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Weniger Treffer
Gefunden in
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Schlagwort
- circuits integres 90 Treffer
- integrated circuits 90 Treffer
- complementary mos technology 89 Treffer
- technologie mos complementaire 89 Treffer
- tecnologia mos complementario 89 Treffer
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45 weitere Werte:
- conception. technologies. analyse fonctionnement. essais 87 Treffer
- design. technologies. operation analysis. testing 87 Treffer
- evaluacion prestacion 38 Treffer
- evaluation performance 38 Treffer
- performance evaluation 38 Treffer
- circuits electriques, optiques et optoelectroniques 32 Treffer
- electric, optical and optoelectronic circuits 32 Treffer
- 8530t 26 Treffer
- circuit properties 25 Treffer
- mos technology 25 Treffer
- proprietes des circuits 25 Treffer
- technologie mos 25 Treffer
- tecnologia mos 25 Treffer
- circuits electroniques 24 Treffer
- electronic circuits 24 Treffer
- dual gate transistor 23 Treffer
- transistor de compuerta doble 23 Treffer
- transistor grille double 23 Treffer
- fiabilite 21 Treffer
- reliability 21 Treffer
- seuil tension 21 Treffer
- umbral tension 21 Treffer
- voltage threshold 21 Treffer
- damaging 20 Treffer
- deterioracion 20 Treffer
- endommagement 20 Treffer
- fiabilidad 20 Treffer
- grille transistor 19 Treffer
- miniaturisation 19 Treffer
- miniaturizacion 19 Treffer
- miniaturization 19 Treffer
- physics 19 Treffer
- physique 19 Treffer
- rejilla transistor 19 Treffer
- silicium 19 Treffer
- silicon 19 Treffer
- silicon on insulator technology 19 Treffer
- technologie silicium sur isolant 19 Treffer
- tecnologia silicio sobre aislante 19 Treffer
- transistor gate 19 Treffer
- circuit design 18 Treffer
- conception circuit 18 Treffer
- diseno circuito 18 Treffer
- self aligned technology 17 Treffer
- silicio 17 Treffer
Publikation
- microelectronics and reliability 36 Treffer
- solid-state electronics 29 Treffer
- microelectronic engineering 13 Treffer
- microelectronics journal 11 Treffer
- insulating films on semiconductors 2013 5 Treffer
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37 weitere Werte:
- 17th european symposium on reliability of electron devices, failure physics and analysis (esref 2006), wuppertal, germany, 3-6 october 2006 3 Treffer
- materials science & engineering. b, solid-state materials for advanced technology 3 Treffer
- reliability of electron devices, failure physics and analysis 3 Treffer
- selected extended papers from ulis 2012 conference 3 Treffer
- 2009 international electron devices and materials symposium (iedms) 2 Treffer
- integration (amsterdam) 2 Treffer
- journal of crystal growth 2 Treffer
- physica. e, low-dimentional systems and nanostructures 2 Treffer
- selected full-length extended papers from the eurosoi 2009 conference 2 Treffer
- selected papers from the essderc 2011 conference 2 Treffer
- special issue with papers selected from the ultimate integration on silicon conference, ulis 2008 2 Treffer
- 14th international conference on molecular beam epitaxy (mbe-xiv), 3-8 september 2006, tokyo, japan 1 Treffer
- 14th workshop on dielectrics in microelectronics (wodim 2006) 1 Treffer
- 16th european symposium on reliability of electron devices, failure physics and analysis (esref 2005), arcachon, france, october 10-14, 2005 1 Treffer
- applied surface science 1 Treffer
- computing with future nanotechnology 1 Treffer
- containing papers presented at the international conference on advanced materials 1999, symposium m: silicon-based materials and devices, june 13-18, 1999, beijing, china 1 Treffer
- current trends in nanotechnologies: from materials to systems, proceedings of symposium s, emrs spring meeting 2001, strasbourg, france, june 5-8, 2001 1 Treffer
- dielectrics in microelectronics (wodim 2004) 1 Treffer
- european materials research society (e-mrs) 2001, spring meeting, symposium d: second international conference on silicon epitaxy and heterostructures, strasbourg, france, june 4-8th 2001 1 Treffer
- journal of non-crystalline solids 1 Treffer
- journal of parallel and distributed computing (print) 1 Treffer
- low-dimensional systems, mauterndorf, austria, 15-20 february 2004 1 Treffer
- materials science & engineering c. biomimetic and supramolecular systems 1 Treffer
- materials science in semiconductor processing 1 Treffer
- mbe xiii, 2004: 13th international conference on molecular beam epitaxy, edinburgh, uk, 22-27 august 2004 1 Treffer
- negative-bias-temperature instability (nbti) in mos devices special sectio n 1 Treffer
- neurocomputing (amsterdam) 1 Treffer
- new aspects of si-and ge-based materials and devices 1 Treffer
- papers selected from the ultimate integration on silicon conference 2009, ulis 2009 1 Treffer
- proceedings of the 5th franco-italian symposium on sio2, advanced dielectrics and related devices, chamonix, mont blanc, france, june 21-23, 2004 1 Treffer
- reliability physics of advanced electron devices 1 Treffer
- surface science reports 1 Treffer
- the international symposium on ion implantation and other applications of ions and electrons - ion 2002, 10-13 june 2002, kazimierz dolny, poland 1 Treffer
- thin solid films 1 Treffer
- third international conference on low dimensional structures and devices, september 15-17, 1999, antalya, turkey 1 Treffer
- vacuum 1 Treffer
Sprache
107 Treffer
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A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuitsIn: Solid-state electronics, Jg. 91 (2014), S. 81-86academicJournalZugriff:
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In: Solid-state electronics, Jg. 62 (2011), Heft 1, S. 115-122academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 3, S. 349-355academicJournalZugriff:
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In: Reliability of electron devices, failure physics and analysis, Jg. 44 (2004), Heft 9-11, S. 1519-1522KonferenzZugriff:
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In: The international symposium on ion implantation and other applications of ions and electrons - ION 2002, 10-13 June 2002, Kazimierz Dolny, Poland, Jg. 70 (2003), Heft 2-3, S. 323-329KonferenzZugriff:
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In: Solid-state electronics, Jg. 63 (2011), Heft 1, S. 14-18academicJournalZugriff:
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In: Microelectronics journal, Jg. 42 (2011), Heft 1, S. 196-203academicJournalZugriff:
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In: Solid-state electronics, Jg. 54 (2010), Heft 1, S. 18-21academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 45 (2005), Heft 3-4, S. 499-506academicJournalZugriff:
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In: Special Issue with Papers Selected from the Ultimate Integration on Silicon Conference, Ulis 2008, Jg. 53 (2009), Heft 4, S. 402-410academicJournalZugriff:
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In: 14TH Workshop on dielectrics in microelectronics (WoDiM 2006), Jg. 47 (2007), Heft 4-5, S. 552-558KonferenzZugriff:
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In: 17th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2006), Wuppertal, Germany, 3-6 October 2006, Jg. 46 (2006), Heft 9-11, S. 1669-1672KonferenzZugriff:
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In: 17th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2006), Wuppertal, Germany, 3-6 October 2006, Jg. 46 (2006), Heft 9-11, S. 1597-1602KonferenzZugriff:
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In: Current trends in nanotechnologies: from materials to systems, proceedings of Symposium S, EMRS spring meeting 2001, Strasbourg, France, June 5-8, Jg. 19 (2002), Heft 1-2, S. 363-368KonferenzZugriff:
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In: Proceedings of the 5th Franco-Italian Symposium on SiO2, advanced dielectrics and related devices, Chamonix, Mont Blanc, France, June 21-23, 2004, Jg. 351 (2005), Heft 21-23, S. 1885-1889KonferenzZugriff:
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In: Integration (Amsterdam), Jg. 47 (2014), Heft 1, S. 115-122academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 54 (2014), Heft 8, S. 1489-1499academicJournalZugriff:
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In: Reliability of electron devices, failure physics and analysis, Jg. 44 (2004), Heft 9-11, S. 1817-1822KonferenzZugriff:
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In: Selected extended papers from ULIS 2012 conference, Jg. 88 (2013), S. 2-8academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 2, S. 236-244academicJournalZugriff: