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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- business 1.241 Treffer
- business.industry 1.241 Treffer
- optoelectronics 1.105 Treffer
- bipolar junction transistor 738 Treffer
- law 732 Treffer
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45 weitere Werte:
- law.invention 732 Treffer
- transistor 597 Treffer
- chemistry 519 Treffer
- electrical and electronic engineering 421 Treffer
- electrical engineering 413 Treffer
- common emitter 361 Treffer
- chemistry.chemical_element 295 Treffer
- chemistry.chemical_compound 282 Treffer
- electronic, optical and magnetic materials 272 Treffer
- condensed matter physics 245 Treffer
- heterojunction bipolar transistor 238 Treffer
- heterojunction 232 Treffer
- silicon 210 Treffer
- voltage 193 Treffer
- doping 190 Treffer
- heterostructure-emitter bipolar transistor 163 Treffer
- electronic engineering 149 Treffer
- hardware_integratedcircuits 146 Treffer
- 01 natural sciences 137 Treffer
- hardware_performanceandreliability 133 Treffer
- 02 engineering and technology 118 Treffer
- materials chemistry 113 Treffer
- 0103 physical sciences 110 Treffer
- analytical chemistry 110 Treffer
- cmos 110 Treffer
- irradiation 101 Treffer
- epitaxy 95 Treffer
- 010302 applied physics 93 Treffer
- general physics and astronomy 92 Treffer
- nuclear and high energy physics 92 Treffer
- breakdown voltage 90 Treffer
- gallium arsenide 90 Treffer
- diode 87 Treffer
- general engineering 86 Treffer
- integrated circuit 79 Treffer
- current (fluid) 75 Treffer
- silicon on insulator 73 Treffer
- nuclear energy and engineering 71 Treffer
- wafer 71 Treffer
- hardware_logicdesign 70 Treffer
- 0210 nano-technology 69 Treffer
- 021001 nanoscience & nanotechnology 69 Treffer
- bicmos 67 Treffer
- atomic and molecular physics, and optics 66 Treffer
- electronic circuit 66 Treffer
Verlag
- ieee 414 Treffer
- elsevier bv 176 Treffer
- institute of electrical and electronics engineers (ieee) 175 Treffer
- aip publishing 71 Treffer
- ire 64 Treffer
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45 weitere Werte:
- iop publishing 62 Treffer
- institution of engineering and technology (iet) 58 Treffer
- springer science and business media llc 51 Treffer
- spie 30 Treffer
- wiley 23 Treffer
- american vacuum society 22 Treffer
- informa uk limited 20 Treffer
- trans tech publications, ltd. 16 Treffer
- the electrochemical society 15 Treffer
- elsevier 12 Treffer
- hal ccsd 11 Treffer
- springer berlin heidelberg 11 Treffer
- the japan society of applied physics 10 Treffer
- aip 7 Treffer
- american chemical society (acs) 6 Treffer
- pleiades publishing ltd 5 Treffer
- defense technical information center 4 Treffer
- ibm 4 Treffer
- springer international publishing 4 Treffer
- springer new york 4 Treffer
- springer us 4 Treffer
- acta physica sinica, chinese physical society and institute of physics, chinese academy of sciences 3 Treffer
- author(s) 3 Treffer
- edp sciences 3 Treffer
- hindawi limited 3 Treffer
- imaps - international microelectronics assembly and packaging society 3 Treffer
- inst. electr. eng. japan 3 Treffer
- institute of electronics, information and communications engineers (ieice) 3 Treffer
- oxford university press (oup) 3 Treffer
- royal society of chemistry (rsc) 3 Treffer
- springer netherlands 3 Treffer
- springer vienna 3 Treffer
- the institute of electronics engineers of korea 3 Treffer
- american scientific publishers 2 Treffer
- asm international 2 Treffer
- elsevier science 2 Treffer
- hartung-gorre verlag 2 Treffer
- hindawi publishing corporation 2 Treffer
- institute of electrical and electronics engineers 2 Treffer
- institute of image information and television engineers 2 Treffer
- kth, integrerade komponenter och kretsar 2 Treffer
- multidisciplinary digital publishing institute 2 Treffer
- national library of serbia 2 Treffer
- paris regies 1 Treffer
- taylor & francis 1 Treffer
Publikation
- solid-state electronics 64 Treffer
- ieee transactions on nuclear science 60 Treffer
- ieee transactions on electron devices 55 Treffer
- electronics letters 50 Treffer
- applied physics letters 40 Treffer
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45 weitere Werte:
- japanese journal of applied physics 29 Treffer
- journal of applied physics 28 Treffer
- microelectronics reliability 28 Treffer
- spie proceedings 24 Treffer
- mrs proceedings 23 Treffer
- ieee electron device letters 22 Treffer
- journal of vacuum science & technology b: microelectronics and nanometer structures 18 Treffer
- nuclear instruments and methods in physics research section b: beam interactions with materials and atoms 16 Treffer
- aip conference proceedings 12 Treffer
- materials science forum 12 Treffer
- microelectronic engineering 9 Treffer
- chinese physics b 8 Treffer
- ire transactions on electron devices 8 Treffer
- journal of semiconductors 8 Treffer
- microelectronics journal 8 Treffer
- ecs transactions 7 Treffer
- ieee transactions on device and materials reliability 7 Treffer
- international journal of electronics 7 Treffer
- journal of the electrochemical society 7 Treffer
- international technical digest on electron devices meeting 6 Treffer
- radiation effects and defects in solids 6 Treffer
- semiconductor science and technology 6 Treffer
- 1972 international electron devices meeting 5 Treffer
- 1984 international electron devices meeting 5 Treffer
- 1986 international electron devices meeting 5 Treffer
- journal of crystal growth 5 Treffer
- proceedings of the 1992 bipolar/bicmos circuits and technology meeting 5 Treffer
- proceedings of the 1997 bipolar/bicmos circuits and technology meeting 5 Treffer
- russian microelectronics 5 Treffer
- 1 4 Treffer
- 1963 international electron devices meeting 4 Treffer
- 1965 international electron devices meeting 4 Treffer
- 1966 international electron devices meeting 4 Treffer
- 1977 international electron devices meeting 4 Treffer
- 2008 ieee bipolar/bicmos circuits and technology meeting 4 Treffer
- 2010 ieee bipolar/bicmos circuits and technology meeting (bctm) 4 Treffer
- journal of electronic materials 3 Treffer
- 2006 u.s. workshop on the physics and chemistry of ii-vi materials 1 Treffer
- chemical physics letters 1 Treffer
- fullerenes, nanotubes, and carbon nanostructures (print) 1 Treffer
- materials science & engineering. r, reports 1 Treffer
- multilevel interconnect technology iii (santa clara ca, 22-23 september 1999) 1 Treffer
- npn medecine 1 Treffer
- progress in crystal growth and characterization of materials 1 Treffer
- spie proceedings series 1 Treffer
Sprache
1.431 Treffer
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In: Fullerenes, nanotubes, and carbon nanostructures (Print), Jg. 21 (2013), Heft 1-5, S. 213-232academicJournalZugriff:
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In: IEEE Access, Jg. 9 (2021), S. 16958-16966Online unknownZugriff:
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In: JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, Jg. 21 (2021-04-30), S. 101-108Online unknownZugriff:
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In: International Symposium for Testing and Failure Analysis, 2021-10-31Online unknownZugriff:
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In: IEEE Transactions on Industrial Electronics, Jg. 67 (2020-06-01), S. 4556-4566Online unknownZugriff:
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In: 2021 43rd Annual EOS/ESD Symposium (EOS/ESD), 2021-09-26Online unknownZugriff:
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In: 2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA), 2021-08-01Online unknownZugriff:
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In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 467 (2020-03-01), S. 114-117Online unknownZugriff:
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In: Radiation Effects and Defects in Solids, Jg. 174 (2019-09-20), S. 859-872Online unknownSiehe Detailanzeige für VolltextZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-07-01), S. 1566-1573Online unknownZugriff:
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In: 2021 43rd Annual EOS/ESD Symposium (EOS/ESD), 2021-09-26Online unknownZugriff:
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In: 2020 International EOS/ESD Symposium on Design and System (IEDS), 2021-06-23Online unknownZugriff:
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In: 2020 International EOS/ESD Symposium on Design and System (IEDS), 2021-06-23Online unknownZugriff:
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In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 444 (2019-04-01), S. 50-53Online unknownZugriff:
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In: Radiation Effects and Defects in Solids, Jg. 173 (2018-07-22), S. 683-693Online unknownZugriff:
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In: Superlattices and Microstructures, Jg. 122 (2018-10-01), S. 194-202Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 82 (2018-03-01), S. 130-135Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 65 (2018), S. 539-544Online unknownZugriff: