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8 Treffer
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In: IEEE Transactions on Microwave Theory and Techniques, Jg. 68 (2020-05-01), S. 1754-1762Online unknownZugriff:
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A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuitsIn: Solid-State Electronics, Jg. 91 (2014), S. 81-86Online unknownZugriff:
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In: Russian Microelectronics, Jg. 39 (2010), S. 54-62Online unknownZugriff:
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In: IEEE Transactions on Semiconductor Manufacturing, Jg. 11 (1998), S. 575-582Online unknownZugriff:
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In: Solid-State Electronics, Jg. 46 (2002-03-01), S. 315-320Online unknownZugriff:
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In: ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures, 2002-12-30Online unknownZugriff: