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Weniger Treffer
Gefunden in
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Schlagwort
- gate oxide 64 Treffer
- oxido rejilla 64 Treffer
- oxyde grille 64 Treffer
- evaluacion prestacion 40 Treffer
- evaluation performance 40 Treffer
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45 weitere Werte:
- performance evaluation 40 Treffer
- capa multiple 36 Treffer
- multicouche 36 Treffer
- multiple layer 36 Treffer
- fiabilidad 32 Treffer
- fiabilite 32 Treffer
- reliability 32 Treffer
- damaging 30 Treffer
- deterioracion 30 Treffer
- endommagement 30 Treffer
- seuil tension 28 Treffer
- umbral tension 28 Treffer
- voltage threshold 28 Treffer
- dielectrico alta constante dielectrica 26 Treffer
- dielectrique permittivite elevee 26 Treffer
- high k dielectric 26 Treffer
- corriente escape 25 Treffer
- courant fuite 25 Treffer
- leakage current 25 Treffer
- circuits electriques, optiques et optoelectroniques 23 Treffer
- electric, optical and optoelectronic circuits 23 Treffer
- nmos technology 23 Treffer
- silicon on insulator technology 23 Treffer
- technologie nmos 23 Treffer
- technologie silicium sur isolant 23 Treffer
- tecnologia nmos 23 Treffer
- tecnologia silicio sobre aislante 23 Treffer
- dual gate transistor 22 Treffer
- transistor de compuerta doble 22 Treffer
- transistor grille double 22 Treffer
- circuit properties 20 Treffer
- proprietes des circuits 20 Treffer
- pmos technology 19 Treffer
- technologie pmos 19 Treffer
- tecnologia pmos 19 Treffer
- circuits electroniques 18 Treffer
- contrainte electrique 18 Treffer
- electric stress 18 Treffer
- electronic circuits 18 Treffer
- self aligned technology 18 Treffer
- technologie autoalignee 18 Treffer
- tecnologia rejilla autoalineada 18 Treffer
- tension electrica 18 Treffer
- cmos 17 Treffer
- corriente rejilla 17 Treffer
Verlag
Publikation
- i.e.e.e. transactions on electron devices 27 Treffer
- ieee electron device letters 20 Treffer
- solid-state electronics 13 Treffer
- microelectronic engineering 12 Treffer
- microelectronics and reliability 5 Treffer
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43 weitere Werte:
- ieee transactions on nanotechnology 4 Treffer
- 2004 ieee international integrated reliability workshop (final report) 3 Treffer
- ieee international electron devices meeting 2004 (iedm technical digest) 3 Treffer
- insulating films on semiconductors 2013 3 Treffer
- materials science in semiconductor processing 3 Treffer
- semiconductor science and technology 3 Treffer
- 2004 ieee international reliability physics symposium proceedings, 42nd annual (phoenix az, 25-29 april 2004) 2 Treffer
- 2004 symposium on vlsi technology (digest of technical papers) 2 Treffer
- e-mrs 2006 symposium l : characterization of high-k dielectric materials 2 Treffer
- ieee microwave and wireless components letters 2 Treffer
- infos 2003 proceedings of the 13th biennial conference on insulating films on semiconductors: june 18-20, 2003, barcelona, spain 2 Treffer
- journal of computational electronics (print) 2 Treffer
- microelectronics journal 2 Treffer
- papers selected from the 35th european solid-state device research conference - essderc'05 2 Treffer
- 17th european symposium on reliability of electron devices, failure physics and analysis (esref 2006), wuppertal, germany, 3-6 october 2006 1 Treffer
- 17th international conference on vlsi design (concurrently with the 3rd international conference on embedded systems design) 1 Treffer
- 2002 ieee radio frequency integrated circuits (rfic) symposium (seattle wa, 2-4 june 2002, digest of papers) 1 Treffer
- 2002 symposium on vlsi technology (honolulu hi, 11-13 june 2002, digest of technical papers) 1 Treffer
- 2004 ieee international soi conference (charleston sc, 4-7 october 2004) 1 Treffer
- 2004 international conference on microelectronic test structures (march 22-25, 2004, awaji yumebutai international conference center, japan) 1 Treffer
- 2009 international electron devices and materials symposium (iedms) 1 Treffer
- digest of papers - ieee radio frequency integrated circuits symposium 1 Treffer
- electron devices (san francisco ca, 8-11 december 2002, technical digest) 1 Treffer
- essderc 2002 : 32nd european solid-state device research conference (firenze, 24-26 september 2002) 1 Treffer
- ieee journal of solid-state circuits 1 Treffer
- ieee transactions on microwave theory and techniques 1 Treffer
- ieice transactions on electronics 1 Treffer
- infos 2005: proceedings of the 14th biennal conference on insulating films on semiconductors, june 22-24, 2005, leuven, belgium 1 Treffer
- infos 2007: proceedings of the 15th biennial conference on insulating films on semiconductors, june 20-23, 2007, glyfada athens, greece 1 Treffer
- integration (amsterdam) 1 Treffer
- international journal of electronics 1 Treffer
- isdrs 2005 1 Treffer
- journal of materials science. materials in electronics 1 Treffer
- micro and nano engineering 2004: proceedings of the 30th international conference on micro and nano engineering, september 19-22, 2004, rotterdam, the netherlands 1 Treffer
- micro- and nano-engineering 99: mne 99 1 Treffer
- new aspects of si-and ge-based materials and devices 1 Treffer
- noise in devices and circuits ii (maspalomas, 26-28 may 2004) 1 Treffer
- papers selected from the ultimate integration on silicon conference 2009, ulis 2009 1 Treffer
- proceedings - electrochemical society 1 Treffer
- proceedings of the 11th international symposium on the physical & failure analysis of integrated circuits (ipfa 2004) 1 Treffer
- selected extended papers from ulis 2012 conference 1 Treffer
- spie proceedings series 1 Treffer
- ulsi process integration iii (paris, 28 april - 2 may 2003) 1 Treffer
Sprache
119 Treffer
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In: Solid-state electronics, Jg. 62 (2011), Heft 1, S. 115-122academicJournalZugriff:
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In: ISDRS 2005, Jg. 50 (2006), Heft 6, S. 979-985KonferenzZugriff:
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In: Infos 2005: Proceedings of the 14th Biennal Conference on Insulating Films on Semiconductors, June 22-24, Jg. 80 (2005), S. 114-121KonferenzZugriff:
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In: 2004 IEEE international reliability physics symposium proceedings, 42nd annual (Phoenix AZ, 25-29 April 2004), 2004, S. 110-116KonferenzZugriff:
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In: IEICE transactions on electronics, Jg. 94 (2011), Heft 5, S. 751-759academicJournalZugriff:
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In: International journal of electronics, Jg. 97 (2010), Heft 9-10, S. 985-1005academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 59 (2012), Heft 7, S. 1813-1828Online academicJournalZugriff:
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In: IEEE journal of solid-state circuits, Jg. 45 (2010), Heft 9, S. 1856-1869Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 52 (2005), Heft 6, S. 1159-1164Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 53 (2006), Heft 8, S. 1815-1820Online academicJournalZugriff:
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In: IEEE electron device letters, Jg. 32 (2011), Heft 6, S. 728-730Online academicJournalZugriff:
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In: IEEE microwave and wireless components letters, Jg. 15 (2005), Heft 7, S. 445-447Online academicJournalZugriff:
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In: IEEE microwave and wireless components letters, Jg. 17 (2007), Heft 10, S. 718-720Online academicJournalZugriff:
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In: IEEE electron device letters, Jg. 28 (2007), Heft 12, S. 1117-1119Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 58 (2011), Heft 8, S. 2282-2292Online academicJournalZugriff:
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In: Papers selected from the 35th European Solid-State Device Research Conference - ESSDERC'05, Jg. 50 (2006), Heft 4, S. 527-535KonferenzZugriff:
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In: IEEE International Electron Devices Meeting 2004 (IEDM technical digest), 2004, S. 477-480KonferenzZugriff:
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In: 2004 international conference on microelectronic test structures (March 22-25, 2004, S. 123-126KonferenzZugriff:
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In: IEEE International Electron Devices Meeting 2004 (IEDM technical digest), 2004, S. 661-664KonferenzZugriff:
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In: 17th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2006), Wuppertal, Germany, 3-6 October 2006, Jg. 46 (2006), Heft 9-11, S. 1669-1672KonferenzZugriff: