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- complementary metal oxide semiconductors 3 Treffer
- gamma rays 3 Treffer
- logic gates 3 Treffer
- radiation hard 3 Treffer
- radiation hardening 3 Treffer
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- radiation hardening (electronics) 3 Treffer
- total ionizing dose (tid) 3 Treffer
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- maps 2 Treffer
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- quantum efficiency 2 Treffer
- radiation damage 2 Treffer
- shallow trench isolation (sti) 2 Treffer
- trapped charge 2 Treffer
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- active pixel sensors 1 Treffer
- active pixel sensors (aps) 1 Treffer
- aps 1 Treffer
- astrophysical radiation 1 Treffer
- charge coupled devices 1 Treffer
- charge transfer 1 Treffer
- cis 1 Treffer
- cmos devices 1 Treffer
- cmos image sensors (ciss) 1 Treffer
- current measurement 1 Treffer
- detectors 1 Treffer
- digital images 1 Treffer
- displacement damage 1 Treffer
- dsm 1 Treffer
- effect of radiation on integrated circuits 1 Treffer
- electric fields 1 Treffer
- electron radiation effects 1 Treffer
- gamma-rays 1 Treffer
- histograms 1 Treffer
- ionizing dose 1 Treffer
- ionizing radiation dosage 1 Treffer
- irradiation 1 Treffer
- iter 1 Treffer
- layout 1 Treffer
- leakage current 1 Treffer
- light filters 1 Treffer
- photons 1 Treffer
- pinned photodiode (ppd) 1 Treffer
- proton radiation effects 1 Treffer
- rad hard 1 Treffer
- rad-hard 1 Treffer
- radiation hardened by design (rhbd) 1 Treffer
- radiation tolerant 1 Treffer
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-08-01), Heft 8, S. 1835-1845Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 65 (2018), Heft 1, S. 101-110Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 59 (2012-04-15), Heft 4, S. 918-926Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 57 (2010-08-01), Heft 4, S. 2056-2065Online academicJournalZugriff: