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Weniger Treffer
Gefunden in
Schlagwort
- cmos 3.295 Treffer
- optoelectronics 3.085 Treffer
- electrical engineering 1.738 Treffer
- law 1.622 Treffer
- law.invention 1.622 Treffer
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45 weitere Werte:
- transistor 1.311 Treffer
- electrical and electronic engineering 1.236 Treffer
- hardware_integratedcircuits 1.127 Treffer
- chemistry 1.053 Treffer
- hardware_performanceandreliability 1.041 Treffer
- electronic, optical and magnetic materials 967 Treffer
- electronic engineering 856 Treffer
- hardware_logicdesign 762 Treffer
- silicon on insulator 745 Treffer
- threshold voltage 703 Treffer
- chemistry.chemical_element 701 Treffer
- silicon 509 Treffer
- gate oxide 486 Treffer
- chemistry.chemical_compound 467 Treffer
- logic gate 445 Treffer
- voltage 438 Treffer
- condensed matter physics 430 Treffer
- nmos logic 428 Treffer
- field-effect transistor 421 Treffer
- 02 engineering and technology 390 Treffer
- hardware_general 380 Treffer
- pmos logic 363 Treffer
- 01 natural sciences 354 Treffer
- electron mobility 348 Treffer
- 0103 physical sciences 340 Treffer
- 010302 applied physics 313 Treffer
- leakage (electronics) 303 Treffer
- electronic circuit 301 Treffer
- metal gate 281 Treffer
- doping 261 Treffer
- gate dielectric 261 Treffer
- nanotechnology 255 Treffer
- transconductance 238 Treffer
- capacitance 232 Treffer
- high-κ dielectric 213 Treffer
- ion implantation 211 Treffer
- 0210 nano-technology 208 Treffer
- 021001 nanoscience & nanotechnology 208 Treffer
- dielectric 205 Treffer
- subthreshold conduction 193 Treffer
- fabrication 191 Treffer
- wafer 189 Treffer
- integrated circuit 185 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 181 Treffer
- analytical chemistry 166 Treffer
Verlag
- ieee 2.015 Treffer
- institute of electrical and electronics engineers (ieee) 769 Treffer
- elsevier bv 233 Treffer
- iop publishing 110 Treffer
- springer science and business media llc 96 Treffer
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45 weitere Werte:
- hal ccsd 47 Treffer
- aip publishing 42 Treffer
- japan soc. appl. phys 39 Treffer
- the electrochemical society 34 Treffer
- spie 33 Treffer
- institution of engineering and technology (iet) 32 Treffer
- american vacuum society 27 Treffer
- trans tech publications, ltd. 18 Treffer
- aip 17 Treffer
- wiley 15 Treffer
- institute of electronics, information and communications engineers (ieice) 14 Treffer
- american vacuum soc 13 Treffer
- elsevier 11 Treffer
- japan soc. applied phys 11 Treffer
- springer berlin heidelberg 11 Treffer
- springer international publishing 11 Treffer
- ire 10 Treffer
- springer us 10 Treffer
- the japan society of applied physics 10 Treffer
- informa uk limited 9 Treffer
- mdpi ag 9 Treffer
- springer singapore 9 Treffer
- world scientific pub co pte lt 8 Treffer
- institute of electrical and electronics engineers inc. 7 Treffer
- purdue university 7 Treffer
- springer netherlands 7 Treffer
- the institute of electronics engineers of korea 7 Treffer
- widerkehr & associates 7 Treffer
- acm 6 Treffer
- american scientific publishers 6 Treffer
- crc press 6 Treffer
- edp sciences 6 Treffer
- hindawi limited 5 Treffer
- inderscience publishers 5 Treffer
- institute of electrical and electronics engineers 5 Treffer
- arxiv 4 Treffer
- ieee / institute of electrical and electronics engineers incorporated:445 hoes lane:piscataway, nj 08854:(800)701-4333, (732)981-0060, email: subscription-service@ieee.org, internet: http://www.ieee.org, fax: (732)981-9667 4 Treffer
- ieee comput. soc 4 Treffer
- the korean institute of electrical and electronic material engineers 4 Treffer
- cambridge university press 3 Treffer
- emerald 3 Treffer
- esd assoc 3 Treffer
- imaps - international microelectronics assembly and packaging society 3 Treffer
- institute of advanced engineering and science 3 Treffer
- institute of electrical engineers of japan (iee japan) 3 Treffer
Publikation
- ieee transactions on electron devices 305 Treffer
- ieee electron device letters 231 Treffer
- japanese journal of applied physics 62 Treffer
- solid-state electronics 60 Treffer
- ieee transactions on nuclear science 58 Treffer
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45 weitere Werte:
- microelectronic engineering 47 Treffer
- ieee transactions on device and materials reliability 35 Treffer
- mrs proceedings 30 Treffer
- microelectronics reliability 28 Treffer
- semiconductor science and technology 26 Treffer
- applied physics letters 25 Treffer
- electronics letters 25 Treffer
- international electron devices meeting. technical digest (cat. no.01ch37224) 24 Treffer
- spie proceedings 22 Treffer
- 2007 ieee international electron devices meeting 21 Treffer
- ieee internationalelectron devices meeting, 2005. iedm technical digest. 21 Treffer
- ieee transactions on nanotechnology 21 Treffer
- ecs transactions 19 Treffer
- iedm technical digest. ieee international electron devices meeting, 2004. 19 Treffer
- international electron devices meeting 1999. technical digest (cat. no.99ch36318) 19 Treffer
- 2002 symposium on vlsi technology. digest of technical papers (cat. no.01ch37303) 18 Treffer
- aip conference proceedings 18 Treffer
- 2008 9th international conference on solid-state and integrated-circuit technology 17 Treffer
- digest of technical papers. 2004 symposium on vlsi technology, 2004. 17 Treffer
- 2001 symposium on vlsi technology. digest of technical papers (ieee cat. no.01 ch37184) 16 Treffer
- ieee journal of solid-state circuits 16 Treffer
- ieee microwave and wireless components letters 16 Treffer
- 2009 international semiconductor device research symposium 15 Treffer
- 2011 international semiconductor device research symposium (isdrs) 15 Treffer
- journal of vacuum science & technology b: microelectronics and nanometer structures 15 Treffer
- thin solid films 15 Treffer
- 2008 ieee international electron devices meeting 14 Treffer
- digest of technical papers. 2005 symposium on vlsi technology, 2005. 14 Treffer
- international electron devices meeting 1998. technical digest (cat. no.98ch36217) 14 Treffer
- international electron devices meeting. iedm technical digest 14 Treffer
- journal of applied physics 14 Treffer
- silicon 14 Treffer
- ieee international electron devices meeting 2003 13 Treffer
- ieee transactions on semiconductor manufacturing 13 Treffer
- journal of semiconductors 13 Treffer
- microelectronics journal 13 Treffer
- proceedings of international electron devices meeting 13 Treffer
- 1999 symposium on vlsi technology. digest of technical papers (ieee cat. no.99ch36325) 12 Treffer
- 2006 8th international conference on solid-state and integrated circuit technology proceedings 12 Treffer
- 2009 ieee international electron devices meeting (iedm) 12 Treffer
- 2012 international electron devices meeting 12 Treffer
- digest. international electron devices meeting 12 Treffer
- international electron devices meeting 2000. technical digest. iedm (cat. no.00ch37138) 12 Treffer
- international semiconductor device research symposium, 2003 12 Treffer
- 2003 symposium on vlsi technology. digest of technical papers (ieee cat. no.03ch37407) 11 Treffer
Sprache
4.020 Treffer
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-12-01), S. 6592-6598Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-12-01), S. 6644-6647Online unknownZugriff:
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In: WSEAS TRANSACTIONS ON SYSTEMS, Jg. 20 (2021-08-10), S. 244-248Online unknownZugriff:
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In: IEEE Transactions on Circuits and Systems II: Express Briefs, Jg. 68 (2021-06-01), S. 1743-1747Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-05-01), S. 573-580Online unknownZugriff:
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In: IEEE Sensors Journal, Jg. 21 (2021-02-15), S. 4755-4763Online unknownZugriff:
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In: Silicon, Jg. 14 (2021-01-07), S. 1169-1177Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 9 (2021), S. 415-423Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 42 (2021), S. 78-81Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 9 (2021), S. 995-1002Online unknownZugriff:
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In: Journal of Nanoscience and Nanotechnology, Jg. 20 (2020-11-01), S. 6632-6637Online unknownZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 55 (2020-10-01), S. 2629-2638Online unknownZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 70 (2021), S. 1-10Online unknownZugriff:
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In: Silicon, Jg. 13 (2020-07-13), S. 1939-1949Online unknownZugriff:
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In: IEEE Access, Jg. 8 (2020), S. 215840-215850Online unknownZugriff:
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In: Journal of Electrical Engineering, Jg. 70 (2019-12-01), S. 480-485Online unknownZugriff:
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In: Materials Science Forum, Jg. 1004 (2020-07-01), S. 1123-1128Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 20 (2020-06-01), S. 459-467Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 67 (2020), S. 224-229Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 8 (2020), S. 897-904Online unknownZugriff: