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- aluminium compounds 6 Treffer
- electronic circuits 6 Treffer
- hardening 6 Treffer
- microelectronic circuits 6 Treffer
- radiation hardening 6 Treffer
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45 weitere Werte:
- testing 6 Treffer
- 46 instrumentation related to nuclear science and technology 5 Treffer
- aluminium oxides 5 Treffer
- mos transistors 5 Treffer
- semiconductor devices 5 Treffer
- silicon compounds 5 Treffer
- silicon oxides 5 Treffer
- transistors 440200* -- radiation effects on instrument components, instruments, or electronic systems 5 Treffer
- 360206 -- ceramics, cermets, & refractories-- radiation effects 4 Treffer
- 36 materials science integrated circuits 2 Treffer
- 46 instrumentation related to nuclear science and technology integrated circuits 2 Treffer
- ionizing radiations 2 Treffer
- radiations 2 Treffer
- testing 440200* -- radiation effects on instrument components, instruments, or electronic systems 2 Treffer
- 36 materials science 1 Treffer
- 36 materials science aluminium oxides 1 Treffer
- 36 materials science semiconductor devices 1 Treffer
- 360605 -- materials-- radiation effects 1 Treffer
- 42 engineering integrated circuits 1 Treffer
- 426000 -- engineering-- components, electron devices & circuits-- (1990-) 1 Treffer
- alkali metals 1 Treffer
- automation 1 Treffer
- computer calculations 1 Treffer
- computerized simulation 1 Treffer
- corundum 1 Treffer
- currents 1 Treffer
- design 1 Treffer
- dielectric materials 1 Treffer
- dose rates 1 Treffer
- electric conductivity 1 Treffer
- electric currents 1 Treffer
- electrical properties 1 Treffer
- electromagnetic radiation 1 Treffer
- elements 1 Treffer
- environmental effects 1 Treffer
- fabrication 1 Treffer
- impact shock 1 Treffer
- impact tests 1 Treffer
- integrated circuits 1 Treffer
- irradiation 1 Treffer
- leakage current 1 Treffer
- lithium 1 Treffer
- low temperature 1 Treffer
- manufacturing 1 Treffer
- materials testing 1 Treffer
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8 Treffer
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1977Online Konferenz
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1976Online academicJournal