Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- logic gates 5 Treffer
- complementary metal oxide semiconductors 4 Treffer
- cmos integrated circuits 3 Treffer
- metal oxide semiconductor field-effect transistors 3 Treffer
- nanowires 3 Treffer
-
45 weitere Werte:
- transistors 3 Treffer
- ac 2 Treffer
- amorphous ingazno (a-igzo) 2 Treffer
- breakdown voltage 2 Treffer
- bti 2 Treffer
- cmos 2 Treffer
- cmos technology 2 Treffer
- cmos-compatible 2 Treffer
- current measurement 2 Treffer
- degradation 2 Treffer
- depletion layers (electronics) 2 Treffer
- dielectric breakdown 2 Treffer
- digital electronics 2 Treffer
- direct currents 2 Treffer
- electric breakdown 2 Treffer
- electric fields 2 Treffer
- electric potential measurement 2 Treffer
- electric wire 2 Treffer
- electrical engineering 2 Treffer
- gate-all-around (gaa) 2 Treffer
- high voltages 2 Treffer
- hkmg 2 Treffer
- indium gallium zinc oxide 2 Treffer
- inverters 2 Treffer
- monolithic 3d 2 Treffer
- nanostructured materials 2 Treffer
- nanowire 2 Treffer
- off-state 2 Treffer
- semiconductors 2 Treffer
- stress 2 Treffer
- tddb 2 Treffer
- thin film transistors 2 Treffer
- thin-film transistors (tfts) 2 Treffer
- three-dimensional displays 2 Treffer
- threshold voltage 2 Treffer
- top-down 2 Treffer
- voltage measurement 2 Treffer
- amplificador 1 Treffer
- amplificateur 1 Treffer
- amplifier 1 Treffer
- and gate 1 Treffer
- appareillage electronique et fabrication. composants passifs, circuits imprimes, connectique 1 Treffer
- applied sciences 1 Treffer
- baja tension 1 Treffer
- basse tension 1 Treffer
Verlag
Sprache
5 Treffer
-
In: IEEE electron device letters, Jg. 32 (2011), Heft 10, S. 1448-1450Online academicJournalZugriff:
-
In: IEEE Electron Device Letters, Jg. 28 (2007-11-01), Heft 11, S. 1021-1024Online academicJournalZugriff:
-
1-V Full-Swing Depletion-Load a-In–Ga–Zn–O Inverters for Back-End-of-Line Compatible 3D Integration.In: IEEE Electron Device Letters, Jg. 37 (2016-04-01), Heft 4, S. 441-444Online academicJournalZugriff:
-
In: IEEE Electron Device Letters, Jg. 36 (2015-05-01), Heft 5, S. 430-432Online academicJournalZugriff:
-
In: IEEE Electron Device Letters, Jg. 32 (2011-11-01), Heft 11, S. 1492-1494Online academicJournalZugriff: