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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- complementary mos technology 22 Treffer
- technologie mos complementaire 22 Treffer
- tecnologia mos complementario 22 Treffer
- fiabilidad 13 Treffer
- fiabilite 13 Treffer
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45 weitere Werte:
- reliability 13 Treffer
- seuil tension 12 Treffer
- umbral tension 12 Treffer
- voltage threshold 12 Treffer
- contrainte electrique 11 Treffer
- electric stress 11 Treffer
- evaluacion prestacion 11 Treffer
- evaluation performance 11 Treffer
- nmos technology 11 Treffer
- performance evaluation 11 Treffer
- technologie nmos 11 Treffer
- tecnologia nmos 11 Treffer
- tension electrica 11 Treffer
- contrainte thermique 10 Treffer
- tension termica 10 Treffer
- thermal stress 10 Treffer
- grille transistor 9 Treffer
- rejilla transistor 9 Treffer
- transistor gate 9 Treffer
- gate oxide 7 Treffer
- oxido rejilla 7 Treffer
- oxyde grille 7 Treffer
- circuit integre cmos 6 Treffer
- cmos integrated circuits 6 Treffer
- couche ultramince 6 Treffer
- ultrathin films 6 Treffer
- appareillage electronique et fabrication. composants passifs, circuits imprimes, connectique 5 Treffer
- degradation 5 Treffer
- electronic equipment and fabrication. passive components, printed wiring boards, connectics 5 Treffer
- hot carrier 5 Treffer
- instabilite thermique de la polarisation negative 5 Treffer
- inverter 5 Treffer
- negative bias temperature instability 5 Treffer
- ondulador 5 Treffer
- onduleur 5 Treffer
- pastilla electronica 5 Treffer
- pastille electronique 5 Treffer
- portador caliente 5 Treffer
- porteur chaud 5 Treffer
- wafer 5 Treffer
- circuit design 4 Treffer
- circuit properties 4 Treffer
- circuits electriques, optiques et optoelectroniques 4 Treffer
- circuits electroniques 4 Treffer
- conception circuit 4 Treffer
Verlag
Publikation
- i.e.e.e. transactions on electron devices 8 Treffer
- ieee electron device letters 4 Treffer
- microelectronics and reliability 4 Treffer
- 17th european symposium on reliability of electron devices, failure physics and analysis (esref 2006), wuppertal, germany, 3-6 october 2006 2 Treffer
- 2004 ieee international integrated reliability workshop (final report) 2 Treffer
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9 weitere Werte:
- 2004 symposium on vlsi technology (digest of technical papers) 2 Treffer
- 3rd international sige technology and device meeting (princeton, new jersey, 15-17 may 2006) 2 Treffer
- semiconductor science and technology 2 Treffer
- 2004 24th internationcal conference on microelectronics (nis, serbia and montenegro, 16-19 may 20) 1 Treffer
- 2004 ieee international reliability physics symposium proceedings, 42nd annual (phoenix az, 25-29 april 2004) 1 Treffer
- electronics letters 1 Treffer
- ieee microwave and wireless components letters 1 Treffer
- ieee transactions on nanotechnology 1 Treffer
- proceedings of the 11th international symposium on the physical & failure analysis of integrated circuits (ipfa 2004) 1 Treffer
Sprache
28 Treffer
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In: 2004 IEEE international reliability physics symposium proceedings, 42nd annual (Phoenix AZ, 25-29 April 2004), 2004, S. 110-116KonferenzZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 51 (2004), Heft 10, S. 1621-1627Online academicJournalZugriff:
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In: IEEE microwave and wireless components letters, Jg. 16 (2006), Heft 4, S. 182-184Online academicJournalZugriff:
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In: 17th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2006), Wuppertal, Germany, 3-6 October 2006, Jg. 46 (2006), Heft 9-11, S. 1669-1672KonferenzZugriff:
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In: Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits (IPFA 2004), 2004, S. 279-282KonferenzZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 56 (2009), Heft 12, S. 3149-3159Online academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 45 (2005), Heft 3-4, S. 487-492academicJournalZugriff:
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In: 3rd International SiGe Technology and Device Meeting (Princeton, New Jersey, 15-17 May 2006), Jg. 22 (2007), Heft 1Online KonferenzZugriff:
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In: 2004 24th internationcal conference on microelectronics (Nis, Serbia and Montenegro, 16-19 May 20), 2004KonferenzZugriff:
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In: 2004 Symposium on VLSI Technology (digest of technical papers), , S. 176-177KonferenzZugriff:
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In: 2004 IEEE International Integrated Reliability Workshop (final report), 2004, S. 32-36KonferenzZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 60 (2013), Heft 1, S. 109-116Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 55 (2008), Heft 9, S. 2454-2461Online academicJournalZugriff:
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In: IEEE electron device letters, Jg. 33 (2012), Heft 2, S. 137-139Online academicJournalZugriff:
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In: IEEE electron device letters, Jg. 29 (2008), Heft 6, S. 618-620Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 53 (2006), Heft 11, S. 2816-2823Online academicJournalZugriff:
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In: 17th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2006), Wuppertal, Germany, 3-6 October 2006, Jg. 46 (2006), Heft 9-11, S. 1858-1863KonferenzZugriff:
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In: 2004 IEEE International Integrated Reliability Workshop (final report), 2004, S. 199-211KonferenzZugriff:
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In: IEEE transactions on nanotechnology, Jg. 10 (2011), Heft 5, S. 1053-1058Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 57 (2010), Heft 10, S. 2515-2525Online academicJournalZugriff: