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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- telecommunications 72 Treffer
- fabrication microelectronique (technologie des materiaux et des surfaces) 62 Treffer
- microelectronic fabrication (materials and surfaces technology) 62 Treffer
- circuits integres 45 Treffer
- conception. technologies. analyse fonctionnement. essais 45 Treffer
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45 weitere Werte:
- design. technologies. operation analysis. testing 45 Treffer
- integrated circuits 45 Treffer
- pastilla electronica 25 Treffer
- pastille electronique 25 Treffer
- wafer 25 Treffer
- circuit properties 24 Treffer
- circuits electriques, optiques et optoelectroniques 24 Treffer
- electric, optical and optoelectronic circuits 24 Treffer
- proprietes des circuits 24 Treffer
- metrologie et instrumentation 23 Treffer
- metrology and instrumentation 23 Treffer
- dispositifs micro- et nanoelectromecaniques (mems/nems) 19 Treffer
- evaluacion prestacion 19 Treffer
- evaluation performance 19 Treffer
- micro- and nanoelectromechanical devices (mems/nems) 19 Treffer
- performance evaluation 19 Treffer
- dispositif microelectromecanique 18 Treffer
- dispositivo microelectromecanico 18 Treffer
- microelectromechanical device 18 Treffer
- fotolitografia 17 Treffer
- general 17 Treffer
- generalites 17 Treffer
- lithographie 17 Treffer
- lithography 17 Treffer
- litografia 17 Treffer
- micromachining 17 Treffer
- microusinage 17 Treffer
- photolithographie 17 Treffer
- photolithography 17 Treffer
- silicon on insulator technology 16 Treffer
- technologie silicium sur isolant 16 Treffer
- tecnologia silicio sobre aislante 16 Treffer
- circuit integre 15 Treffer
- circuito integrado 15 Treffer
- circuits optiques et optoelectroniques 15 Treffer
- instruments, apparatus, components and techniques common to several branches of physics and astronomy 15 Treffer
- instruments, appareillage, composants et techniques communs a plusieurs branches de la physique et de l'astronomie 15 Treffer
- integrated circuit 15 Treffer
- micromaquinado 15 Treffer
- optical and optoelectronic circuits 15 Treffer
- integrated optics. optical fibers and wave guides 13 Treffer
- manufacturing process 13 Treffer
- optique integree. fibres et guides d'onde optiques 13 Treffer
- procede fabrication 13 Treffer
- procedimiento fabricacion 13 Treffer
Verlag
Publikation
- spie proceedings series 65 Treffer
- proceedings of spie, the international society for optical engineering 14 Treffer
- micromachined devices and components iv (santa clara ca, 21-22 september 1998) 5 Treffer
- japanese journal of applied physics 4 Treffer
- metrology, inspection, and process control for microlithography xix (san jose ca, 7-10 march 2005) 4 Treffer
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45 weitere Werte:
- design, test, integration, and packaging of mems/moems 2002 (cannes, 6-8 may 2002) 3 Treffer
- metrology, inspection, and process control for microlithography xvi (santa clara ca, 4-7 march 2002) 3 Treffer
- silicon photonics (25-26 january 2006, san jose, california, usa) 3 Treffer
- advances in resist technology and processing xv (santa clara ca, 23-25 february 1998) 2 Treffer
- advances in resist technology and processing xxii (san jose ca, 28 february - 2 march 2005) 2 Treffer
- analytical and diagnostic techniques for semiconductor materials, devices, and processes (leuven, 13-15 september 1999) 2 Treffer
- design and process integration for microelectronic manufacturing ii (santa clara ca, 26-28 february 2003) 2 Treffer
- device and process technologies for mems, microelectronics, and photonics iii (perth, 10-12 december 2003) 2 Treffer
- journal of lightwave technology 2 Treffer
- mems /moems components and their applications (san jose ca, 26-27 january 2004) 2 Treffer
- mems components and applications for industry, automobiles, aerospace and communication ii (san jose ca, 28-29 january 2003) 2 Treffer
- mems, moems, and micromachining (strasbourg, 29-30 april 2004) 2 Treffer
- microelectronic device technology ii (santa clara ca, 23-24 september 1998) 2 Treffer
- microelectronics (baltimore md, 9-11 october 2001) 2 Treffer
- optoelectronic integrated circuits viii (23-25 january 2006, san jose, california, usa) 2 Treffer
- sensors and camera systems for scientific, industrial, and digital photography applications v (san jose ca, 19-21 january 2004) 2 Treffer
- 0icmne-2005 1 Treffer
- 0smart electronics, mems, biomems, and nanotechnology 1 Treffer
- advanced microlithography technologies (beijing, 8-10 november 2004) 1 Treffer
- advances in microelectronic device technology (nanjing, 7-9 november 2001) 1 Treffer
- applications of photonic technology (closing the gap between theory, development, and application : ottawa on, 2004. 7a, optical components and devices) 1 Treffer
- comptes rendus. physique 1 Treffer
- detectors and associated signal processing (saint etienne, 1-2 october 2003) 1 Treffer
- device and process technologies for mems microelectronics ii (adelaide, 17-19 december 2001) 1 Treffer
- electronics letters 1 Treffer
- emerging lithographic technologies v (santa clara, 27 february - 1 march 2001) 1 Treffer
- emerging optoelectronic applications (san jose ca, 26-27 january 2004) 1 Treffer
- enabling photonics technologies for defense, security, and aerospace applications (31 march-1 april 2005, orlando, florida, usa) 1 Treffer
- enabling photonics technologies for defense, security, and aerospace applications ii (20-21 april 2006, kissimmee, florida, usa) 1 Treffer
- environmental monitoring and remediation technologies ii (boston ma, 20-22 september 1999) 1 Treffer
- high-density interconnect and systems packaging (denver co, 25-28 april 2000) 1 Treffer
- ieee electron device letters 1 Treffer
- ieee transactions on nanotechnology 1 Treffer
- in-line characterization techniques for performance and yield enhancement in microelectronic manufacturing ii (santa clara ca, 23-24 september 1998) 1 Treffer
- in-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing ii (edinburgh, 31 may - 1 june 2001) 1 Treffer
- mems / moems components and their applications ii (san jose ca, 24-25 january 2005) 1 Treffer
- mems/moems components and their applications iv (22-23 january 2007, san jose, california, usa) 1 Treffer
- metrology, inspection, and process control for microlithography xv (santa clara ca, 26 february - 1 march 2001 ) 1 Treffer
- metrology, inspection, and process control for microlithography xx (20-23 february 2006, san jose, california, usa) 1 Treffer
- micro- and nanoelectronics 2005 (3-7 october 2005, zvenigorod, russia) 1 Treffer
- micro- and nano-optics for optical interconnection and information processing (san diego ca, 29-31 july 2001) 1 Treffer
- microelectronic engineering 1 Treffer
- microelectronics (design, technology, and packaging ii) 1 Treffer
- micromachining and microfabrication process technology vii (san francisco ca, 22-24 october 2001) 1 Treffer
- micromachining and microfabrication process technology x (san jose ca, 25-27 january 2005) 1 Treffer
Sprache
92 Treffer
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Post-CMOS chip-level processing for high-aspect-ratio microprobe fabrication utilizing pulse platingIn: Smart electronics, MEMS, bioMEMS, and nanotechnology (San Diego CA, 7-10 March 2005), 2005, S. 1-10KonferenzZugriff:
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In: Smart electronics, MEMS, bioMEMS, and nanotechnology (San Diego CA, 15-18 March 2004), 2004, S. 20-25KonferenzZugriff:
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In: Sensors and camera systems for scientific, industrial, 2004, S. 175-185KonferenzZugriff:
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In: Smart electronics, MEMS, bioMEMS, and nanotechnology (San Diego CA, 3-5 March 2003), 2003, S. 78-86KonferenzZugriff:
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In: Sensors and camera systems for scientific, industrial, 2004, S. 393-401KonferenzZugriff:
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In: MEMS / MOEMS components and their applications II (San Jose CA, 24-25 January 2005), 2005, S. 89-98KonferenzZugriff:
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In: Semiconductor photodetectors II (San Jose CA, 25-26 January 2005), 2005, S. 132-139KonferenzZugriff:
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In: MEMS, MOEMS, and micromachining (Strasbourg, 29-30 April 2004), 2004, S. 274-283KonferenzZugriff:
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In: Silicon photonics (25-26 January 2006, San Jose, California, USA), 2006, S. 61250H.1KonferenzZugriff:
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In: Poly-silicon thin film transistor technology and pplications in displays and other novel technology areas (Santa Clara CA, 21-22 January 2003), 2003, S. 179-186KonferenzZugriff:
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In: Microelectronics (Baltimore MD, 9-11 October 2001), 2001, S. 1-6KonferenzZugriff:
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In: Device and process technologies for MEMS, microelectronics, 2004, S. 131-142KonferenzZugriff:
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In: MEMS, MOEMS, and micromachining (Strasbourg, 29-30 April 2004), 2004, S. 116-127KonferenzZugriff:
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In: Optoelectronic materials and devices for optical communications (7-10 November 2005, Shanghai, China), 2005, S. 602032.1KonferenzZugriff:
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In: Design and process integration for microelectronic manufacturing II (Santa Clara CA, 26-28 February 2003), 2003, S. 346-352KonferenzZugriff:
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In: Micromachined devices and components IV (Santa Clara CA, 21-22 September 1998), 1998, S. 124-133KonferenzZugriff:
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In: Micromachined devices and components IV (Santa Clara CA, 21-22 September 1998), 1998, S. 393-402KonferenzZugriff:
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In: Micromachined devices and components IV (Santa Clara CA, 21-22 September 1998), 1998, S. 238-250KonferenzZugriff:
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In: Solid state devices and materials, Jg. 36 (1997), Heft 3B, S. 1513-1518KonferenzZugriff:
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In: Metrology, inspection, and process control for microlithography XV (Santa Clara CA, 26 February - 1 March 2001 ), 2001, S. 644-652KonferenzZugriff: