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Schlagwort
- complementary metal oxide semiconductors 76 Treffer
- transistors 16 Treffer
- voltage-controlled oscillators 15 Treffer
- cmos 12 Treffer
- simulation methods & models 12 Treffer
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45 weitere Werte:
- metal oxide semiconductor field-effect transistors 11 Treffer
- threshold voltage 11 Treffer
- electric circuits 9 Treffer
- monte carlo 9 Treffer
- integrated circuits 8 Treffer
- detectors 7 Treffer
- electric potential 7 Treffer
- low-power 7 Treffer
- power resources 7 Treffer
- analog circuits 6 Treffer
- comparator circuits 6 Treffer
- current conveyors 6 Treffer
- electronic amplifiers 6 Treffer
- electronic circuits 6 Treffer
- low power 6 Treffer
- phase noise 6 Treffer
- reliability in engineering 6 Treffer
- silicon 6 Treffer
- calibration 5 Treffer
- drift-diffusion 5 Treffer
- energy consumption 5 Treffer
- logic circuits 5 Treffer
- low noise amplifiers 5 Treffer
- low voltage integrated circuits 5 Treffer
- low voltage systems 5 Treffer
- passive components 5 Treffer
- reliability 5 Treffer
- very large scale circuit integration 5 Treffer
- active inductor 4 Treffer
- adc 4 Treffer
- analog signal processing 4 Treffer
- analog-to-digital converters 4 Treffer
- cmos image sensors 4 Treffer
- current-mode 4 Treffer
- electric power 4 Treffer
- electrostatic discharges 4 Treffer
- exponential functions 4 Treffer
- field-effect transistors 4 Treffer
- low voltage 4 Treffer
- nanostructured materials 4 Treffer
- operational amplifiers 4 Treffer
- pixels 4 Treffer
- power consumption 4 Treffer
- quality factor 4 Treffer
- scanning electron microscopy 4 Treffer
Publikation
- integration: the vlsi journal 30 Treffer
- microelectronics reliability 30 Treffer
- aeu: international journal of electronics & communications 28 Treffer
- microelectronics journal 24 Treffer
- nuclear instruments & methods in physics research section a 12 Treffer
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22 weitere Werte:
- solid-state electronics 10 Treffer
- computers & electrical engineering 4 Treffer
- energy 3 Treffer
- ain shams engineering journal 2 Treffer
- materials science & engineering: b 2 Treffer
- microelectronic engineering 2 Treffer
- microprocessors & microsystems 2 Treffer
- neural networks 2 Treffer
- ultramicroscopy 2 Treffer
- advances in space research 1 Treffer
- alexandria engineering journal 1 Treffer
- applied radiation & isotopes 1 Treffer
- applied surface science 1 Treffer
- journal of computational science 1 Treffer
- journal of king saud university - engineering sciences 1 Treffer
- measurement (02632241) 1 Treffer
- microelectronics and reliability 1 Treffer
- nuclear instruments and methods in physics research, a 1 Treffer
- nuclear physics b proceedings supplement 1 Treffer
- precision engineering 1 Treffer
- procedia computer science 1 Treffer
- radiation measurements 1 Treffer
Sprache
166 Treffer
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In: Precision Engineering, Jg. 85 (2024), S. 191-196academicJournalZugriff:
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In: Procedia Computer Science, Jg. 218 (2023-02-01), S. 563-573Online academicJournalZugriff:
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In: Ain Shams Engineering Journal, Jg. 15 (2024), Heft 1, S. N.PAGOnline academicJournalZugriff:
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In: Alexandria Engineering Journal, Jg. 59 (2020-10-01), Heft 5, S. 3715-3729Online academicJournalZugriff:
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In: Solid-State Electronics, Jg. 125 (2016-11-01), S. 227-233academicJournalZugriff:
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In: Nuclear Instruments & Methods in Physics Research Section A, Jg. 929 (2019-06-11), S. 121-128academicJournalZugriff:
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In: Integration: The VLSI Journal, Jg. 93 (2023-11-01), S. N.PAGacademicJournalZugriff:
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In: Integration: The VLSI Journal, Jg. 69 (2019-11-01), S. 180-188academicJournalZugriff:
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Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detectorIn: Ultramicroscopy, Jg. 109 (2009-08-01), Heft 9, S. 1144-1147academicJournalZugriff:
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In: Nuclear Instruments and Methods in Physics Research, A, Jg. 566 (2006-10-15), Heft 2, S. 552-562academicJournalZugriff:
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In: Microelectronics Journal, Jg. 80 (2018-10-01), S. 18-27academicJournalZugriff:
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In: Computers & Electrical Engineering, Jg. 68 (2018-05-01), S. 629-645academicJournalZugriff:
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In: Microelectronics and Reliability, Jg. 49 (2009-09-01), Heft 9-11, S. 977-981serialPeriodicalZugriff:
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In: Microelectronics Journal, Jg. 44 (2013-10-01), Heft 10, S. 904-911academicJournalZugriff:
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In: Microelectronics Reliability, Jg. 55 (2015-12-02), Heft 12, S. 2754-2761academicJournalZugriff:
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In: Microelectronics Journal, Jg. 45 (2014-11-01), Heft 11, S. 1556-1565academicJournalZugriff:
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In: Nuclear Instruments & Methods in Physics Research Section A, Jg. 624 (2010-12-11), Heft 2, S. 379-386academicJournalZugriff:
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In: Microelectronics Journal, Jg. 42 (2011-09-01), Heft 9, S. 1057-1065academicJournalZugriff:
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In: Microelectronics Journal, Jg. 40 (2009-09-01), Heft 9, S. 1281-1292academicJournalZugriff:
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In: AEU: International Journal of Electronics & Communications, Jg. 132 (2021-04-01), S. N.PAGOnline academicJournal