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In: Microelectronics Reliability, Jg. 117 (2021-02-01), S. 114036-114036Online unknownZugriff:
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In: 2021 IEEE International Symposium on Circuits and Systems (ISCAS), 2021-05-01Online unknownZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 53 (2018-04-01), S. 1139-1148Online unknownZugriff:
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In: IOP Conference Series: Materials Science and Engineering, Jg. 151 (2016-10-01), S. 012014-12014Online unknownZugriff: