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- complementary metal oxide semiconductors 30 Treffer
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45 weitere Werte:
- cmos technology 11 Treffer
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- temperature measurement 6 Treffer
- voltage measurement 6 Treffer
- deep submicron 5 Treffer
- front-end electronics 5 Treffer
- integrated circuit modeling 4 Treffer
- mosfets 4 Treffer
- single event effects 4 Treffer
- temperature sensors 4 Treffer
- threshold voltage 4 Treffer
- 1/f noise 3 Treffer
- annealing 3 Treffer
- compact model 3 Treffer
- detectors 3 Treffer
- digital electronics 3 Treffer
- dosimeters 3 Treffer
- dosimetry 3 Treffer
- electric potential 3 Treffer
- electronic noise 3 Treffer
- gamma rays 3 Treffer
- heavy ions 3 Treffer
- ions 3 Treffer
- layout 3 Treffer
- leakage currents 3 Treffer
- metal oxide semiconductors 3 Treffer
- noise. 3 Treffer
- protons 3 Treffer
- semiconductor device modeling 3 Treffer
- silicon-on-insulator 3 Treffer
- silicon-on-insulator technology 3 Treffer
- standards 3 Treffer
- stray currents 3 Treffer
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46 Treffer
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In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-05-01), Heft 5, S. 573-580Online academicJournalZugriff:
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