Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- components, circuits, devices and systems 7 Treffer
- insulation 4 Treffer
- mosfet circuits 4 Treffer
- communication, networking and broadcast technologies 3 Treffer
- computing and processing 3 Treffer
-
45 weitere Werte:
- fields, waves and electromagnetics 3 Treffer
- power mosfet 3 Treffer
- temperature 3 Treffer
- voltage 3 Treffer
- aerospace 2 Treffer
- bioengineering 2 Treffer
- charge carrier lifetime 2 Treffer
- gallium arsenide 2 Treffer
- geoscience 2 Treffer
- high speed optical techniques 2 Treffer
- insulated gate bipolar transistors 2 Treffer
- photodetectors 2 Treffer
- p-i-n diodes 2 Treffer
- power electronics 2 Treffer
- power, energy and industry applications 2 Treffer
- robotics and control systems 2 Treffer
- signal processing and analysis 2 Treffer
- testing 2 Treffer
- thyristors 2 Treffer
- 2d materials 1 Treffer
- biological neural networks 1 Treffer
- bipolar transistors 1 Treffer
- boron 1 Treffer
- charge carrier processes 1 Treffer
- circuits 1 Treffer
- cmos 1 Treffer
- conductivity 1 Treffer
- current density 1 Treffer
- current measurement 1 Treffer
- current supplies 1 Treffer
- dark current 1 Treffer
- dielectrics and electrical insulation 1 Treffer
- dynamic range 1 Treffer
- electric resistance 1 Treffer
- electric variables 1 Treffer
- electron mobility 1 Treffer
- electrons 1 Treffer
- engineering profession 1 Treffer
- fabrication 1 Treffer
- fefet 1 Treffer
- fefets 1 Treffer
- field effect transistor (fet) 1 Treffer
- field effect transistors 1 Treffer
- frame rate 1 Treffer
- frames per second 1 Treffer
Verlag
Publikation
- 1984 international electron devices meeting, electron devices meeting, 1984 international, iedm tech. dig. 2 Treffer
- [1987] nasecode v: proceedings of the fifth international conference on the numerical analysis of semiconductor devices and integrated circuits, numerical analysis of semiconductor devices and integrated circuits, 1987. nasecode v. proceedings of the fifth international conference on the 1 Treffer
- 1983 international electron devices meeting, electron devices meeting, 1983 international, iedm tech. dig. 1 Treffer
- 1985 international electron devices meeting, electron devices meeting, 1985 international, iedm tech. dig. 1 Treffer
- 1996 ieee mtt-s international microwave symposium digest, microwave symposium digest, 1996., ieee mtt-s international, microwave symposium 1 Treffer
- 3 weitere Werte:
9 Treffer
-
In: IEEE Access, Jg. 12 (2024), S. 54019-54048Online academicJournalZugriff:
-
In: 1984 International Electron Devices Meeting, 1984, S. 278-281KonferenzZugriff:
-
In: TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON), 2019-10-01, S. 2143-2147KonferenzZugriff:
-
In: 1983 International Electron Devices Meeting, 1983, S. 83-86KonferenzZugriff:
-
In: 1984 International Electron Devices Meeting, 1984, S. 274-277KonferenzZugriff:
-
In: 1985 International Electron Devices Meeting, 1985, S. 146-149KonferenzZugriff:
-
In: [1987] NASECODE V: Proceedings of the Fifth International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits, 1987, S. 1-18KonferenzZugriff:
-
In: 1996 IEEE MTT-S International Microwave Symposium Digest, Jg. 2 (1996), S. 915-918KonferenzZugriff:
-
In: IEEE Photonics Technology Letters, Jg. 7 (1995-12-01), Heft 12, S. 1483-1485Online academicJournalZugriff: