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- 02 engineering and technology 2 Treffer
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59 Treffer
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In: IEEE Electron Device Letters, Jg. 38 (2017-05-01), S. 623-625Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 35 (2014), S. 54-56Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 29 (2008-04-01), S. 392-395Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 34 (2013), S. 135-137Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 32 (2011-08-01), S. 1011-1013Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 27 (2006-07-01), S. 595-597Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 27 (2006), S. 46-48Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 29 (2008-05-01), S. 491-493Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 26 (2005-06-01), S. 416-418Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 23 (2002), S. 46-48Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 30 (2009-11-01), S. 1200-1202Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 27 (2006-10-01), S. 863-865Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 24 (2003-09-01), S. 589-591Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 24 (2003-04-01), S. 263-265Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 21 (2000-09-01), S. 451-453Online unknownZugriff:
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A simulation study to evaluate the feasibility of midgap workfunction metal gates in 25 nm bulk CMOSIn: IEEE Electron Device Letters, Jg. 24 (2003-11-01), S. 707-709Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 23 (2002-04-01), S. 200-202Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 21 (2000), S. 21-23Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 20 (1999), S. 36-38Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 22 (2001-12-01), S. 588-590Online unknownZugriff: