Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- circuit integre 5 Treffer
- circuito integrado 5 Treffer
- circuits integres 5 Treffer
- conception. technologies. analyse fonctionnement. essais 5 Treffer
- damaging 5 Treffer
-
45 weitere Werte:
- design. technologies. operation analysis. testing 5 Treffer
- deterioracion 5 Treffer
- endommagement 5 Treffer
- integrated circuit 5 Treffer
- integrated circuits 5 Treffer
- interconexion 5 Treffer
- interconnection 5 Treffer
- interconnexion 5 Treffer
- durabilidad 4 Treffer
- durabilite 4 Treffer
- durability 4 Treffer
- chemical mechanical polishing 3 Treffer
- damascene process 3 Treffer
- damasquinado 3 Treffer
- damasquinage 3 Treffer
- dielectrico baja constante dielectrica 3 Treffer
- dielectrique basse permittivite 3 Treffer
- electrodiffusion 3 Treffer
- electrodifusion 3 Treffer
- essais, mesure, bruit et fiabilite 3 Treffer
- evaluacion prestacion 3 Treffer
- evaluation performance 3 Treffer
- low k dielectric 3 Treffer
- material poroso 3 Treffer
- materiau poreux 3 Treffer
- performance evaluation 3 Treffer
- polissage mecanochimique 3 Treffer
- porous material 3 Treffer
- testing, measurement, noise and reliability 3 Treffer
- catalytic reaction 2 Treffer
- corriente escape 2 Treffer
- courant fuite 2 Treffer
- densidad elevada 2 Treffer
- densite elevee 2 Treffer
- dependance du temps 2 Treffer
- dependencia del tiempo 2 Treffer
- disrupcion electrica 2 Treffer
- disruption electrique 2 Treffer
- electric breakdown 2 Treffer
- failure rate 2 Treffer
- high density 2 Treffer
- high electron mobility transistor 2 Treffer
- leakage current 2 Treffer
- mascara 2 Treffer
- mask 2 Treffer
Publikation
- ieee 2004 international interconnect technology conference (proccedings) 2 Treffer
- 2002 ieee international reliability physics symposium proceedings (dallas tx, 7-11 april 2002) 1 Treffer
- 2002 symposium on vlsi technology (honolulu hi, 11-13 june 2002, digest of technical papers) 1 Treffer
- 2004 symposium on vlsi technology (digest of technical papers) 1 Treffer
- ieee international electron devices meeting 2004 (iedm technical digest) 1 Treffer
- 3 weitere Werte:
9 Treffer
-
In: Technical digest 2004, 2004, S. 197-200KonferenzZugriff:
-
In: IEEE 2004 international interconnect technology conference (Proccedings), 2004, S. 30-32KonferenzZugriff:
-
In: IVNC 2004 (technical digest of the 17th International Vacuum Nanoelectronics Conference), 2004, S. 60-61KonferenzZugriff:
-
In: 2002 symposium on VLSI technology (Honolulu HI, 11-13 June 2002, digest of technical papers), 2002, S. 78-79KonferenzZugriff:
-
In: 2004 Symposium on VLSI Technology (digest of technical papers), , S. 66-67KonferenzZugriff:
-
In: 2002 IEEE international reliability physics symposium proceedings (Dallas TX, 7-11 April 2002), 2002, S. 235-240KonferenzZugriff:
-
In: Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits (IPFA 2004), 2004, S. 69-70KonferenzZugriff:
-
In: IEEE International Electron Devices Meeting 2004 (IEDM technical digest), 2004, S. 325-328KonferenzZugriff:
-
In: IEEE 2004 international interconnect technology conference (Proccedings), 2004, S. 36-38KonferenzZugriff: