Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- complementary metal oxide semiconductors 58 Treffer
- sram 23 Treffer
- radiation effects 22 Treffer
- single event effects 20 Treffer
- heavy ions 17 Treffer
-
45 weitere Werte:
- single event upsets 17 Treffer
- integrated circuits 14 Treffer
- neutrons 14 Treffer
- single event upset 14 Treffer
- static random access memory 14 Treffer
- cmos integrated circuits 11 Treffer
- cmos 10 Treffer
- protons 10 Treffer
- radiation hardening (electronics) 10 Treffer
- radiation 9 Treffer
- sram chips 9 Treffer
- transistors 9 Treffer
- cmos technology 8 Treffer
- digital electronics 8 Treffer
- monte carlo method 8 Treffer
- single-event upset (seu) 8 Treffer
- computer storage devices 7 Treffer
- logic circuits 7 Treffer
- sensitivity 7 Treffer
- seu 7 Treffer
- single event upset (seu) 7 Treffer
- static random access memory (sram) 7 Treffer
- electric potential 6 Treffer
- error rates 6 Treffer
- irradiation 6 Treffer
- monte carlo methods 6 Treffer
- silicon-on-insulator technology 6 Treffer
- simulation methods & models 6 Treffer
- single-event upset 6 Treffer
- field programmable gate arrays 5 Treffer
- ionization (atomic physics) 5 Treffer
- reliability 5 Treffer
- silicon 5 Treffer
- testing 5 Treffer
- alpha particles 4 Treffer
- alpha rays 4 Treffer
- error analysis 4 Treffer
- layout 4 Treffer
- mesons 4 Treffer
- soft error 4 Treffer
- soft errors 4 Treffer
- srams 4 Treffer
- static random access memory chips 4 Treffer
- bit error rate 3 Treffer
- capacitors 3 Treffer
Sprache
Geographischer Bezug
85 Treffer
-
In: IEEE Transactions on Nuclear Science, Jg. 62 (2015-12-15), Heft 6b, S. 3353-3361Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 62 (2015-12-01), Heft 6a, S. 2860-2866Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 61 (2014-08-01), Heft 4, S. 1575-1582Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 64 (2017-01-15), Heft 1, part 2, S. 654-664Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 60 (2013-12-01), Heft 6, S. 4184-4191Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 61 (2014-12-01), Heft 6, S. 3055-3060Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 58 (2011-12-01), Heft 6, S. 2761-2767Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 57 (2010-12-01), Heft 6, S. 3602-3608Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 58 (2011-04-01), Heft 2, S. 506-515Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 55 (2008-12-01), Heft 6, S. 3367-3374Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 54 (2007-12-01), Heft 6, S. 2400-2406Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 62 (2015-12-01), Heft 6a, S. 2717-2724Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 57 (2010-12-15), Heft 6, S. 3768-3774Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 56 (2009-08-02), Heft 4, S. 2258-2266Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 54 (2007-08-02), S. 1002-1009Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 58 (2011-06-02), Heft 3, S. 1086-1092Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 58 (2011-06-02), Heft 3, S. 975-980Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 56 (2009-08-03), Heft 4, S. 2473-2479Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 54 (2007-12-01), Heft 6, S. 2413-2418Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 54 (2007-12-01), Heft 6, S. 2468-2473Online academicJournalZugriff: