Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- electrical and electronic engineering 51 Treffer
- cmos 41 Treffer
- electronic, optical and magnetic materials 40 Treffer
- business 27 Treffer
- business.industry 27 Treffer
-
45 weitere Werte:
- law 23 Treffer
- law.invention 23 Treffer
- threshold voltage 20 Treffer
- transistor 20 Treffer
- electrical engineering 19 Treffer
- 02 engineering and technology 18 Treffer
- 01 natural sciences 15 Treffer
- 0103 physical sciences 14 Treffer
- 010302 applied physics 14 Treffer
- optoelectronics 14 Treffer
- materials chemistry 12 Treffer
- atomic and molecular physics, and optics 10 Treffer
- hardware_performanceandreliability 10 Treffer
- voltage 10 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 9 Treffer
- hardware_integratedcircuits 9 Treffer
- nmos logic 9 Treffer
- 0210 nano-technology 8 Treffer
- 021001 nanoscience & nanotechnology 8 Treffer
- electronic engineering 8 Treffer
- chemistry 7 Treffer
- condensed matter::mesoscopic systems and quantum hall effect 7 Treffer
- doping 7 Treffer
- hardware_logicdesign 7 Treffer
- pmos logic 7 Treffer
- quantum 7 Treffer
- semiconductor device modeling 7 Treffer
- silicon on insulator 7 Treffer
- surfaces, coatings and films 7 Treffer
- 020206 networking & telecommunications 6 Treffer
- 020208 electrical & electronic engineering 6 Treffer
- computer science::hardware architecture 6 Treffer
- dopant 6 Treffer
- monte carlo method 6 Treffer
- symbols 6 Treffer
- symbols.namesake 6 Treffer
- chemistry.chemical_element 5 Treffer
- computer simulation 5 Treffer
- field-effect transistor 5 Treffer
- logic gate 5 Treffer
- nanotechnology 5 Treffer
- silicon 5 Treffer
- [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics 4 Treffer
- breakdown voltage 4 Treffer
- electronic circuit 4 Treffer
Verlag
Publikation
- solid-state electronics 9 Treffer
- microelectronic engineering 6 Treffer
- ieee microwave and wireless components letters 5 Treffer
- ieee transactions on electron devices 5 Treffer
- ieee electron device letters 4 Treffer
-
21 weitere Werte:
- ieee journal of the electron devices society 3 Treffer
- ieee transactions on microwave theory and techniques 3 Treffer
- ieee transactions on semiconductor manufacturing 3 Treffer
- semiconductor science and technology 2 Treffer
- spie proceedings 2 Treffer
- 2001 ieee international integrated reliability workshop. final report (cat. no.01th8580) 1 Treffer
- 2012 ieee international reliability physics symposium (irps) 1 Treffer
- 2018 14th conference on ph.d. research in microelectronics and electronics (prime) 1 Treffer
- 2018 48th european solid-state device research conference (essderc) 1 Treffer
- 4th ieee conference on nanotechnology, 2004. 1 Treffer
- aip conference proceedings 1 Treffer
- ecs transactions 1 Treffer
- ieee transactions on electromagnetic compatibility 1 Treffer
- ieee transactions on nanotechnology 1 Treffer
- ieice electronics express 1 Treffer
- journal of display technology 1 Treffer
- microelectronics reliability 1 Treffer
- microwave and optical technology letters 1 Treffer
- physica status solidi: b: basic research 1 Treffer
- proceedings of the 2005 international symposium on low power electronics and design - islped '05 1 Treffer
- trita-ict/map 1 Treffer
Sprache
67 Treffer
-
In: IEEE Journal of the Electron Devices Society, Jg. 8 (2020), S. 505-523Online unknownZugriff:
-
In: Solid-State Electronics, Jg. 186 (2021-12-01), S. 108126-108126Online unknownZugriff:
-
In: 2018 48th European Solid-State Device Research Conference (ESSDERC), 2018-09-01Online unknownZugriff:
-
A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuitsIn: Solid-State Electronics, Jg. 91 (2014), S. 81-86Online unknownZugriff:
-
In: TRITA-ICT/MAP, 2007Online unknownZugriff:
-
In: IEEE Transactions on Microwave Theory and Techniques, Jg. 57 (2009-04-01), S. 972-979Online unknownZugriff:
-
In: IEICE Electronics Express, Jg. 6 (2009), S. 35-39Online unknownZugriff:
-
In: Solid-State Electronics, Jg. 51 (2007), S. 170-178Online unknownZugriff:
-
In: Solid-State Electronics, Jg. 46 (2002-03-01), S. 315-320Online unknownZugriff:
-
In: IEEE Transactions on Semiconductor Manufacturing, Jg. 16 (2003-11-01), S. 653-655Online unknownZugriff:
-
In: Microelectronic Engineering, Jg. 39 (1997-12-01), S. 263-272Online unknownZugriff:
-
In: Microelectronic Engineering, Jg. 36 (1997-06-01), S. 3-10Online unknownZugriff:
-
In: SPIE Proceedings, 2001-10-15Online unknownZugriff:
-
In: 4th IEEE Conference on Nanotechnology,, 2005-04-01Online unknownZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 9 (2021), S. 985-994Online unknownZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 68 (2021-06-01), S. 2611-2617Online unknownZugriff:
-
In: IEEE Electron Device Letters, Jg. 41 (2020-07-01), S. 1029-1032Online unknownZugriff:
-
In: IEEE Transactions on Semiconductor Manufacturing, Jg. 33 (2020-05-01), S. 166-173Online unknownZugriff: