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- analog-to-digital converter (adc) 5 Treffer
- capacitors 4 Treffer
- delays 4 Treffer
- solid state circuits 4 Treffer
- calibration 3 Treffer
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45 weitere Werte:
- clocks 3 Treffer
- gain 3 Treffer
- phase locked loops 3 Treffer
- switches 3 Treffer
- voltage-controlled oscillators 3 Treffer
- current measurement 2 Treffer
- finite impulse response filters 2 Treffer
- frequency modulation 2 Treffer
- jitter 2 Treffer
- linearity 2 Treffer
- modulation 2 Treffer
- multi-stage noise shaping 2 Treffer
- prototypes 2 Treffer
- registers 2 Treffer
- signal resolution 2 Treffer
- transfer functions 2 Treffer
- tuning 2 Treffer
- 0.2 v 1 Treffer
- adaptive filters 1 Treffer
- adaptive resolution (ar) 1 Treffer
- all-digital pll (adpll) 1 Treffer
- analog-digital conversion 1 Treffer
- analog-to-digital converter 1 Treffer
- asynchronous sar adc 1 Treffer
- background calibration 1 Treffer
- bang-bang 1 Treffer
- cascaded phase-locked loop (pll) 1 Treffer
- cascades 1 Treffer
- compressed sensing 1 Treffer
- compute-in-memory 1 Treffer
- computer architecture 1 Treffer
- continuous-time (ct) 1 Treffer
- continuous-time delta-sigma adc 1 Treffer
- current-controlled oscillator 1 Treffer
- cyclic adc 1 Treffer
- deep-subthreshold 1 Treffer
- delta-sigma 1 Treffer
- delta-sigma modulation 1 Treffer
- digital phase-locked loop (dpll) 1 Treffer
- dual feedback 1 Treffer
- energy efficiency 1 Treffer
- engines 1 Treffer
- event-based signal processing 1 Treffer
- event-driven 1 Treffer
- extended counting 1 Treffer
14 Treffer
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In: IEEE Solid-State Circuits Letters, Jg. 3 (2020), S. 214-217Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 1 (2018-09-01), Heft 9, S. 190-193Online academicJournalZugriff:
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An Adaptive-Resolution Quasi-Level-Crossing-Sampling ADC Based on Residue Quantization in 28-nm CMOSIn: IEEE Solid-State Circuits Letters, Jg. 1 (2018-08-01), Heft 8, S. 178-181Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 7 (2024), S. 70-73Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 5 (2022), S. 122-125Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 3 (2020), S. 29-32Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 3 (2020), S. 126-129Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 3 (2020), S. 174-177Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 3 (2020), S. 398-401Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 3 (2020), S. 534-537Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 1 (2018-11-01), Heft 11, S. 207-210Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 1 (2018-10-01), Heft 10, S. 194-197Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 1 (2018-05-01), Heft 5, S. 114-114Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 1 (2018-04-01), Heft 4, S. 78-78Online academicJournalZugriff: