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In: Microelectronics Reliability, Jg. 52 (2012-09-01), Heft 9/10, S. 1998-2004academicJournalZugriff:
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In: Microelectronics Reliability, Jg. 76 (2017-09-01), S. 145-148academicJournalZugriff:
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Next generation of Deep Trench Isolation for Smart Power technologies with 120V high-voltage devicesIn: Microelectronics Reliability, Jg. 50 (2010-09-01), Heft 9-11, S. 1758-1762academicJournalZugriff:
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In: Microelectronics Reliability, 2017-09-01, S. 145-148Online unknownZugriff: