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39 weitere Werte:
- clocks 2 Treffer
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- engineered materials, dielectrics and plasmas 1 Treffer
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- 2010 ieee international test conference, test conference (itc), 2010 ieee international 1 Treffer
- 2012 ieee/acm international conference on computer-aided design (iccad), computer-aided design (iccad), 2012 ieee/acm international conference on 1 Treffer
- 2015 33rd ieee international conference on computer design (iccd), computer design (iccd), 2015 33rd ieee international conference on 1 Treffer
- 2016 26th international conference on field programmable logic and applications (fpl), field programmable logic and applications (fpl), 2016 26th international conference on 1 Treffer
- 2017 18th ieee latin american test symposium (lats), test symposium (lats), 2017 18th ieee latin american 1 Treffer
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4 weitere Werte:
- 2017 ieee 26th asian test symposium (ats), asian test symposium (ats), 2017 ieee 26th, ats 1 Treffer
- 2018 ieee 19th latin-american test symposium (lats), test symposium (lats), 2018 ieee 19th latin-american 1 Treffer
- asic, 2003. proceedings. 5th international conference on, semiconductor manufacturing 1 Treffer
- ieee transactions on computer-aided design of integrated circuits and systems, computer-aided design of integrated circuits and systems, ieee transactions on, ieee trans. comput.-aided des. integr. circuits syst. 1 Treffer
9 Treffer
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In: 2017 IEEE 26th Asian Test Symposium (ATS), 2017-11-01, S. 189-194KonferenzZugriff:
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In: 2015 33rd IEEE International Conference on Computer Design (ICCD), 2015-10-01, S. 251-258KonferenzZugriff:
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In: 2017 18th IEEE Latin American Test Symposium (LATS), 2017-03-01, S. 1-6KonferenzZugriff:
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In: 2018 IEEE 19th Latin-American Test Symposium (LATS), 2018-03-01, S. 1-6KonferenzZugriff:
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In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Jg. 38 (2019-04-01), Heft 4, S. 767-779Online academicJournalZugriff:
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In: 2016 26th International Conference on Field Programmable Logic and Applications (FPL), 2016-08-01, S. 1-11KonferenzZugriff:
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In: 2010 IEEE International Test Conference, 2010-11-01, S. 1-10KonferenzZugriff:
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In: 2012 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 2012-11-01, S. 557-563Online KonferenzZugriff:
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In: ASIC, 2003. Proceedings. 5th International Conference on, Semiconductor manufacturing, Jg. 1 (2003), S. 12KonferenzZugriff: