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- dark current 28 Treffer
- radiation effects 27 Treffer
- cmos image sensors 26 Treffer
- complementary metal oxide semiconductors 26 Treffer
- image sensors 18 Treffer
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45 weitere Werte:
- total ionizing dose (tid) 17 Treffer
- pinned photodiode (ppd) 14 Treffer
- cmos image sensor (cis) 13 Treffer
- logic gates 12 Treffer
- active pixel sensors 11 Treffer
- ionizing radiation 11 Treffer
- protons 11 Treffer
- detectors 9 Treffer
- silicon 9 Treffer
- image converters 8 Treffer
- neutrons 8 Treffer
- degradation 7 Treffer
- gamma rays 7 Treffer
- interface states 7 Treffer
- radiation 7 Treffer
- radiation damage 7 Treffer
- radiation hardening 7 Treffer
- random telegraph signal (rts) 7 Treffer
- active pixel sensor (aps) 6 Treffer
- charge transfer 6 Treffer
- irradiation 6 Treffer
- monolithic active pixel sensor (maps) 6 Treffer
- pixels 6 Treffer
- shallow trench isolation (sti) 6 Treffer
- trapped charge 6 Treffer
- annealing 5 Treffer
- avalanche photodiodes 5 Treffer
- cis 5 Treffer
- cmos 5 Treffer
- dark currents (electric) 5 Treffer
- integrated circuits 5 Treffer
- ionizing radiation dosage 5 Treffer
- quantum efficiency 5 Treffer
- radiation hardening (electronics) 5 Treffer
- x-rays 5 Treffer
- activation energy 4 Treffer
- aps 4 Treffer
- displacement damage dose (ddd) 4 Treffer
- integrated circuit 4 Treffer
- layout 4 Treffer
- neutron irradiation 4 Treffer
- radiation hard 4 Treffer
- transistors 4 Treffer
- active pixel sensors (aps) 3 Treffer
- arrays 3 Treffer
Verlag
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50 Treffer
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-08-01), Heft 8, S. 1861-1868Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-08-01), Heft 8, S. 1835-1845Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-07-01), Heft 7, S. 1256-1262Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-02-01), Heft 2, S. 268-277Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-07-01), Heft 7, S. 1241-1250Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-07-01), Heft 7, S. 1671-1681Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-09-01), Heft 9, S. 2367-2374Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 38-44Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 45-53Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 65 (2018-06-01), Heft 6, S. 1264-1270Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-03-01), Heft 3, S. 616-624Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 66 (2019), Heft 1, S. 111-119Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 27-37Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 63 (2016-08-01), Heft a4, S. 2183-2192Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 65 (2018), Heft 1, S. 92-100Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 65 (2018), Heft 1, S. 84-91Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 65 (2018), Heft 1, S. 101-110Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 59 (2012-04-15), Heft 4, S. 918-926Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017-10-01), Heft 10, S. 2678-2682Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 62 (2015-12-01), Heft 6a, S. 2956-2964Online academicJournalZugriff: