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Weniger Treffer
Gefunden in
Schlagwort
- materials science 3.085 Treffer
- cmos 2.839 Treffer
- electrical engineering 1.393 Treffer
- law 1.392 Treffer
- law.invention 1.392 Treffer
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45 weitere Werte:
- transistor 1.148 Treffer
- electrical and electronic engineering 1.122 Treffer
- chemistry 935 Treffer
- electronic, optical and magnetic materials 874 Treffer
- hardware_integratedcircuits 828 Treffer
- hardware_performanceandreliability 754 Treffer
- silicon on insulator 703 Treffer
- chemistry.chemical_element 624 Treffer
- electronic engineering 614 Treffer
- threshold voltage 598 Treffer
- hardware_logicdesign 563 Treffer
- silicon 458 Treffer
- gate oxide 453 Treffer
- chemistry.chemical_compound 401 Treffer
- logic gate 394 Treffer
- field-effect transistor 379 Treffer
- nmos logic 376 Treffer
- voltage 351 Treffer
- condensed matter physics 346 Treffer
- 02 engineering and technology 341 Treffer
- 01 natural sciences 326 Treffer
- pmos logic 318 Treffer
- electron mobility 317 Treffer
- 0103 physical sciences 312 Treffer
- 010302 applied physics 280 Treffer
- leakage (electronics) 265 Treffer
- hardware_general 259 Treffer
- metal gate 249 Treffer
- doping 243 Treffer
- gate dielectric 242 Treffer
- electronic circuit 228 Treffer
- transconductance 221 Treffer
- nanotechnology 202 Treffer
- high-κ dielectric 200 Treffer
- physics 199 Treffer
- ion implantation 192 Treffer
- capacitance 191 Treffer
- 0210 nano-technology 190 Treffer
- 021001 nanoscience & nanotechnology 190 Treffer
- dielectric 190 Treffer
- fabrication 179 Treffer
- wafer 172 Treffer
- materials chemistry 168 Treffer
- subthreshold conduction 166 Treffer
- engineering 164 Treffer
Verlag
- ieee 1.682 Treffer
- institute of electrical and electronics engineers (ieee) 694 Treffer
- elsevier bv 239 Treffer
- iop publishing 104 Treffer
- springer science and business media llc 75 Treffer
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45 weitere Werte:
- hal ccsd 42 Treffer
- aip publishing 41 Treffer
- japan soc. appl. phys 34 Treffer
- spie 34 Treffer
- the electrochemical society 32 Treffer
- institution of engineering and technology (iet) 28 Treffer
- american vacuum society 24 Treffer
- trans tech publications, ltd. 17 Treffer
- wiley 14 Treffer
- aip 12 Treffer
- american vacuum soc 11 Treffer
- ire 10 Treffer
- springer international publishing 10 Treffer
- springer netherlands 9 Treffer
- springer us 9 Treffer
- elsevier 8 Treffer
- informa uk limited 8 Treffer
- japan soc. applied phys 8 Treffer
- mdpi ag 8 Treffer
- springer singapore 8 Treffer
- the japan society of applied physics 8 Treffer
- institute of electronics, information and communications engineers (ieice) 7 Treffer
- springer berlin heidelberg 7 Treffer
- widerkehr & associates 7 Treffer
- american scientific publishers 6 Treffer
- world scientific pub co pte lt 6 Treffer
- edp sciences 5 Treffer
- hindawi limited 5 Treffer
- crc press 4 Treffer
- ieee / institute of electrical and electronics engineers incorporated:445 hoes lane:piscataway, nj 08854:(800)701-4333, (732)981-0060, email: subscription-service@ieee.org, internet: http://www.ieee.org, fax: (732)981-9667 4 Treffer
- inderscience publishers 4 Treffer
- institute of electrical and electronics engineers 4 Treffer
- institute of electrical engineers of japan (iee japan) 4 Treffer
- purdue university 4 Treffer
- arxiv 3 Treffer
- cambridge university press 3 Treffer
- ieee comput. soc 3 Treffer
- institute of advanced engineering and science 3 Treffer
- institute of electrical and electronics engineers inc. 3 Treffer
- multidisciplinary digital publishing institute 3 Treffer
- springer new york 3 Treffer
- the institute of electronics engineers of korea 3 Treffer
- acm 2 Treffer
- aip publishing llc 2 Treffer
- emerald 2 Treffer
Publikation
- ieee transactions on electron devices 277 Treffer
- ieee electron device letters 200 Treffer
- solid-state electronics 69 Treffer
- ieee transactions on nuclear science 67 Treffer
- japanese journal of applied physics 59 Treffer
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45 weitere Werte:
- microelectronic engineering 42 Treffer
- microelectronics reliability 32 Treffer
- ieee transactions on device and materials reliability 31 Treffer
- mrs proceedings 27 Treffer
- semiconductor science and technology 26 Treffer
- applied physics letters 24 Treffer
- spie proceedings 24 Treffer
- electronics letters 23 Treffer
- international electron devices meeting 1999. technical digest (cat. no.99ch36318) 22 Treffer
- international electron devices meeting. technical digest (cat. no.01ch37224) 21 Treffer
- ieee internationalelectron devices meeting, 2005. iedm technical digest. 19 Treffer
- 2007 ieee international electron devices meeting 18 Treffer
- ecs transactions 18 Treffer
- ieee transactions on nanotechnology 18 Treffer
- 2002 symposium on vlsi technology. digest of technical papers (cat. no.01ch37303) 17 Treffer
- 2001 symposium on vlsi technology. digest of technical papers (ieee cat. no.01 ch37184) 16 Treffer
- thin solid films 16 Treffer
- iedm technical digest. ieee international electron devices meeting, 2004. 15 Treffer
- journal of vacuum science & technology b: microelectronics and nanometer structures 15 Treffer
- 2009 international semiconductor device research symposium 14 Treffer
- digest of technical papers. 2004 symposium on vlsi technology, 2004. 14 Treffer
- digest. international electron devices meeting 14 Treffer
- journal of applied physics 14 Treffer
- 2013 ieee international electron devices meeting 13 Treffer
- aip conference proceedings 13 Treffer
- digest of technical papers. 2005 symposium on vlsi technology, 2005. 13 Treffer
- 2008 9th international conference on solid-state and integrated-circuit technology 12 Treffer
- international electron devices meeting 2000. technical digest. iedm (cat. no.00ch37138) 12 Treffer
- international electron devices meeting. iedm technical digest 12 Treffer
- journal of semiconductors 12 Treffer
- 1999 symposium on vlsi technology. digest of technical papers (ieee cat. no.99ch36325) 11 Treffer
- 2000 ieee international soi conference. proceedings (cat. no.00ch37125) 11 Treffer
- 2012 international electron devices meeting 11 Treffer
- ieee international electron devices meeting 2003 11 Treffer
- ieee journal of the electron devices society 11 Treffer
- ieee microwave and wireless components letters 11 Treffer
- ieee transactions on semiconductor manufacturing 11 Treffer
- international electron devices meeting 1998. technical digest (cat. no.98ch36217) 11 Treffer
- international semiconductor device research symposium, 2003 11 Treffer
- nuclear instruments and methods in physics research section a: accelerators, spectrometers, detectors and associated equipment 11 Treffer
- proceedings. 7th international conference on solid-state and integrated circuits technology, 2004. 11 Treffer
- 2000 symposium on vlsi technology. digest of technical papers (cat. no.00ch37104) 10 Treffer
- 2006 international electron devices meeting 10 Treffer
- 2008 ieee international electron devices meeting 10 Treffer
- 2009 ieee international electron devices meeting (iedm) 10 Treffer
Sprache
3.468 Treffer
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-12-01), S. 6592-6598Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-12-01), S. 6644-6647Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-08-01), S. 1660-1667Online unknownZugriff:
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In: IEEE Transactions on Circuits and Systems II: Express Briefs, Jg. 68 (2021-06-01), S. 1743-1747Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-05-01), S. 573-580Online unknownZugriff:
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In: IEEE Transactions on Circuits and Systems I: Regular Papers, Jg. 68 (2021-03-01), S. 1102-1113Online unknownZugriff:
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In: IEEE Sensors Journal, Jg. 21 (2021-02-15), S. 4755-4763Online unknownZugriff:
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In: Silicon, Jg. 14 (2021-01-07), S. 1169-1177Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 9 (2021), S. 415-423Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 42 (2021), S. 78-81Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 9 (2021), S. 995-1002Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 9 (2021), S. 691-703Online unknownZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 4 (2021), S. 18-21Online unknownZugriff:
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In: Journal of Nanoscience and Nanotechnology, Jg. 20 (2020-11-01), S. 6632-6637Online unknownZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 70 (2021), S. 1-10Online unknownZugriff:
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In: Silicon, Jg. 13 (2020-07-13), S. 1939-1949Online unknownZugriff:
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In: IEEE Access, Jg. 8 (2020), S. 215840-215850Online unknownZugriff:
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In: Materials Science Forum, Jg. 1004 (2020-07-01), S. 1123-1128Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 20 (2020-06-01), S. 459-467Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 67 (2020), S. 224-229Online unknownZugriff: