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Weniger Treffer
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Schlagwort
- plasmas 5 Treffer
- components, circuits, devices and systems 4 Treffer
- contact resistance 4 Treffer
- electron microscopy 4 Treffer
- infrared spectroscopy 4 Treffer
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33 weitere Werte:
- nickel silicide 4 Treffer
- plasma cvd 4 Treffer
- substrates 4 Treffer
- surface treatment 4 Treffer
- tin 4 Treffer
- titanium 4 Treffer
- x-ray photoelectron spectroscopy 4 Treffer
- electric resistance 3 Treffer
- fourier transform infrared spectroscopy 3 Treffer
- gas flow 3 Treffer
- nickel compounds 3 Treffer
- nickel-titanium alloys 3 Treffer
- plasma-enhanced chemical vapor deposition 3 Treffer
- titanium tetrachloride 3 Treffer
- transmission electron microscopy 3 Treffer
- annealing 2 Treffer
- computing and processing 2 Treffer
- cvd 2 Treffer
- engineered materials, dielectrics and plasmas 2 Treffer
- surface morphology 2 Treffer
- ticl4 2 Treffer
- carbon nanotubes 1 Treffer
- cnt 1 Treffer
- cnt film 1 Treffer
- etching 1 Treffer
- field emission 1 Treffer
- gold 1 Treffer
- mesoporous materials 1 Treffer
- metals 1 Treffer
- nanoporous silicon 1 Treffer
- pvd 1 Treffer
- scanning electron microscopy 1 Treffer
- sem 1 Treffer
Publikation
- ieee transactions on semiconductor manufacturing 3 Treffer
- 2007 7th ieee conference on nanotechnology (ieee nano), nanotechnology, 2007. ieee-nano 2007. 7th ieee conference on 1 Treffer
- 2011 11th ieee international conference on nanotechnology 1 Treffer
- 2011 11th ieee international conference on nanotechnology, nanotechnology (ieee-nano), 2011 11th ieee conference on 1 Treffer
- cas 2010 proceedings (international semiconductor conference), semiconductor conference (cas), 2010 international 1 Treffer
- Ein weiterer Wert:
Sprache
5 Treffer
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In: 2011 11th IEEE International Conference on Nanotechnology, 2011-08-01, S. 1378-1383KonferenzZugriff:
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In: CAS 2010 Proceedings (International Semiconductor Conference), Jg. 01 (2010-10-01), S. 81-84KonferenzZugriff:
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In: IEEE Transactions on Semiconductor Manufacturing, Jg. 24 (2011-05-01), Heft 2, S. 325-332Online academicJournalZugriff:
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In: 2007 7th IEEE Conference on Nanotechnology (IEEE NANO), 2007-08-01, S. 367KonferenzZugriff:
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In: IEEE Transactions on Semiconductor Manufacturing, Jg. 24 (2011-05-01), Heft 2, S. 325-332Online academicJournalZugriff: