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Weniger Treffer
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Art der Quelle
Schlagwort
- complementary metal oxide semiconductors 57 Treffer
- mosfet 36 Treffer
- logic gates 29 Treffer
- cmos integrated circuits 17 Treffer
- field-effect transistors 17 Treffer
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45 weitere Werte:
- transistors 17 Treffer
- finfet 14 Treffer
- silicon 14 Treffer
- logic circuits 11 Treffer
- threshold voltage 11 Treffer
- integrated circuits 10 Treffer
- electric potential 8 Treffer
- mosfets 8 Treffer
- cmos technology 7 Treffer
- variability 7 Treffer
- finfets 6 Treffer
- locking range 6 Treffer
- silicon-on-insulator technology 6 Treffer
- voltage-controlled oscillators 6 Treffer
- capacitance 5 Treffer
- capacitors 5 Treffer
- computer simulation 5 Treffer
- electric inverters 5 Treffer
- frequency dividers 5 Treffer
- gate array circuits 5 Treffer
- germanium 5 Treffer
- nanowires 5 Treffer
- noise 5 Treffer
- performance evaluation 5 Treffer
- semiconductor device modeling 5 Treffer
- stray currents 5 Treffer
- tunneling 5 Treffer
- characterization 4 Treffer
- current measurement 4 Treffer
- doping 4 Treffer
- electric capacity 4 Treffer
- inverter 4 Treffer
- inverters 4 Treffer
- leakage currents 4 Treffer
- low frequency noise 4 Treffer
- low voltage systems 4 Treffer
- low-frequency noise 4 Treffer
- mathematical optimization 4 Treffer
- metal oxide semiconductors 4 Treffer
- phase noise 4 Treffer
- radio frequency 4 Treffer
- resistance 4 Treffer
- resistors 4 Treffer
- signal processing 4 Treffer
- voltage measurement 4 Treffer
Verlag
Publikation
- solid-state electronics 24 Treffer
- ieee transactions on electron devices 20 Treffer
- analog integrated circuits & signal processing 11 Treffer
- ieee electron device letters 10 Treffer
- ieee transactions on circuits & systems. part i: regular papers 5 Treffer
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26 weitere Werte:
- ieee journal of solid-state circuits 4 Treffer
- materials science in semiconductor processing 4 Treffer
- ieee transactions on nuclear science 3 Treffer
- ieee transactions on very large scale integration (vlsi) systems 3 Treffer
- journal of circuits, systems & computers 3 Treffer
- journal of nano- & electronic physics 3 Treffer
- thin solid films 3 Treffer
- aeu: international journal of electronics & communications 2 Treffer
- fluctuation & noise letters 2 Treffer
- journal of low power electronics & applications 2 Treffer
- applied sciences (2076-3417) 1 Treffer
- crystals (2073-4352) 1 Treffer
- etri journal 1 Treffer
- ieee transactions on circuits & systems. part ii: express briefs 1 Treffer
- ieee transactions on microwave theory & techniques 1 Treffer
- ieee transactions on semiconductor manufacturing 1 Treffer
- iete journal of research 1 Treffer
- i-manager's journal on circuits & systems 1 Treffer
- integration: the vlsi journal 1 Treffer
- international journal of circuit theory & applications 1 Treffer
- international journal of electronics 1 Treffer
- international journal of numerical modelling 1 Treffer
- international journal of performability engineering 1 Treffer
- microelectronics reliability 1 Treffer
- microprocessors & microsystems 1 Treffer
- nanoscale research letters 1 Treffer
Sprache
115 Treffer
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In: Journal of Nano- & Electronic Physics, Jg. 14 (2022-09-01), Heft 5, S. 1-6Online academicJournalZugriff:
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In: Journal of Low Power Electronics & Applications, Jg. 11 (2021-12-01), Heft 4, S. 37-37Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 67 (2020), Heft 1, S. 224-229Online academicJournalZugriff:
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In: Analog Integrated Circuits & Signal Processing, Jg. 103 (2020-05-01), Heft 2, S. 237-246Online academicJournalZugriff:
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In: Applied Sciences (2076-3417), Jg. 7 (2017-10-01), Heft 10, S. 1047-1078Online academicJournalZugriff:
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In: Journal of Nano- & Electronic Physics, Jg. 16 (2024-03-01), Heft 2, S. 1-5Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-05-01), Heft 5, S. 2167-2172Online academicJournalZugriff:
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In: Journal of Nano- & Electronic Physics, Jg. 5 (2013-09-01), Heft 3, S. 3057-1- (6S.)Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 67 (2020-09-01), Heft 9, S. 3504-3509Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 22 (2014-11-01), Heft 11, S. 2440-2445Online academicJournalZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 54 (2019-10-01), Heft 10, S. 2765-2776Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 39 (2018-07-01), Heft 7, S. 935-938Online academicJournalZugriff:
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In: Materials Science in Semiconductor Processing, Jg. 66 (2017-08-01), S. 87-91academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 63 (2016-08-01), Heft 8, S. 3049-3057Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 63 (2016-08-01), Heft 8, S. 3028-3035Online academicJournalZugriff:
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In: IEEE Transactions on Circuits & Systems. Part I: Regular Papers, Jg. 62 (2015-05-01), Heft 5, S. 1345-1352Online serialPeriodicalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 61 (2014-09-01), Heft 9, S. 3066-3074Online academicJournalZugriff:
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In: Analog Integrated Circuits & Signal Processing, Jg. 90 (2017-03-01), Heft 3, S. 573-589Online academicJournalZugriff:
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Design methodology for MOSFET-based voltage reference circuits implemented in 28 nm CMOS technology.In: AEU: International Journal of Electronics & Communications, Jg. 70 (2016-05-01), Heft 5, S. 568-577Online academicJournal
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In: Solid-State Electronics, Jg. 112 (2015-10-01), S. 56-67academicJournalZugriff: