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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 27 (2019-04-01), S. 854-863Online unknownZugriff:
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In: 2014 International Conference on Microelectronic Test Structures (ICMTS), 2014-03-01Online unknownZugriff:
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In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Jg. 35 (2016-08-01), S. 1243-1254Online unknownZugriff:
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In: 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2019-07-01Online unknownZugriff: