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In: Microelectronics Reliability, Jg. 126 (2021-11-01), S. 114210-114210Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 126 (2021-11-01), S. 114275-114275Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 33 (1993-10-01), S. 2047-2052Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 32 (1992-11-01), S. 1509-1514Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 124 (2021-09-01), S. 114212-114212Online unknownZugriff: