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Weniger Treffer
Gefunden in
Schlagwort
- cmos 111 Treffer
- materials science 92 Treffer
- electronic, optical and magnetic materials 83 Treffer
- optoelectronics 80 Treffer
- electrical engineering 63 Treffer
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45 weitere Werte:
- hardware_integratedcircuits 57 Treffer
- hardware_performanceandreliability 55 Treffer
- law 50 Treffer
- law.invention 50 Treffer
- hardware_logicdesign 45 Treffer
- electronic engineering 43 Treffer
- transistor 38 Treffer
- threshold voltage 30 Treffer
- condensed matter physics 25 Treffer
- engineering 22 Treffer
- chemistry 20 Treffer
- voltage 19 Treffer
- gate oxide 15 Treffer
- hardware_general 15 Treffer
- silicon on insulator 15 Treffer
- field-effect transistor 14 Treffer
- logic gate 14 Treffer
- materials chemistry 14 Treffer
- nmos logic 13 Treffer
- 02 engineering and technology 12 Treffer
- chemistry.chemical_compound 12 Treffer
- electronic circuit 12 Treffer
- integrated circuit 12 Treffer
- nuclear and high energy physics 12 Treffer
- nuclear energy and engineering 12 Treffer
- chemistry.chemical_element 11 Treffer
- computer science 11 Treffer
- low-power electronics 11 Treffer
- 01 natural sciences 10 Treffer
- 0103 physical sciences 10 Treffer
- gate dielectric 10 Treffer
- pmos logic 10 Treffer
- shallow trench isolation 10 Treffer
- subthreshold conduction 10 Treffer
- 010302 applied physics 8 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 8 Treffer
- capacitance 8 Treffer
- hardware_memorystructures 8 Treffer
- inverter 8 Treffer
- semiconductor device modeling 8 Treffer
- silicon 8 Treffer
- static random-access memory 8 Treffer
- surfaces, coatings and films 8 Treffer
- and gate 7 Treffer
- atomic and molecular physics, and optics 7 Treffer
Verlag
- institute of electrical and electronics engineers (ieee) 85 Treffer
- elsevier bv 12 Treffer
- iop publishing 6 Treffer
- ieee 5 Treffer
- springer science and business media llc 3 Treffer
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14 weitere Werte:
- informa uk limited 2 Treffer
- institution of engineering and technology (iet) 2 Treffer
- wiley 2 Treffer
- world scientific pub co pte lt 2 Treffer
- allerton press 1 Treffer
- american vacuum society 1 Treffer
- arxiv 1 Treffer
- association for computing machinery (acm) 1 Treffer
- emerald 1 Treffer
- hal ccsd 1 Treffer
- imaps - international microelectronics assembly and packaging society 1 Treffer
- institute of electrical and electronics engineers inc. 1 Treffer
- institute of electronics, information and communications engineers (ieice) 1 Treffer
- zenodo 1 Treffer
Publikation
- ieee transactions on electron devices 32 Treffer
- ieee electron device letters 18 Treffer
- ieee transactions on nuclear science 10 Treffer
- ieee transactions on very large scale integration (vlsi) systems 6 Treffer
- semiconductor science and technology 5 Treffer
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34 weitere Werte:
- ieee transactions on circuits and systems ii: express briefs 4 Treffer
- ieee transactions on device and materials reliability 4 Treffer
- solid-state electronics 4 Treffer
- ieee journal of solid-state circuits 3 Treffer
- ieee transactions on circuits and systems i: regular papers 3 Treffer
- microelectronic engineering 3 Treffer
- aeu - international journal of electronics and communications 2 Treffer
- electronics letters 2 Treffer
- ieee transactions on semiconductor manufacturing 2 Treffer
- international journal of electronics 2 Treffer
- microelectronics reliability 2 Treffer
- 1996 ieee nuclear science symposium. conference record 1 Treffer
- 2005 ieee international symposium on circuits and systems 1 Treffer
- 2005 international semiconductor device research symposium 1 Treffer
- acm transactions on design automation of electronic systems 1 Treffer
- circuit world 1 Treffer
- iee proceedings - circuits, devices and systems 1 Treffer
- ieee journal of the electron devices society 1 Treffer
- ieee transactions on computer-aided design of integrated circuits and systems 1 Treffer
- ieee transactions on nanotechnology 1 Treffer
- ieice transactions on fundamentals of electronics, communications and computer sciences 1 Treffer
- international journal of nanoscience 1 Treffer
- journal of circuits, systems and computers 1 Treffer
- journal of electronic testing 1 Treffer
- journal of materials science: materials in electronics 1 Treffer
- journal of microelectronics and electronic packaging 1 Treffer
- journal of semiconductors 1 Treffer
- journal of vacuum science & technology b, nanotechnology and microelectronics: materials, processing, measurement, and phenomena 1 Treffer
- physica status solidi (a) 1 Treffer
- proceedings of the ieee 1 Treffer
- radecs 91 first european conference on radiation and its effects on devices and systems 1 Treffer
- radioelectronics and communications systems 1 Treffer
- superlattices and microstructures 1 Treffer
- transactions on electrical and electronic materials 1 Treffer
Sprache
130 Treffer
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In: IEEE Transactions on Circuits and Systems II: Express Briefs, Jg. 66 (2019-05-01), S. 728-732Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 7 (2019), S. 227-238Online unknownZugriff:
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In: Microelectronic Engineering, Jg. 200 (2018-11-01), S. 45-50Online unknownZugriff:
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In: Electronics Letters, Jg. 55 (2019-04-01), Heft 8, S. 446-448Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 18 (2018-03-01), S. 27-36Online unknownZugriff:
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In: physica status solidi (a), Jg. 211 (2013-12-13), S. 101-108Online unknownZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 48 (2013-03-01), S. 814-826Online unknownZugriff:
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In: International Journal of Electronics, Jg. 102 (2014-04-03), S. 347-361Online unknownZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 48 (2013-04-01), S. 917-923Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 57 (2010-11-01), S. 3106-3114Online unknownZugriff:
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In: IEEE Transactions on Circuits and Systems I: Regular Papers, Jg. 56 (2009-08-01), S. 1870-1883Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 58 (2011-06-01), S. 1347-1354Online unknownZugriff:
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In: Microelectronic Engineering, Jg. 84 (2007-09-01), S. 1845-1852Online unknownZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 19 (2011-04-01), S. 603-614Online unknownZugriff:
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In: Solid-State Electronics, Jg. 53 (2009-07-01), S. 717-722Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 53 (2006-09-01), S. 2108-2117Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 53 (2006-09-01), S. 2151-2159Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 53 (2006-08-01), S. 1815-1820Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 45 (2005-02-01), S. 201-210Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 51 (2004-10-01), S. 1621-1627Online unknownZugriff: