Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- degradation 2 Treffer
- magnetic tunneling 2 Treffer
- negative bias temperature instability 2 Treffer
- resistance 2 Treffer
- spin transfer torque 2 Treffer
-
42 weitere Werte:
- switches 2 Treffer
- bias temperature instability (bti) 1 Treffer
- circuit reliability 1 Treffer
- cmos memory circuits 1 Treffer
- cmos process technology 1 Treffer
- computer network architectures 1 Treffer
- computer science 1 Treffer
- computer software development 1 Treffer
- computer storage devices 1 Treffer
- delays 1 Treffer
- electric potential 1 Treffer
- electronic circuits 1 Treffer
- electronic instruments 1 Treffer
- electrostatics 1 Treffer
- error 1 Treffer
- flash memory 1 Treffer
- integrated circuit reliability 1 Treffer
- integrated circuit testing 1 Treffer
- monte carlo method 1 Treffer
- mos devices 1 Treffer
- nbti 1 Treffer
- negative bias temperature instability (nbti) 1 Treffer
- process variation 1 Treffer
- process variations 1 Treffer
- sensitivity analysis 1 Treffer
- size 65 nm 1 Treffer
- spin-polarized currents 1 Treffer
- sram chips 1 Treffer
- static random access memory 1 Treffer
- static random access memory (sram) 1 Treffer
- statistical analysis 1 Treffer
- stress 1 Treffer
- switching circuits 1 Treffer
- temperature 1 Treffer
- test reliability 1 Treffer
- test structure 1 Treffer
- thermal fluctuation 1 Treffer
- thermal stability 1 Treffer
- thermal variables control 1 Treffer
- threshold voltage 1 Treffer
- voltage 1.2 v 1 Treffer
- voltage measurement 1 Treffer
Publikation
Sprache
4 Treffer
-
In: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, Jg. 36 (2017-07-01), Heft 7, S. 1181-1192Online academicJournalZugriff:
-
In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 25 (2017-04-01), Heft 4, S. 1444-1454Online academicJournalZugriff:
-
In: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, Jg. 33 (2014-11-01), Heft 11, S. 1644-1656Online academicJournalZugriff:
-
In: IEEE Transactions on Circuits & Systems. Part I: Regular Papers, Jg. 59 (2012-03-01), Heft 3, S. 584-593Online serialPeriodicalZugriff: