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Weniger Treffer
Gefunden in
Schlagwort
- hardware_logicdesign 36 Treffer
- materials science 31 Treffer
- law 28 Treffer
- law.invention 28 Treffer
- transistor 24 Treffer
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45 weitere Werte:
- electrical and electronic engineering 13 Treffer
- electrical engineering 13 Treffer
- hardware_general 12 Treffer
- electronic circuit 11 Treffer
- electronic engineering 10 Treffer
- electronic, optical and magnetic materials 10 Treffer
- mosfet 10 Treffer
- 01 natural sciences 9 Treffer
- 0103 physical sciences 9 Treffer
- 010302 applied physics 8 Treffer
- hardware_memorystructures 8 Treffer
- engineering 7 Treffer
- threshold voltage 7 Treffer
- voltage 7 Treffer
- gate oxide 6 Treffer
- static random-access memory 6 Treffer
- 02 engineering and technology 5 Treffer
- inverter 5 Treffer
- pmos logic 5 Treffer
- 0210 nano-technology 4 Treffer
- 021001 nanoscience & nanotechnology 4 Treffer
- chemistry 4 Treffer
- metal gate 4 Treffer
- nanoelectronics 4 Treffer
- nmos logic 4 Treffer
- planar 4 Treffer
- ring oscillator 4 Treffer
- and gate 3 Treffer
- physics 3 Treffer
- semiconductor device modeling 3 Treffer
- silicon on insulator 3 Treffer
- subthreshold conduction 3 Treffer
- time-dependent gate oxide breakdown 3 Treffer
- very-large-scale integration 3 Treffer
- wafer 3 Treffer
- capacitor 2 Treffer
- chemistry.chemical_compound 2 Treffer
- chemistry.chemical_element 2 Treffer
- chip 2 Treffer
- diode 2 Treffer
- dissipation 2 Treffer
- field-effect transistor 2 Treffer
- hardware_arithmeticandlogicstructures 2 Treffer
- limiter 2 Treffer
- low-power electronics 2 Treffer
Verlag
Publikation
- ieee transactions on electron devices 4 Treffer
- ieee electron device letters 2 Treffer
- ieee journal of solid-state circuits 2 Treffer
- 2005 ieee international symposium on circuits and systems 1 Treffer
- 2008 15th international symposium on the physical and failure analysis of integrated circuits 1 Treffer
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23 weitere Werte:
- 2008 ieee international conference on electron devices and solid-state circuits 1 Treffer
- 2008 ieee international electron devices meeting 1 Treffer
- 2008 ieee international test conference 1 Treffer
- 2009 ieee international conference on computer design 1 Treffer
- 2009 international conference on simulation of semiconductor processes and devices 1 Treffer
- 2010 ieee 25th international symposium on defect and fault tolerance in vlsi systems 1 Treffer
- 2010 symposium on vlsi technology 1 Treffer
- 2011 ieee international conference on ic design & technology 1 Treffer
- 2011 ieee ninth international symposium on parallel and distributed processing with applications workshops 1 Treffer
- 2012 second international conference on advanced computing & communication technologies 1 Treffer
- 2015 symposium on vlsi technology (vlsi technology) 1 Treffer
- 2016 27th annual semi advanced semiconductor manufacturing conference (asmc) 1 Treffer
- 2016 china semiconductor technology international conference (cstic) 1 Treffer
- 2016 international conference on circuit, power and computing technologies (iccpct) 1 Treffer
- 2017 75th annual device research conference (drc) 1 Treffer
- 2019 electron devices technology and manufacturing conference (edtm) 1 Treffer
- 2021 2nd global conference for advancement in technology (gcat) 1 Treffer
- 2021 5th international conference on trends in electronics and informatics (icoei) 1 Treffer
- 26th ieee vlsi test symposium (vts 2008) 1 Treffer
- ieee journal of the electron devices society 1 Treffer
- ieee open journal of nanotechnology 1 Treffer
- ieee transactions on circuits and systems i: regular papers 1 Treffer
- ieee transactions on device and materials reliability 1 Treffer
Sprache
42 Treffer
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-02-01), S. 746-752Online unknownZugriff:
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In: IEEE Transactions on Circuits and Systems I: Regular Papers, Jg. 67 (2020-12-01), S. 4281-4294Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 18 (2018-03-01), S. 27-36Online unknownZugriff:
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In: 2019 Electron Devices Technology and Manufacturing Conference (EDTM), 2019-03-01Online unknownZugriff:
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In: 2018 IEEE Topical Workshop on Internet of Space (TWIOS), 2018Online unknownZugriff:
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In: 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2016-05-01Online unknownZugriff:
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In: 2016 China Semiconductor Technology International Conference (CSTIC), 2016-03-01Online unknownZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 44 (2009-05-01), S. 1655-1663Online unknownZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 44 (2009-08-01), S. 2233-2243Online unknownZugriff:
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In: 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010-10-01Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 24 (2003-02-01), S. 114-116Online unknownZugriff:
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In: 26th IEEE VLSI Test Symposium (vts 2008), 2008-04-01Online unknownZugriff:
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In: 2010 Symposium on VLSI Technology, 2010-06-01Online unknownZugriff:
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In: 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st, 2003-12-22Online unknownZugriff:
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In: 2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.03CH37408), 2004-03-02Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 11 (1990), S. 9-11Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-06-01), S. 3112-3118Online unknownZugriff:
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In: IEEE Open Journal of Nanotechnology, Jg. 2 (2021), S. 72-77Online unknownZugriff:
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In: 2021 2nd Global Conference for Advancement in Technology (GCAT), 2021-10-01Online unknownZugriff: