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Weniger Treffer
Gefunden in
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Schlagwort
- circuits integres 4 Treffer
- conception. technologies. analyse fonctionnement. essais 4 Treffer
- correccion de proximidad optica 4 Treffer
- correction optique proximite 4 Treffer
- design. technologies. operation analysis. testing 4 Treffer
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45 weitere Werte:
- efecto proximidad 4 Treffer
- effet proximite 4 Treffer
- integrated circuits 4 Treffer
- optical proximity correction 4 Treffer
- proximity effect 4 Treffer
- circuit integre 3 Treffer
- circuito integrado 3 Treffer
- circuits integres par fonction (dont memoires et processeurs) 3 Treffer
- evaluacion prestacion 3 Treffer
- evaluation performance 3 Treffer
- integrated circuit 3 Treffer
- integrated circuits by function (including memories and processors) 3 Treffer
- memoire acces direct 3 Treffer
- memoria acceso directo 3 Treffer
- performance evaluation 3 Treffer
- random access memory 3 Treffer
- fotolitografia 2 Treffer
- measurement method 2 Treffer
- memoire acces direct statique 2 Treffer
- methode mesure 2 Treffer
- metodo medida 2 Treffer
- microscopia electronica barrido 2 Treffer
- microscopie electronique balayage 2 Treffer
- photolithographie 2 Treffer
- photolithography 2 Treffer
- radiacion ultravioleta extrema 2 Treffer
- rayonnement uv extreme 2 Treffer
- scanning electron microscopy 2 Treffer
- static random access memory 2 Treffer
- vacuum ultraviolet radiation 2 Treffer
- active layer 1 Treffer
- agujero interconexion 1 Treffer
- alumbrado 1 Treffer
- aparato ensayo 1 Treffer
- appareillage essai 1 Treffer
- article synthese 1 Treffer
- articulo sintesis 1 Treffer
- assemblage circuit integre 1 Treffer
- calidad imagen 1 Treffer
- capa activa 1 Treffer
- cell structure 1 Treffer
- chip on glass packaging 1 Treffer
- comparative study 1 Treffer
- couche active 1 Treffer
- defocalisation 1 Treffer
Publikation
- 0annual bacus symposium on photomask technology 3 Treffer
- 25th annual bacus symposium on photomask technology (4-7 october, 2006, monterey, california, usa) 3 Treffer
- proceedings of spie, the international society for optical engineering 3 Treffer
- optical microlithography xix (21-24 february 2006, san jose, california, usa) 2 Treffer
- photomask and next-generation lithography mask technology xiii (18-20 april, 2006, yokohama, japan) 1 Treffer
Sprache
6 Treffer
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Pushing the Lithography Limit : Applying Inverse Lithography Technology (ILT) at the 65nm GenerationIn: Optical microlithography XIX (21-24 February 2006, San Jose, California, USA), 2006KonferenzZugriff:
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In: Photomask and next-generation lithography mask technology XIII (18-20 April, 2006, Yokohama, Japan), 2006KonferenzZugriff:
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In: 25th annual BACUS symposium on photomask technology (4-7 October, 2006, Monterey, California, USA), 2005KonferenzZugriff:
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In: 25th annual BACUS symposium on photomask technology (4-7 October, 2006, Monterey, California, USA), 2005KonferenzZugriff:
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In: 25th annual BACUS symposium on photomask technology (4-7 October, 2006, Monterey, California, USA), 2005KonferenzZugriff:
-
In: Optical microlithography XIX (21-24 February 2006, San Jose, California, USA), 2006KonferenzZugriff: