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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- electronics 48 Treffer
- electronique 48 Treffer
- applied sciences 40 Treffer
- sciences appliquees 40 Treffer
- optics 35 Treffer
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45 weitere Werte:
- optique 35 Treffer
- electronique des semiconducteurs. microelectronique. optoelectronique. dispositifs a l'etat solide 25 Treffer
- semiconductor electronics. microelectronics. optoelectronics. solid state devices 25 Treffer
- fabricacion microelectrica 18 Treffer
- fabrication microelectronique 18 Treffer
- microelectronic fabrication 18 Treffer
- domaines classiques de la physique (y compris les applications) 17 Treffer
- fabrication microelectronique (technologie des materiaux et des surfaces) 17 Treffer
- fundamental areas of phenomenology (including applications) 17 Treffer
- microelectronic fabrication (materials and surfaces technology) 17 Treffer
- etude experimentale 16 Treffer
- experimental study 16 Treffer
- pastille electronique 14 Treffer
- condensed state physics 13 Treffer
- metallurgie, soudage 13 Treffer
- metallurgy, welding 13 Treffer
- physique de l'etat condense 13 Treffer
- general 12 Treffer
- generalites 12 Treffer
- instruments, apparatus, components and techniques common to several branches of physics and astronomy 12 Treffer
- instruments, appareillage, composants et techniques communs a plusieurs branches de la physique et de l'astronomie 12 Treffer
- pastilla electronica 12 Treffer
- wafer 12 Treffer
- circuits integres 11 Treffer
- condensed matter: electronic structure, electrical, magnetic, and optical properties 11 Treffer
- etat condense: structure electronique, proprietes electriques, magnetiques et optiques 11 Treffer
- integrated circuits 11 Treffer
- conception. technologies. analyse fonctionnement. essais 10 Treffer
- cross-disciplinary physics: materials science; rheology 10 Treffer
- design. technologies. operation analysis. testing 10 Treffer
- domaines interdisciplinaires: science des materiaux; rheologie 10 Treffer
- materials science 10 Treffer
- science des materiaux 10 Treffer
- telecommunications 10 Treffer
- compose mineral 9 Treffer
- cristallographie cristallogenese 9 Treffer
- crystallography 9 Treffer
- lithographie 9 Treffer
- lithography 9 Treffer
- litografia 9 Treffer
- metrologie et instrumentation 9 Treffer
- metrology and instrumentation 9 Treffer
- critical size 8 Treffer
- evaluacion prestacion 8 Treffer
- evaluation performance 8 Treffer
Verlag
- spie 27 Treffer
- elsevier 11 Treffer
- elsevier science 9 Treffer
- springer 6 Treffer
- wiley-vch 4 Treffer
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10 weitere Werte:
- institute of physics 3 Treffer
- hanser 2 Treffer
- institute of electrical and electronics engineers 2 Treffer
- springer-vdi 2 Treffer
- american institute of physics 1 Treffer
- american society of mechanical engineers 1 Treffer
- electrochemical society 1 Treffer
- is&t 1 Treffer
- kluwer academic publishers 1 Treffer
- optical society of america 1 Treffer
Publikation
- proceedings of spie, the international society for optical engineering 17 Treffer
- spie proceedings series 7 Treffer
- journal of the european ceramic society 4 Treffer
- thin solid films 4 Treffer
- advances in resist technology and processing xxiii (20-22 february 2006, san jose, california, usa) 3 Treffer
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45 weitere Werte:
- data analysis and modeling for process control iii (23 february 2006, san jose, california, usa) 3 Treffer
- metrology, inspection, and process control for microlithography xix (san jose ca, 7-10 march 2005) 3 Treffer
- metrology, inspection, and process control for microlithography xx (20-23 february 2006, san jose, california, usa) 3 Treffer
- microelectronic engineering 3 Treffer
- photomask technology 2006 (19-22 september, 2006, monterey, california, usa) 3 Treffer
- physica status solidi. a. applied research 3 Treffer
- icns 4: fourth international conference on nitride semiconductors, denver, colorado, usa, july 16-20, 2001. (part a.1) 2 Treffer
- journal of sound and vibration 2 Treffer
- konstruktion (1981) 2 Treffer
- optical microlithography xix (21-24 february 2006, san jose, california, usa) 2 Treffer
- photomask and next-generation lithography mask technology xii (13-15 april 2005, yokohama, japan) 2 Treffer
- praktische metallographie 2 Treffer
- the european physical journal. a, hadrons and nuclei 2 Treffer
- 0annual bacus symposium on photomask technology 1 Treffer
- 0color imaging twelve 1 Treffer
- 0lasers, applications, and technologies 2005 1 Treffer
- 25th annual bacus symposium on photomask technology (4-7 october, 2006, monterey, california, usa) 1 Treffer
- advanced short-time thermal processing for si-based cmos devices (paris, 27 april - 2 may 2003) 1 Treffer
- applied surface science 1 Treffer
- automated media analysis and production for novel tv services 1 Treffer
- chemieingenieurtechnik 1 Treffer
- color imaging ix : processing, hardcopy, and applications (san jose ca, 20-22 january 2004) 1 Treffer
- color imaging x : processing, hardcopy, and applications (san jose ca, 17-20 january 2005) 1 Treffer
- color imaging xi (processing, hardcopy, and applications) 1 Treffer
- color imaging xii (processing, hardcopy, and applications) 1 Treffer
- cooperative research center on integrated mechatronic systems (imes) 1 Treffer
- european journal of mechanics. a. solids 1 Treffer
- high-power lasers and applications 1 Treffer
- ieee transactions on magnetics 1 Treffer
- ieee transactions on ultrasonics, ferroelectrics, and frequency control 1 Treffer
- in-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing ii (edinburgh, 31 may - 1 june 2001) 1 Treffer
- international discussion meeting on chemistry approaches to high-tc superconductive materials / 5th international workshop on chemical designing and processing of high-tc superconductors (chem-htsc-v) 1 Treffer
- journal of electroceramics 1 Treffer
- journal of engineering materials and technology 1 Treffer
- journal of materials science letters 1 Treffer
- journal of physics. b. atomic, molecular and optical physics (print) 1 Treffer
- journal of physics. d, applied physics (print) 1 Treffer
- journal of physics. e. scientific instruments 1 Treffer
- mechatronics (oxford) 1 Treffer
- microsystem technologies 1 Treffer
- microwave materials and their applications 2000 1 Treffer
- multimedia computing and networking 2000 (san jose ca, 24-26 january 2000) 1 Treffer
- multimedia tools and applications 1 Treffer
- optical review 1 Treffer
- optics and laser technology 1 Treffer
Sprache
72 Treffer
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In: International Discussion Meeting on Chemistry Approaches to High-Tc Superconductive Materials / 5th International Workshop on Chemical Designing and Processing of High-Tc Superconductors (Chem-HTSC-V), Jg. 338 (2000), Heft 1-2, S. 52-59KonferenzZugriff:
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academicJournalZugriff:
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In: Proceedings of Symposium J on Synthesis Processing and Characterization of Nanoscale Functional Oxide Films - EMRS 2006 Conference, Nice, May 29-June 2, Jg. 515 (2007), Heft 16, S. 6447-6451KonferenzZugriff:
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In: Proceedings of the 32nd International Conference on Micro- and Nano-Engineering, Barcelona, 17-20 September 2006, Jg. 84 (2007), Heft 5-8, S. 1033-1036KonferenzZugriff:
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In: Color imaging X : processing, hardcopy, and applications (San Jose CA, 17-20 January 2005), 2005, S. 473-480KonferenzZugriff:
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In: Color imaging IX : processing, hardcopy, and applications (San Jose CA, 20-22 January 2004), 2004, S. 75-80KonferenzZugriff:
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In: Advanced short-time thermal processing for Si-based CMOS devices (Paris, 27 April - 2 May 2003), 2003, S. 385-390KonferenzZugriff:
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In: Automated Media Analysis and Production for Novel TV Services, Jg. 63 (2013), Heft 2, S. 287-329Online academicJournalZugriff:
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In: Proceedings: 4th International Symposium on Blue Lasers and Light Emitting Diodes (ISBLLED2002), CÓrdoba, Spain, March 11-15, Jg. 192 (2002), Heft 2, S. 301-307Online KonferenzZugriff:
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In: Cooperative Research Center on Integrated Mechatronic Systems (IMES), Jg. 12 (2002), Heft 8, S. 1023-1033KonferenzZugriff:
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In: In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II (Edinburgh, 31 May - 1 June 2001), 2001, S. 21-30KonferenzZugriff:
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In: ICNS 4: Fourth International Conference on Nitride Semiconductors, Denver, Colorado, USA, July 16-20, 2001. (Part A.1), Jg. 188 (2001), Heft 1, S. 65-68Online KonferenzZugriff:
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In: ICNS 4: Fourth International Conference on Nitride Semiconductors, Denver, Colorado, USA, July 16-20, 2001. (Part A.1), Jg. 188 (2001), Heft 1, S. 109-112Online KonferenzZugriff:
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In: Microwave Materials and their Applications 2000, Jg. 21 (2001), Heft 15, S. 2647-2651KonferenzZugriff:
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In: Proceedings of the 6th International Conference on Plasma Surface Engineering, Garmisch-Partenkirchen, Germany, September 14-18, 1998, Jg. 116-19 (1999), S. 456-460KonferenzZugriff:
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In: Optical review, Jg. 16 (2009), Heft 6, S. 583-586Online academicJournalZugriff:
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In: European journal of mechanics. A. Solids, Jg. 28 (2009), Heft 3, S. 526-534academicJournalZugriff:
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In: Journal of sound and vibration, Jg. 326 (2009), Heft 3-5, S. 623-632academicJournalZugriff:
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In: Microelectronic engineering, Jg. 86 (2009), Heft 12, S. 2408-2411academicJournalZugriff:
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In: Microsystem technologies, Jg. 15 (2009), Heft 3, S. 471-476Online academicJournalZugriff: