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- currents 16 Treffer
- electric currents 16 Treffer
- physical radiation effects 14 Treffer
- radiation effects 13 Treffer
- semiconductor devices 13 Treffer
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45 weitere Werte:
- hardening 12 Treffer
- radiation hardening 12 Treffer
- fabrication 10 Treffer
- mos transistors 9 Treffer
- silicon 9 Treffer
- transistors 440200* -- radiation effects on instrument components, instruments, or electronic systems 9 Treffer
- electronic circuits 8 Treffer
- microelectronic circuits 8 Treffer
- integrated circuits 7 Treffer
- transistors 7 Treffer
- 46 instrumentation related to nuclear science and technology integrated circuits 6 Treffer
- permittivity 6 Treffer
- silicon oxides 6 Treffer
- design 5 Treffer
- performance 5 Treffer
- silicon compounds 5 Treffer
- testing 5 Treffer
- failures 4 Treffer
- materials 4 Treffer
- mosfet 4 Treffer
- thin films 4 Treffer
- trapping 4 Treffer
- 46 instrumentation related to nuclear science and technology 3 Treffer
- chalcogenides 3 Treffer
- dielectric materials 3 Treffer
- electric potential 3 Treffer
- electrical properties 3 Treffer
- irradiation 3 Treffer
- junctions 3 Treffer
- oxides 3 Treffer
- oxygen compounds 3 Treffer
- radiation doses 3 Treffer
- readout systems 3 Treffer
- semiconductor materials 3 Treffer
- substrates 3 Treffer
- 36 materials science 2 Treffer
- 36 materials science ion implantation 2 Treffer
- 360605 -- materials-- radiation effects 2 Treffer
- 42 engineering integrated circuits 2 Treffer
- 426000 -- engineering-- components, electron devices & circuits-- (1990-) 2 Treffer
- 44 instrumentation physical radiation effects 2 Treffer
- 46 instrumentation related to nuclear science and technology mos transistors 2 Treffer
- 73 nuclear physics and radiation physics 2 Treffer
- annealing 2 Treffer
- boron 2 Treffer
Sprache
38 Treffer
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1976Online Konferenz
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2002Online academicJournal