treffer
- fiabilite 84 Treffer
- physics 84 Treffer
- physique 84 Treffer
- reliability 84 Treffer
- circuits integres par fonction (dont memoires et processeurs) 82 Treffer
- fiabilidad 82 Treffer
- integrated circuits by function (including memories and processors) 82 Treffer
- circuit design 79 Treffer
- conception circuit 79 Treffer
- diseno circuito 76 Treffer
- circuits numeriques 73 Treffer
- digital circuits 73 Treffer
- implementation 73 Treffer
- power electronics 70 Treffer
- electronique puissance 69 Treffer
- implementacion 69 Treffer
- electronica potencia 68 Treffer
- silicium 67 Treffer
- silicon 67 Treffer
- silicio 66 Treffer
- amplificateurs 63 Treffer
- amplifiers 63 Treffer
- consommation electricite 62 Treffer
- consumo electricidad 62 Treffer
- deterioracion 62 Treffer
- electric power consumption 62 Treffer
Publikation
- microelectronics and reliability 193 Treffer
- microelectronics journal 154 Treffer
- solid-state electronics 82 Treffer
- integration (amsterdam) 62 Treffer
- microelectronic engineering 54 Treffer
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45 weitere Werte:
- organic electronics (print) 16 Treffer
- reliability of electron devices, failure physics and analysis 10 Treffer
- amf/rf[ams/rf] cmos circuit design for wireless transceivers 9 Treffer
- insulating films on semiconductors 2013 9 Treffer
- 16th european symposium on reliability of electron devices, failure physics and analysis (esref 2005), arcachon, france, october 10-14, 2005 7 Treffer
- 17th european symposium on reliability of electron devices, failure physics and analysis (esref 2006), wuppertal, germany, 3-6 october 2006 7 Treffer
- 14th workshop on dielectrics in microelectronics (wodim 2006) 6 Treffer
- journal of parallel and distributed computing (print) 6 Treffer
- micro/nano devices and systems 2013: an open thematic journal issue 6 Treffer
- selected extended papers from ulis 2012 conference 6 Treffer
- selected papers from the essderc 2011 conference 6 Treffer
- 2009 international electron devices and materials symposium (iedms) 5 Treffer
- materials science in semiconductor processing 5 Treffer
- dielectrics in microelectronics (wodim 2004) 4 Treffer
- papers selected from the ultimate integration on silicon conference 2009, ulis 2009 4 Treffer
- computing with future nanotechnology 3 Treffer
- neural networks 3 Treffer
- neurocomputing (amsterdam) 3 Treffer
- reliability physics of advanced electron devices 3 Treffer
- selected full-length extended papers from the eurosoi 2009 conference 3 Treffer
- comptes rendus. physique 2 Treffer
- cryogenics (guildford) 2 Treffer
- international journal of thermal sciences 2 Treffer
- journal of non-crystalline solids 2 Treffer
- negative-bias-temperature instability (nbti) in mos devices special sectio n 2 Treffer
- new aspects of si-and ge-based materials and devices 2 Treffer
- special issue devoted to the 2nd international memory workshop (imw 2010) 2 Treffer
- special issue with papers selected from the ultimate integration on silicon conference, ulis 2008 2 Treffer
- [microscale heat transfer] 1 Treffer
- computer networks (1999) 1 Treffer
- computers & mathematics with applications (1987) 1 Treffer
- computers and electronics in agriculture 1 Treffer
- diamond and related materials 1 Treffer
- experimental thermal and fluid science 1 Treffer
- expert systems with applications 1 Treffer
- fast wafer level reliability: methods and experiences 1 Treffer
- fuzzy sets and systems 1 Treffer
- hardware architectures for algebra, cryptology and number theory 1 Treffer
- image and vision computing 1 Treffer
- international journal of heat and fluid flow 1 Treffer
- journal of systems architecture 1 Treffer
- modern fuzzy control 1 Treffer
- neuromorphic engineering: from neural systels to brain-like engineered systems 1 Treffer
- optics communications 1 Treffer
- optik (stuttgart) 1 Treffer
Sprache
Geographischer Bezug
602 Treffer
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In: Microelectronics and reliability, Jg. 54 (2014), Heft 1, S. 90-99academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 47 (2014), Heft 4, S. 510-531academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 47 (2014), Heft 1, S. 48-61academicJournalZugriff:
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A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuitsIn: Solid-state electronics, Jg. 91 (2014), S. 81-86academicJournalZugriff:
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In: Micro/Nano Devices and Systems 2013: An open thematic journal issue, Jg. 119 (2014), S. 155-158academicJournalZugriff:
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In: Micro/Nano Devices and Systems 2013: An open thematic journal issue, Jg. 119 (2014), S. 89-94academicJournalZugriff:
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In: Micro/Nano Devices and Systems 2013: An open thematic journal issue, Jg. 119 (2014), S. 178-182academicJournalZugriff:
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In: Solid-state electronics, Jg. 98 (2014), S. 26-31academicJournalZugriff:
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In: Solid-state electronics, Jg. 91 (2014), S. 91-99academicJournalZugriff:
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In: Solid-state electronics, Jg. 95 (2014), S. 28-31academicJournalZugriff:
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In: Solid-state electronics, Jg. 62 (2011), Heft 1, S. 115-122academicJournalZugriff:
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In: 14TH Workshop on dielectrics in microelectronics (WoDiM 2006), Jg. 47 (2007), Heft 4-5, S. 739-742KonferenzZugriff:
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In: SiO2, advanced dielectrics and related devices, Mondelo, Palermo, Italy, June 25-28, 2006, Jg. 353 (2007), Heft 5-7, S. 639-644KonferenzZugriff:
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In: Microelectronics and reliability, Jg. 46 (2006), Heft 5-6, S. 702-712KonferenzZugriff:
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In: Micro/Nano Devices and Systems 2013: An open thematic journal issue, Jg. 119 (2014), S. 127-130academicJournalZugriff:
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In: Solid-state electronics, Jg. 91 (2014), S. 137-146academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 3, S. 349-355academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 4, S. 592-599academicJournalZugriff:
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In: Solid-state electronics, Jg. 81 (2013), S. 151-156academicJournalZugriff:
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In: Reliability of electron devices, failure physics and analysis, Jg. 44 (2004), Heft 9-11, S. 1519-1522KonferenzZugriff: