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45 weitere Werte:
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- electric circuits 17 Treffer
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- random access memory 17 Treffer
- simulation methods & models 17 Treffer
- electric currents 16 Treffer
- electronics 16 Treffer
- microprocessors 16 Treffer
- stray currents 16 Treffer
- semiconductors 15 Treffer
- computer architecture 14 Treffer
- computer simulation 14 Treffer
- complementary metal oxide semiconductor design & construction 13 Treffer
- computer storage devices 13 Treffer
- digital integrated circuits 13 Treffer
- power resources 13 Treffer
- cmos integrated circuits 12 Treffer
- delay lines 12 Treffer
- electronic equipment design 11 Treffer
- logic circuits -- design & construction 11 Treffer
- switching circuits 11 Treffer
- low voltage systems 10 Treffer
- clocks & watches 9 Treffer
- complementary metal oxide semiconductor noise 9 Treffer
- electric power 9 Treffer
- electronic amplifiers 9 Treffer
- electronic data processing 9 Treffer
- low voltage integrated circuit design & construction 9 Treffer
- signal processing 9 Treffer
- silicon-on-insulator technology 9 Treffer
- switching theory 9 Treffer
- design & construction of very large scale circuit integration 8 Treffer
- digital signal processing 8 Treffer
- electric inverters 8 Treffer
- electronic systems 8 Treffer
- energy dissipation 8 Treffer
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292 Treffer
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 15 (2007-02-01), Heft 2, S. 227-231Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 11 (2003-10-01), Heft 5, S. 835-838Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 17 (2009-02-01), Heft 2, S. 172-180Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 13 (2005-09-01), Heft 9, S. 1103-1107Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 15 (2007-07-01), Heft 7, S. 758-766Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 14 (2006-05-01), Heft 5, S. 549-552Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 15 (2007-09-01), Heft 9, S. 1017-1027Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 19 (2011-12-01), Heft 12, S. 2141-2148Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 19 (2011-07-01), Heft 7, S. 1315-1319Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 19 (2011-07-01), Heft 7, S. 1305-1309Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 19 (2011-06-01), Heft 6, S. 1118-1122Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 19 (2011-05-01), Heft 5, S. 900-904Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 19 (2011-04-01), Heft 4, S. 538-547Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 19 (2011), Heft 1, S. 118-129Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 18 (2010-10-01), Heft 10, S. 1385-1398Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 18 (2010-04-01), Heft 4, S. 638-651Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 18 (2010-03-01), Heft 3, S. 490-500Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 18 (2010-03-01), Heft 3, S. 505-509Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 17 (2009-04-01), Heft 4, S. 571-577Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 16 (2008-03-01), Heft 3, S. 318-321Online academicJournalZugriff: