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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- materials science 1.105 Treffer
- bipolar junction transistor 701 Treffer
- law 676 Treffer
- law.invention 676 Treffer
- transistor 560 Treffer
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45 weitere Werte:
- chemistry 443 Treffer
- electrical and electronic engineering 388 Treffer
- common emitter 352 Treffer
- electrical engineering 350 Treffer
- electronic, optical and magnetic materials 253 Treffer
- chemistry.chemical_element 239 Treffer
- chemistry.chemical_compound 238 Treffer
- heterojunction bipolar transistor 229 Treffer
- heterojunction 227 Treffer
- condensed matter physics 198 Treffer
- silicon 181 Treffer
- doping 178 Treffer
- voltage 173 Treffer
- heterostructure-emitter bipolar transistor 165 Treffer
- hardware_integratedcircuits 120 Treffer
- hardware_performanceandreliability 112 Treffer
- electronic engineering 108 Treffer
- materials chemistry 101 Treffer
- cmos 96 Treffer
- 01 natural sciences 94 Treffer
- nuclear and high energy physics 94 Treffer
- breakdown voltage 93 Treffer
- gallium arsenide 90 Treffer
- general physics and astronomy 86 Treffer
- irradiation 86 Treffer
- epitaxy 85 Treffer
- 0103 physical sciences 83 Treffer
- diode 82 Treffer
- 02 engineering and technology 79 Treffer
- integrated circuit 76 Treffer
- 010302 applied physics 75 Treffer
- general engineering 75 Treffer
- silicon on insulator 75 Treffer
- wafer 68 Treffer
- current (fluid) 65 Treffer
- hardware_logicdesign 65 Treffer
- analytical chemistry 63 Treffer
- nuclear energy and engineering 63 Treffer
- electronic circuit 61 Treffer
- mosfet 59 Treffer
- substrate (electronics) 59 Treffer
- atomic and molecular physics, and optics 58 Treffer
- bicmos 58 Treffer
- fabrication 58 Treffer
- physics 55 Treffer
Verlag
- ieee 345 Treffer
- institute of electrical and electronics engineers (ieee) 157 Treffer
- elsevier bv 156 Treffer
- ire 61 Treffer
- aip publishing 59 Treffer
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45 weitere Werte:
- iop publishing 59 Treffer
- institution of engineering and technology (iet) 57 Treffer
- springer science and business media llc 35 Treffer
- spie 29 Treffer
- american vacuum society 19 Treffer
- wiley 19 Treffer
- informa uk limited 16 Treffer
- the electrochemical society 13 Treffer
- trans tech publications, ltd. 12 Treffer
- hal ccsd 11 Treffer
- springer berlin heidelberg 10 Treffer
- the japan society of applied physics 10 Treffer
- elsevier 8 Treffer
- aip 7 Treffer
- acta physica sinica, chinese physical society and institute of physics, chinese academy of sciences 5 Treffer
- american institute of physics 5 Treffer
- inst. electr. eng. japan 5 Treffer
- pleiades publishing ltd 5 Treffer
- edp sciences 4 Treffer
- institution of engineering & technology 4 Treffer
- springer international publishing 4 Treffer
- springer us 4 Treffer
- american scientific publishers 3 Treffer
- hindawi limited 3 Treffer
- ibm 3 Treffer
- imaps - international microelectronics assembly and packaging society 3 Treffer
- springer netherlands 3 Treffer
- springer new york 3 Treffer
- the institute of electronics engineers of korea 3 Treffer
- world scientific publishing company 3 Treffer
- asm international 2 Treffer
- author(s) 2 Treffer
- defense technical information center 2 Treffer
- hartung-gorre verlag 2 Treffer
- institute of electrical and electronics engineers 2 Treffer
- institute of image information and television engineers 2 Treffer
- kth, integrerade komponenter och kretsar 2 Treffer
- national library of serbia 2 Treffer
- science publications 2 Treffer
- springer nature 2 Treffer
- springer vienna 2 Treffer
- world scientific pub co pte lt 2 Treffer
- american association of physics teachers (aapt) 1 Treffer
- american chemical society (acs) 1 Treffer
- institute of electrical and electronics engineers inc. 1 Treffer
Publikation
- solid-state electronics 63 Treffer
- ieee transactions on electron devices 52 Treffer
- ieee transactions on nuclear science 51 Treffer
- electronics letters 48 Treffer
- applied physics letters 37 Treffer
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45 weitere Werte:
- microelectronics reliability 28 Treffer
- japanese journal of applied physics 26 Treffer
- spie proceedings 25 Treffer
- journal of applied physics 24 Treffer
- ieee electron device letters 21 Treffer
- journal of vacuum science & technology b: microelectronics and nanometer structures 16 Treffer
- mrs proceedings 16 Treffer
- nuclear instruments and methods in physics research section b: beam interactions with materials and atoms 12 Treffer
- nuclear instruments and methods in physics research section a: accelerators, spectrometers, detectors and associated equipment 11 Treffer
- aip conference proceedings 10 Treffer
- materials science forum 10 Treffer
- semiconductor science and technology 9 Treffer
- chinese physics b 8 Treffer
- ecs transactions 8 Treffer
- microelectronics journal 8 Treffer
- ire transactions on electron devices 7 Treffer
- microelectronic engineering 7 Treffer
- ieee transactions on device and materials reliability 6 Treffer
- international journal of electronics 6 Treffer
- international technical digest on electron devices meeting 6 Treffer
- journal of crystal growth 6 Treffer
- 1984 international electron devices meeting 5 Treffer
- 1986 international electron devices meeting 5 Treffer
- acta physica sinica 5 Treffer
- journal of semiconductors 5 Treffer
- proceedings of the 1992 bipolar/bicmos circuits and technology meeting 5 Treffer
- proceedings of the bipolar circuits and technology meeting 5 Treffer
- radiation effects and defects in solids 5 Treffer
- russian microelectronics 5 Treffer
- 1 4 Treffer
- 1966 international electron devices meeting 4 Treffer
- 1976 international electron devices meeting 4 Treffer
- 1977 international electron devices meeting 4 Treffer
- 2010 ieee bipolar/bicmos circuits and technology meeting (bctm) 4 Treffer
- analog integrated circuits and signal processing 4 Treffer
- iee proceedings -- optoelectronics 4 Treffer
- journal of the electrochemical society 4 Treffer
- physica status solidi (a) 4 Treffer
- physica status solidi c 4 Treffer
- proceedings of ieee bipolar/bicmos circuits and technology meeting 4 Treffer
- scientific reports 4 Treffer
- surface review & letters 3 Treffer
- i.e.e.e. transactions on electron devices 1 Treffer
- ieee international reliability physics symposium proceedings 1 Treffer
- physica e-low-dimensional systems & nanostructures 1 Treffer
Sprache
1.254 Treffer
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In: 2016 IEEE International Reliability Physics Symposium (IRPS), 2016-04-01, S. 1KonferenzZugriff:
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Dieser Titel kann aus lizenzrechtlichen Gründen nur im Campusnetz oder nach Anmeldung angezeigt werden!academicJournalZugriff:
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In: IEEE Access, Jg. 9 (2021), S. 16958-16966Online unknownZugriff:
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In: JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, Jg. 21 (2021-04-30), S. 101-108Online unknownZugriff:
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In: International Symposium for Testing and Failure Analysis, 2021-10-31Online unknownZugriff:
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In: IEEE Transactions on Industrial Electronics, Jg. 67 (2020-06-01), S. 4556-4566Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 41 (2020-03-01), S. 453-456Online unknownZugriff:
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In: 2021 43rd Annual EOS/ESD Symposium (EOS/ESD), 2021-09-26Online unknownZugriff:
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In: 2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA), 2021-08-01Online unknownZugriff:
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In: Radiation Effects and Defects in Solids, Jg. 174 (2019-09-20), S. 859-872Online unknownSiehe Detailanzeige für VolltextZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-07-01), S. 1566-1573Online unknownZugriff:
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In: Chinese Physics B, Jg. 30 (2021-07-01), S. 078502-78502Online unknownZugriff:
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In: Optical Materials, Jg. 121 (2021-11-01), S. 111501-111501Online unknownZugriff:
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In: Radiation Effects and Defects in Solids, Jg. 172 (2017-12-02), S. 952-963Online unknownSiehe Detailanzeige für VolltextZugriff:
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In: 2020 Photonics North (PN), 2020-05-01Online unknownZugriff:
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In: Iranian Journal of Science and Technology, Transactions A:, Jg. 43 (2018-06-20), S. 2613-2617Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 6 (2018), S. 537-542Online unknownZugriff:
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In: Physics Education, Jg. 56 (2021-05-14), S. 043008-43008Online unknownZugriff:
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In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 409 (2017-10-01), S. 246-250Online unknownZugriff: