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- annealing 29 Treffer
- photodiodes 29 Treffer
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- cmos technology 28 Treffer
- degradation 28 Treffer
- single event effects 28 Treffer
- x-rays 28 Treffer
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- semiconductors 26 Treffer
- total ionizing dose 26 Treffer
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- ionizing radiation dosage 25 Treffer
- logic circuits 25 Treffer
- oxides 24 Treffer
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- noise 22 Treffer
- total ionizing dose (tid) 22 Treffer
- radiation hardening 21 Treffer
- tid 21 Treffer
- dark currents (electric) 20 Treffer
- monte carlo method 20 Treffer
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- electrons 19 Treffer
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404 Treffer
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In: IEEE Transactions on Nuclear Science, Jg. 69 (2022-07-01), Heft 7, S. 1506-1514Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, 2020-07-01Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 245-252Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 65 (2018-08-01), Heft 8, S. 1908-1913Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 65 (2018-08-01), Heft 8, S. 1519-1524Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 60 (2013-12-01), Heft 6, S. 4526-4532Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 56 (2009-08-02), Heft 4, S. 1914-1924Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 56 (2009-08-02), Heft 4, S. 2132-2141Online academicJournalZugriff:
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Bias Dependence of Gate Oxide Degradation of 90 nm CMOS Transistors Under 60 MeV Proton Irradiation.In: IEEE Transactions on Nuclear Science, Jg. 53 (2006-08-01), Heft 4, S. 1959-1966Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 60 (2013-07-01), Heft 4, S. 2503-2510Online academicJournalZugriff:
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