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Weniger Treffer
Gefunden in
Schlagwort
- materials science 28 Treffer
- nmos logic 28 Treffer
- optoelectronics 28 Treffer
- law 24 Treffer
- law.invention 24 Treffer
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45 weitere Werte:
- cmos 21 Treffer
- transistor 20 Treffer
- electrical and electronic engineering 12 Treffer
- mosfet 12 Treffer
- doping 10 Treffer
- voltage 10 Treffer
- engineering 9 Treffer
- electronic, optical and magnetic materials 8 Treffer
- hardware_integratedcircuits 8 Treffer
- hardware_performanceandreliability 8 Treffer
- threshold voltage 7 Treffer
- hardware_logicdesign 6 Treffer
- leakage (electronics) 6 Treffer
- very-large-scale integration 6 Treffer
- electronic engineering 4 Treffer
- electrostatic discharge 4 Treffer
- gate oxide 4 Treffer
- integrated circuit 4 Treffer
- bicmos 3 Treffer
- chemistry 3 Treffer
- fabrication 3 Treffer
- ion implantation 3 Treffer
- ldmos 3 Treffer
- logic gate 3 Treffer
- polycide 3 Treffer
- static random-access memory 3 Treffer
- subthreshold conduction 3 Treffer
- transconductance 3 Treffer
- bipolar junction transistor 2 Treffer
- breakdown voltage 2 Treffer
- chemistry.chemical_element 2 Treffer
- chip 2 Treffer
- condensed matter physics 2 Treffer
- electronic circuit 2 Treffer
- field-effect transistor 2 Treffer
- hardware_general 2 Treffer
- interconnection 2 Treffer
- nand gate 2 Treffer
- radio frequency 2 Treffer
- resistor 2 Treffer
- salicide 2 Treffer
- thin-film transistor 2 Treffer
- activation energy 1 Treffer
- and gate 1 Treffer
- application-specific integrated circuit 1 Treffer
Verlag
Publikation
- ieee transactions on electron devices 6 Treffer
- 1984 international electron devices meeting 2 Treffer
- sid symposium digest of technical papers 2 Treffer
- spie proceedings 2 Treffer
- 12th international symposium on power semiconductor devices & ics. proceedings (cat. no.00ch37094) 1 Treffer
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20 weitere Werte:
- 1986 international electron devices meeting 1 Treffer
- 1990 37th ieee international conference on solid-state circuits 1 Treffer
- 2003 international symposium on vlsi technology, systems and applications. proceedings of technical papers. (ieee cat. no.03th8672) 1 Treffer
- 2010 proceedings of the european solid state device research conference 1 Treffer
- 2012 proceedings of the european solid-state device research conference (essderc) 1 Treffer
- 30th annual proceedings reliability physics 1992 1 Treffer
- electrical engineering in japan 1 Treffer
- electronics letters 1 Treffer
- ieee journal of solid-state circuits 1 Treffer
- journal of information display 1 Treffer
- microelectronics reliability 1 Treffer
- proceedings of 1994 ieee international electron devices meeting 1 Treffer
- proceedings of eighth international application specific integrated circuits conference 1 Treffer
- proceedings of the 14th international symposium on power semiconductor devices and ics 1 Treffer
- proceedings of the 2005 international conference on microelectronic test structures, 2005. icmts 2005. 1 Treffer
- proceedings of the 20th ieee international symposium on the physical and failure analysis of integrated circuits (ipfa) 1 Treffer
- proceedings of the 30th european solid-state circuits conference 1 Treffer
- proceedings of the eleventh biennial university/government/ industry microelectronics symposium 1 Treffer
- scs 2003. international symposium on signals, circuits and systems. proceedings (cat. no.03ex720) 1 Treffer
- solid-state electronics 1 Treffer
Sprache
36 Treffer
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In: IEEE Transactions on Electron Devices, Jg. 57 (2010-06-01), S. 1319-1326Online unknownZugriff:
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In: Journal of Information Display, Jg. 8 (2007), S. 1-5Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 38 (1991), S. 39-46Online unknownZugriff:
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In: 30th Annual Proceedings Reliability Physics 1992, 1992Online unknownZugriff:
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In: SID Symposium Digest of Technical Papers, Jg. 34 (2003), S. 1318-1318Online unknownZugriff:
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In: Electrical Engineering in Japan, Jg. 121 (1997-12-01), S. 56-64Online unknownZugriff:
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In: 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC), 2012-09-01Online unknownZugriff:
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In: SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720), 2004-05-06Online unknownZugriff:
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In: Proceedings of 1994 IEEE International Electron Devices Meeting, 2002-12-17Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 34 (1987), S. 8-18Online unknownZugriff:
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In: Solid-State Electronics, 2011-11-01, S. 45-50Online unknownZugriff:
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In: 1984 International Electron Devices Meeting, 1984Online unknownZugriff:
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In: 1986 International Electron Devices Meeting, 1986Online unknownZugriff:
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In: 1984 International Electron Devices Meeting, 1984Online unknownZugriff:
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In: Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2013-07-01Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 38 (1998-04-01), S. 619-639Online unknownZugriff:
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In: 2010 Proceedings of the European Solid State Device Research Conference, 2010-09-01Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 38 (1991-04-01), S. 876-886Online unknownZugriff:
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In: Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS, 2005-07-28Online unknownZugriff:
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In: Proceedings of the 30th European Solid-State Circuits Conference, 2004-11-22Online unknownZugriff: