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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- engineered materials, dielectrics and plasmas 5 Treffer
- capacitance 4 Treffer
- cmos technology 4 Treffer
- threshold voltage 4 Treffer
- computing and processing 2 Treffer
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45 weitere Werte:
- logic gates 2 Treffer
- propagation delay 2 Treffer
- ring oscillators 2 Treffer
- sram 2 Treffer
- transistors 2 Treffer
- 4t sram 1 Treffer
- adhesives 1 Treffer
- biomedical electrodes 1 Treffer
- boosting 1 Treffer
- closed-form solution 1 Treffer
- cmos digital integrated circuits 1 Treffer
- cmos integrated circuits 1 Treffer
- cmos logic circuits 1 Treffer
- cmos process 1 Treffer
- communication, networking and broadcast technologies 1 Treffer
- degradation 1 Treffer
- digital circuits 1 Treffer
- failure analysis 1 Treffer
- fields, waves and electromagnetics 1 Treffer
- finfets 1 Treffer
- geometry 1 Treffer
- integrated circuit noise 1 Treffer
- large scale integration 1 Treffer
- leakage current 1 Treffer
- lithography 1 Treffer
- logic devices 1 Treffer
- low power 1 Treffer
- medical simulation 1 Treffer
- negative bias temperature instability 1 Treffer
- negative bias temperature instability (nbti) 1 Treffer
- niobium compounds 1 Treffer
- parasitic capacitance 1 Treffer
- power dissipation 1 Treffer
- power, energy and industry applications 1 Treffer
- read-write memory 1 Treffer
- repair 1 Treffer
- resistors 1 Treffer
- rna 1 Treffer
- sbb 1 Treffer
- signal processing and analysis 1 Treffer
- silicon 1 Treffer
- soi 1 Treffer
- stability analysis 1 Treffer
- static noise margin 1 Treffer
- subthreshold current 1 Treffer
Publikation
- 1991 proceedings eighth international ieee vlsi multilevel interconnection conference, vlsi multilevel interconnection conference, 1991, proceedings., eighth international ieee 1 Treffer
- 1996 ieee international soi conference proceedings, soi conference, 1996. proceedings., 1996 ieee international, soi 1 Treffer
- 1998 ieee international soi conference proceedings (cat no.98ch36199), soi conference, 1998. proceedings., 1998 ieee international, soi conference 1 Treffer
- 2006 13th ieee international conference on electronics, circuits and systems, electronics, circuits and systems, 2006. icecs '06. 13th ieee international conference on 1 Treffer
- 2008 9th international conference on solid-state and integrated-circuit technology, solid-state and integrated-circuit technology, 2008. icsict 2008. 9th international conference on 1 Treffer
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4 weitere Werte:
- 2009 ieee international conference of electron devices and solid-state circuits (edssc), electron devices and solid-state circuits, 2009. edssc 2009. ieee international conference of 1 Treffer
- 2011 international symposium on integrated circuits, integrated circuits (isic), 2011 13th international symposium on 1 Treffer
- 2012 students conference on engineering and systems, engineering and systems (sces), 2012 students conference on 1 Treffer
- proceedings of 13th annual ieee international asic/soc conference (cat. no.00th8541), asic/soc conference, 2000. proceedings. 13th annual ieee international, asic/soc conference 1 Treffer
9 Treffer
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In: 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199), 1998, S. 5-8KonferenzZugriff:
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In: 2008 9th International Conference on Solid-State and Integrated-Circuit Technology, 2008-10-01, S. 440KonferenzZugriff:
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In: Proceedings of 13th Annual IEEE International ASIC/SOC Conference (Cat. No.00TH8541), 2000, S. 359-363KonferenzZugriff:
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In: 1996 IEEE International SOI Conference Proceedings, 1996, S. 80-81KonferenzZugriff:
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In: 2012 Students Conference on Engineering and Systems, 2012-03-01, S. 1-5KonferenzZugriff:
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In: 1991 Proceedings Eighth International IEEE VLSI Multilevel Interconnection Conference, 1991, S. 130-136KonferenzZugriff:
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In: 2006 13th IEEE International Conference on Electronics, Circuits and Systems, 2006-12-01, S. 1192KonferenzZugriff:
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In: 2011 International Symposium on Integrated Circuits, 2011-12-01, S. 617-622KonferenzZugriff:
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In: 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC), 2009-12-01, S. 453KonferenzZugriff: