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Publikation
Sprache
16 Treffer
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In: Semiconductor Science and Technology, Jg. 19 (2004-10-13), S. 1381-1385Online unknownZugriff:
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In: IOP Conference Series: Materials Science and Engineering, Jg. 225 (2017-08-01), S. 012160-12160Online unknownZugriff:
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In: Chinese Physics B, Jg. 22 (2013-02-01), S. 024212-24212Online unknownZugriff:
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In: Journal of Micromechanics and Microengineering, Jg. 18 (2008-05-28), S. 075010-75010Online unknownZugriff:
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In: Journal of Semiconductors, Jg. 41 (2020-08-01), S. 082006-82006Online unknownZugriff:
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In: Japanese Journal of Applied Physics, Jg. 47 (2008-04-25), S. 2602-2605Online unknownZugriff:
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In: Semiconductor Science and Technology, Jg. 22 (2007-05-21), S. 647-652Online unknownZugriff:
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In: Semiconductor Science and Technology, Jg. 22 (2006-12-05), S. 54-64Online unknownZugriff:
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In: Materials Research Express, Jg. 4 (2017-01-13), S. 015901-15901Online unknownZugriff:
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In: Japanese Journal of Applied Physics, Jg. 45 (2006-08-04), S. 6173-6176Online unknownZugriff:
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In: Japanese Journal of Applied Physics, Jg. 50 (2011-04-01), S. 04DC22Online unknownZugriff:
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In: Japanese Journal of Applied Physics, Jg. 40 (2001-04-01), S. 2627-2627Online unknownZugriff:
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In: Journal of Physics: Conference Series, Jg. 248 (2010-11-01), S. 012059-12059Online unknownZugriff:
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In: Japanese Journal of Applied Physics, Jg. 37 (1998-04-01), S. 1793-1793Online unknownZugriff:
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In: Semiconductor Science and Technology, Jg. 9 (1994-05-02), S. 1108-1116Online unknownZugriff:
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In: IOP Conference Series: Materials Science and Engineering, Jg. 41 (2012-12-06), S. 012016-12016Online unknownZugriff: